يعرض 1 - 20 نتائج من 125 نتيجة بحث عن '"Schottky Emission"', وقت الاستعلام: 0.55s تنقيح النتائج
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    المؤلفون: Badali, Yosef

    المساهمون: orcid:0000-0001-7723-4188, Fakülteler, Mühendislik Fakültesi, Bilgisayar Mühendisliği Bölümü

    Relation: Physica Scripta; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; http://hdl.handle.net/11467/7188; 99

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    المساهمون: LAboratoire PLasma et Conversion d'Energie (LAPLACE), Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT), Équipe Intégration de Systèmes de Gestion de l'Énergie (LAAS-ISGE), Laboratoire d'analyse et d'architecture des systèmes (LAAS), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Institut National des Sciences Appliquées - Toulouse (INSA Toulouse), Institut National des Sciences Appliquées (INSA)-Université de Toulouse (UT)-Institut National des Sciences Appliquées (INSA)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Convertisseurs Statiques (LAPLACE-CS)

    المصدر: ISSN: 0741-3106 ; IEEE Electron Device Letters ; https://laas.hal.science/hal-02020275 ; IEEE Electron Device Letters, 2019, 40 (5), pp.666-669. ⟨10.1109/led.2019.2896939⟩.

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    المؤلفون: P. Y. Belyavskiy, V. V. Plotnikov

    المصدر: Известия высших учебных заведений России: Радиоэлектроника, Vol 0, Iss 1, Pp 38-43 (2016)

    وصف الملف: electronic resource

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    المصدر: Journal of the Russian Universities. Radioelectronics; № 1 (2016); 38-43 ; Известия высших учебных заведений России. Радиоэлектроника; № 1 (2016); 38-43 ; 2658-4794 ; 1993-8985

    وصف الملف: application/pdf

    Relation: https://re.eltech.ru/jour/article/view/79/84; Пятаков А. П., Звездин А. К. Магнитоэлек-трические материалы и мультиферроики // Успехи физ. наук. 2012. Т. 182, № 6. С. 593-620.; Чопра К. Л. Электрические явления в тон-ких пленках / пер. с англ. М.: Мир, 1972. 424 с.; Шалимова К. В. Физика полупроводников. М.: Энергоатомиздат, 1985. 392 с.; Liedtke R., Grossmann M., Waser R. Capaci-tance and Admittance Spectroscopy Analysis of Hy-drogen-degraded Pt/(Ba, Sr)TiO3/Pt Thin-Film Ca-pacitors // Appl. Phys. Lett. 2000. Vol. 77, № 13. P. 2045-2047.; Chang S.-T., Lee J. Y. Electrical Conduction Mechanism in High-Dielectric-Constant (Ba0.5Sr0.5)TiO3 Thin Films // Appl. Phys. Lett. 2002. Vol. 80, № 4. P. 655-657.; Leakage Mechanism of (Ba0.7Sr0.3)TiO3 Thin Films in the Low-Temperature Range / H. Yang, K. Tao, B. Chen et al. // Appl. Phys. Lett. 2002. Vol. 81, № 25. P. 4817-4819.; Effect of Pt Bottom Electrode Texture Selec-tion on the Tetragonality and Physical Properties of Ba0.8Sr0.2TiO3 Thin Films Produced by Pulsed Laser Deposition / J. P. B. Silva, K. C. Sekhar, A. Almeida, J. A. Moreira, J. Martín-Sánchez, M. Pereira, A. Khodorov, M. J. M. Gomes // J. Appl. Phys. 2012. Vol. 112, iss. 4. P. 044105.; Effect of Concurrent Mg/Nb-doping on Dielec-tric Properties of Ba0.45Sr0.55TiO3 Thin Films / F. Alema, M. Reich, A. Reinholz, K. Pokhodnya // J. Appl. Phys. 2013. Vol. 114, iss. 8. P. 084102.; Izyumskaya N., Alivov Ya., Morkoc H. Ox-ides, Oxides, and More Oxides: High-Κ Oxides, Fer-roelectrics, Ferromagnetics, and Multiferroics // Crit. Rev. Solid. State and Mat. Science. 2009. Vol. 34, iss. 3-4. P. 89-179.; Wang Y.-P., Tseng T.-Y. Electronic Defect and Trap-Related Current of (Ba0.4Sr0.6)TiO3 Thin Films // J. Appl. Phys. 1997. Vol. 81, № 10. P. 6762-6766.; Deuterium-Induced Degradation of (Ba, Sr)TiO3 Films / J.-H. Ahn, P. C. McIntyre, L. W. Mirkarimi, S. R. Gilbert, J. Amano, M. Schulberg // Appl. Phys. Lett. 2000. Vol. 77, № 9. P. 1378-1380.; Improved Dielectric And Electrical Proper-ties of (Ba, Sr)TiO3 Thin Films Using Pt/LaNiO3 as the Top-Electrode Material / Y. H. Gao, J. L. Sun, J. H. Ma, X. J. Meng, J. H. Chu // Appl. Phys. A. 2008. Vol. 91. P. 541-544.; Enhanced Leakage Current Performance and Conduction Mechanisms of Bi1.5Zn1.0Nb1.5O7/Ba0.5Sr0.5TiO3 Bilayered Thin Films / R. Li, S. Jiang, L. Gao, Y. Li // J. Appl. Phys. 2012. Vol. 112, iss. 7. P. 074113.; Зи С. Физика полупроводниковых прибо-ров / пер. с англ. М.: Мир, 1984. Т. 1. 456 с.; https://re.eltech.ru/jour/article/view/79

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    المؤلفون: Gül, Fatih

    المساهمون: RTEÜ, Mühendislik ve Mimarlık Fakültesi, Elektrik-Elektronik Mühendisliği Bölümü, Gül, Fatih

    وصف الملف: application/pdf

    Relation: Materials Today-Proceedings; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; Gul, F. (2021). A simplified method to determine carrier transport mechanisms of metal-oxide resistive random access memory (RRAM) devices. Materials Today-Proceedings, 46, 6976-6978, 16. https://doi.org/10.1016/j.matpr.2021.03.274; https://doi.org/10.1016/j.matpr.2021.03.274; https://hdl.handle.net/11436/6546; 46; 6976; 6978

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