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1
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2Academic Journal
المؤلفون: Seah, M. P.
المصدر: Philosophical Transactions: Mathematical, Physical and Engineering Sciences, 1996 Nov . 354(1719), 2765-2780.
URL الوصول: https://www.jstor.org/stable/54739
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3Book
المؤلفون: Seah, M. P.
المصدر: Quantitative Microbeam Analysis ; page 1-42 ; ISBN 9780203741528
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4Academic Journal
المؤلفون: Havelund, R., Seah, M. P., Tiddia, M., Gilmore, I. S.
المساهمون: Horizon 2020 Framework Programme, Department of Business, Energy and Industrial Strategy
المصدر: Journal of the American Society for Mass Spectrometry ; volume 29, issue 4, page 774-785 ; ISSN 1044-0305
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5Academic Journal
المؤلفون: Seah, M. P., Havelund, R., Gilmore, I. S.
المساهمون: Department for Business, Innovation and Skills, European Commission
المصدر: The Journal of Physical Chemistry C ; volume 120, issue 46, page 26328-26335 ; ISSN 1932-7447 1932-7455
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6Academic Journal
المؤلفون: Seah, M. P.
المصدر: Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1980 Feb 01. 295(1413), 265-278.
URL الوصول: https://www.jstor.org/stable/36489
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7Academic Journal
المؤلفون: Seah, M. P.
المصدر: Proceedings of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1976 Jun . 349(1659), 535-554.
URL الوصول: https://www.jstor.org/stable/79009
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8Academic Journal
المؤلفون: Bernardini, J., Gas, P., Hondros, E. D., Seah, M. P.
المصدر: Proceedings of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1982 Jan 01. 379(1776), 159-178.
URL الوصول: https://www.jstor.org/stable/2397027
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9Academic Journal
المؤلفون: Seah, M. P., Hondros, E. D.
المصدر: Proceedings of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1973 Oct . 335(1601), 191-212.
URL الوصول: https://www.jstor.org/stable/78510
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10Academic Journal
المؤلفون: Seah, M P, Nunney, T S
المساهمون: Analytical Science Division, National Physical Laboratory Teddington (NPL), Thermo Fisher Scientific, Thermo Fisher Scientific Inc.
المصدر: ISSN: 0022-3727 ; EISSN: 1361-6463.
مصطلحات موضوعية: 81.70.Jb, Argon ions, GaAs, SiO 2, Sputtering yields, Ta 2 O 5 PACS:34.35.+a, 68.49.Sf, 68.55.jd, 79.20.Rf, 79.60.Dp
Relation: hal-00569630; https://hal.archives-ouvertes.fr/hal-00569630; https://hal.archives-ouvertes.fr/hal-00569630/document; https://hal.archives-ouvertes.fr/hal-00569630/file/PEER_stage2_10.1088%252F0022-3727%252F43%252F25%252F253001.pdf
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11Academic Journal
المؤلفون: Lee, J. L. S., Tyler, B. J., Wagner, M. S., Gilmore, I. S., Seah, M. P.
المصدر: Surface and Interface Analysis ; volume 41, issue 2, page 76-78 ; ISSN 0142-2421 1096-9918
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12Academic Journal
المصدر: Surface and Interface Analysis ; volume 40, issue 3-4, page 125-125 ; ISSN 0142-2421 1096-9918
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13Academic Journal
المؤلفون: Green, F. M., Gilmore, I. S., Seah, M. P.
المصدر: Journal of the American Society for Mass Spectrometry ; volume 17, issue 4, page 514-523 ; ISSN 1044-0305
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14Academic Journal
المؤلفون: Seah, M P, Spencer, S J, Bensebaa, F, Vickridge, I, Danzebrink, H, Krumrey, M, Gross, T, Oesterle, W, Wendler, E, Rheinländer, B, Azuma, Y, Kojima, I, Suzuki, N, Suzuki, Motoi, Tanuma, S, Moon, D W, Lee, H-J, Cho, Hyun Mo, Chen, HY, Wee, A TS, Osipowicz, T, Pan, Jisheng, Jordaan, W A, Hauert, R, Klotz, U, Marel, Cees van der, Verheijen, MA Marcel, Tamminga, Y, Jeynes, C, Bailey, P, Biswas, S, Falke, U, Nguyen, Nhan V, Chandler-Horowitz, D, Ehrstein, J R, Müller, David A, Dura, J A
المصدر: ISSN:0142-2421.
وصف الملف: application/pdf
Relation: http://repository.tue.nl/901161
الاتاحة: http://repository.tue.nl/901161
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15Academic Journal
المؤلفون: Mathieu, H. J., Seah, M. P.
المصدر: Surface and Interface Analysis ; volume 36, issue 8, page 671-671 ; ISSN 0142-2421 1096-9918
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16Academic Journal
المؤلفون: Seah, M. P., Spencer, S. J.
المصدر: Surface and Interface Analysis ; volume 33, issue 8, page 640-652 ; ISSN 0142-2421 1096-9918
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17Academic Journal
المؤلفون: Seah, M. P., Gilmore, I. S., Beamson, G.
المصدر: Surface and Interface Analysis ; volume 26, issue 9, page 642-649 ; ISSN 0142-2421 1096-9918
الاتاحة: https://doi.org/10.1002/(sici)1096-9918(199808)26:9%3C642::aid-sia408%3E3.0.co%3B2-3
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1096-9918(199808)26:9%3C642::AID-SIA408%3E3.0.CO%3B2-3
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1096-9918(199808)26:9%3C642::AID-SIA408%3E3.0.CO%3B2-3 -
18Academic Journal
المؤلفون: Seah, M. P., Gilmore, I. S.
المصدر: Surface and Interface Analysis ; volume 26, issue 11, page 815-824 ; ISSN 0142-2421 1096-9918
الاتاحة: http://dx.doi.org/10.1002/(sici)1096-9918(199810)26:11%3C815::aid-sia427%3E3.0.co%3B2-1
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1096-9918(199810)26:11%3C815::AID-SIA427%3E3.0.CO%3B2-1
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1096-9918(199810)26:11%3C815::AID-SIA427%3E3.0.CO%3B2-1 -
19Academic Journal
المؤلفون: Seah, M. P., Gilmore, I. S.
المصدر: Surface and Interface Analysis ; volume 26, issue 12, page 908-929 ; ISSN 0142-2421 1096-9918
الاتاحة: http://dx.doi.org/10.1002/(sici)1096-9918(199811)26:12%3C908::aid-sia438%3E3.0.co%3B2-h
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2F(SICI)1096-9918(199811)26:12%3C908::AID-SIA438%3E3.0.CO%3B2-H
https://onlinelibrary.wiley.com/doi/full/10.1002/(SICI)1096-9918(199811)26:12%3C908::AID-SIA438%3E3.0.CO%3B2-H -
20
المؤلفون: Yokoyama, Y., Aoyagi, S., Fujii, M., Matsuo, J., Fletcher, John, 1978, Lockyer, N. P., Vickerman, J. C., Passarelli, Melissa, 1983, Havelund, R., Seah, M. P.
المصدر: Analytical Chemistry. 88(7):3592-3597
مصطلحات موضوعية: mass-spectrometry, ar cluster, argon, size, universal equation, energy, Chemistry, yields, beams
URL الوصول: https://research.chalmers.se/publication/235542
http://dx.doi.org/10.1021/acs.analchem.5b04133
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