المؤلفون: Jones, Lewys

مصطلحات موضوعية: ThermoFisher FEI Titan G2, beam-sensitive materials, Digital images, Image simulation, Chromatic aberration, Low- voltage imaging, Monochromation, Scanning transmission electron microscope (STEM)

Relation: Microscopy and Microanalysis; Quigley, Frances and McBean, Patrick and O'Donovan, Peter and Jones, Lewys, Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging, Microscopy and Microanalysis, 2022, 1437 - 1443; Y; http://hdl.handle.net/2262/98238; http://people.tcd.ie/jonesl1; 236997; https://arxiv.org/abs/2108.12356; orcid:0000-0002-6907-0731

الاتاحة: http://hdl.handle.net/2262/98238
http://people.tcd.ie/jonesl1
https://arxiv.org/abs/2108.12356

المؤلفون: Monier, Etienne, Oberlin, Thomas, Brun, Nathalie, de Frutos, Maria, Tencé, Marcel, Dobigeon, Nicolas

المساهمون: Signal et Communications (IRIT-SC), Institut de recherche en informatique de Toulouse (IRIT), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Toulouse Mind & Brain Institut (TMBI), Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS), Institut National Polytechnique (Toulouse) (Toulouse INP)

المصدر: 9th IEEE Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS 2018)
https://hal.science/hal-02289995
9th IEEE Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS 2018), Sep 2018, Amsterdam, Netherlands. ⟨10.1109/WHISPERS.2018.8747104⟩

مصطلحات موضوعية: Electron Energy Loss Spectroscopy EELS, Multi-band imaging, Image reconstruction, Partial sampling, Spectrum-image, Inpainting, Scanning Transmission Electron Microscope STEM, [INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]

جغرافية الموضوع: Amsterdam, Netherlands

Relation: hal-02289995; https://hal.science/hal-02289995; https://hal.science/hal-02289995/document; https://hal.science/hal-02289995/file/monier_22460.pdf; OATAO: 22460

الاتاحة: https://hal.science/hal-02289995
https://hal.science/hal-02289995/document
https://hal.science/hal-02289995/file/monier_22460.pdf
https://doi.org/10.1109/WHISPERS.2018.8747104

المؤلفون: Monier, Etienne, Oberlin, Thomas, Brun, Nathalie, Tencé, Marcel, de Frutos, Maria, Dobigeon, Nicolas

المساهمون: Signal et Communications (IRIT-SC), Institut de recherche en informatique de Toulouse (IRIT), Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université de Toulouse (UT)-Toulouse Mind & Brain Institut (TMBI), Université Toulouse - Jean Jaurès (UT2J), Université de Toulouse (UT)-Université de Toulouse (UT)-Université Toulouse III - Paul Sabatier (UT3), Université de Toulouse (UT)-Université Toulouse Capitole (UT Capitole), Université de Toulouse (UT), Institut National Polytechnique (Toulouse) (Toulouse INP), Laboratoire de Physique des Solides (LPS), Université Paris-Sud - Paris 11 (UP11)-Centre National de la Recherche Scientifique (CNRS)

المصدر: ISSN: 2333-9403 ; IEEE Transactions on Computational Imaging ; https://hal.science/hal-02181994 ; IEEE Transactions on Computational Imaging, 2018, 4 (4), pp.585-598. ⟨10.1109/TCI.2018.2866961⟩ ; https://ieeexplore.ieee.org/document/8447232.

مصطلحات موضوعية: Inpainting, Partial sampling, Electron energy loss spectroscopy (EELS), Scanning transmission electron microscope (STEM), Spectrum-image, Image reconstruction, Multi-band imaging, [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing

Relation: hal-02181994; https://hal.science/hal-02181994; https://hal.science/hal-02181994/document; https://hal.science/hal-02181994/file/monier_22523.pdf; OATAO: 22523

الاتاحة: https://hal.science/hal-02181994
https://hal.science/hal-02181994/document
https://hal.science/hal-02181994/file/monier_22523.pdf
https://doi.org/10.1109/TCI.2018.2866961

المؤلفون: Kazuhisa Mitsuda, Keisuke Maehata, Noriko Yamasaki, Ryohei KONNO, Tasuku HAYASHI, Toru HARA, Yuta YAGI, 八木 雄大, 前畑 京介, 原 徹, 山崎 典子, 林 佑, 満田 和久, 紺野 良平

المصدر: JSAP Annual Meetings Extended Abstracts. 2020, :541

المؤلفون: Malac, Marek, Calzada, Jesus Alejandro Marin, Salomons, Mark, Homeniuk, Darren, Price, Patrick, Cloutier, Martin, Hayashida, Misa, Vick, Doug, Chen, Sean, Yakubu, Suliat, Wen, Zhengxu (Darren), Leeson, Marcus, Kamal, Mohammad, Pitters, Jason, Kim, John, Wang, Xuanhao, Adkin-Kaya, Olivier, Egerton, Ray

مصطلحات موضوعية: transmission electron telescope (TEM), scanning electron microscope (SEM), scanning transmission electron microscope (STEM), ED, public license electron microscope, open science, microscopy education

وصف الملف: text

Relation: Micron, Volume: 163, Issue: C, Publication date: 2022-10-04, Pages: 1–25

الاتاحة: https://doi.org/10.1016/j.micron.2022.103362
https://nrc-publications.canada.ca/eng/view/author/version/?id=02fb266b-721d-4a35-b825-0af8044db446
https://nrc-publications.canada.ca/eng/view/object/?id=02fb266b-721d-4a35-b825-0af8044db446
https://nrc-publications.canada.ca/fra/voir/objet/?id=02fb266b-721d-4a35-b825-0af8044db446

المؤلفون: Amika Shima, Kei Watanabe, Yutaka Fukushima, 志摩 会実佳, 渡辺 圭, 福嶌 豊

المصدر: JSAP Annual Meetings Extended Abstracts. 2017, :73

المؤلفون: Takashi TANIGUCHI, 谷口 尚

المصدر: 高圧力の科学と技術 / The Review of High Pressure Science and Technology. 2018, 28(3):177

المؤلفون: Etienne Monier, Thomas Oberlin, Nathalie Brun, Nicolas Dobigeon, Marta de Frutos, Marcel Tencé

المساهمون: Signal et Communications (IRIT-SC), Institut de recherche en informatique de Toulouse (IRIT), Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées, Laboratoire de Physique des Solides (LPS), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Institut National Polytechnique (Toulouse) (Toulouse INP)

المصدر: IEEE Transactions on Computational Imaging
IEEE Transactions on Computational Imaging, IEEE, 2018, 4 (4), pp.585-598. ⟨10.1109/TCI.2018.2866961⟩

مصطلحات موضوعية: FOS: Computer and information sciences, Materials science, Spectrum-image, Scanning transmission electron microscope (STEM), Computer Vision and Pattern Recognition (cs.CV), Inpainting, Computer Science - Computer Vision and Pattern Recognition, FOS: Physical sciences, Electron Energy Loss Spectroscopy EELS, 02 engineering and technology, Iterative reconstruction, Electron energy loss spectroscopy (EELS), Imaging phantom, Partial sampling, Data cube, Optics, Signal-to-noise ratio, [INFO.INFO-TS]Computer Science [cs]/Signal and Image Processing, 0202 electrical engineering, electronic engineering, information engineering, FOS: Electrical engineering, electronic engineering, information engineering, Condensed Matter - Materials Science, Pixel, business.industry, Electron energy loss spectroscopy, Image and Video Processing (eess.IV), Scanning Transmission Electron Microscope STEM, Materials Science (cond-mat.mtrl-sci), Multi-band imaging, Electrical Engineering and Systems Science - Image and Video Processing, 021001 nanoscience & nanotechnology, Sample (graphics), Computer Science Applications, Computational Mathematics, Physics - Data Analysis, Statistics and Probability, Signal Processing, Image reconstruction, 020201 artificial intelligence & image processing, 0210 nano-technology, business, [SPI.SIGNAL]Engineering Sciences [physics]/Signal and Image processing, Data Analysis, Statistics and Probability (physics.data-an)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8a61e3ed0805de7a558e55a3f91a6437
https://hal.archives-ouvertes.fr/hal-02181994

المؤلفون: Astari Dwiranti, Hideaki Takata, Kiichi Fukui, Susumu Uchiyama

المصدر: Chromosome Science. 2016, 19(1-4):19

المؤلفون: Melichárek, Václav

Thesis Advisors: Doležel, Pavel, Mach, Jindřich

مصطلحات موضوعية: Electron microscopy, transmission electron microscope (TEM), scanning transmission electron microscope (STEM), Elektronová mikroskopie, objektiv., manipulátor vzorku, prozařovací elektronový mikroskop (TEM), sample, sample manipulator, rastrovací prozařovací mikroskop (STEM), objective., vzorek

الاتاحة: http://www.nusl.cz/ntk/nusl-417138

المؤلفون: Monier, Etienne, Oberlin, Thomas, Brun, Nathalie, Tencé, Marcel, De Frutos, Maria, Dobigeon, Nicolas

المساهمون: Centre National de la Recherche Scientifique - CNRS (FRANCE), Institut National Polytechnique de Toulouse - INPT (FRANCE), Université Toulouse III - Paul Sabatier - UT3 (FRANCE), Université Toulouse - Jean Jaurès - UT2J (FRANCE), Université Toulouse 1 Capitole - UT1 (FRANCE), Université Paris-Sud 11 (FRANCE), Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE)

المصدر: IEEE Transactions on Computational Imaging.

مصطلحات موضوعية: Spectrum-image, Scanning transmission electron microscope (STEM), Image reconstruction, Inpainting, Traitement du signal et de l'image, Multi-band imaging, Electron energy loss spectroscopy (EELS), Partial sampling

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::75e19e81d196a69d94c86054ab860b02
https://oatao.univ-toulouse.fr/22523/

المؤلفون: Thomas Oberlin, Nathalie Brun, Nicolas Dobigeon, Maria de Frutos, Marcel Tence, Etienne Monier

المساهمون: Signal et Communications (IRIT-SC), Institut de recherche en informatique de Toulouse (IRIT), Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées-Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse - Jean Jaurès (UT2J)-Université Toulouse III - Paul Sabatier (UT3), Université Fédérale Toulouse Midi-Pyrénées-Centre National de la Recherche Scientifique (CNRS)-Institut National Polytechnique (Toulouse) (Toulouse INP), Université Fédérale Toulouse Midi-Pyrénées-Université Toulouse 1 Capitole (UT1), Université Fédérale Toulouse Midi-Pyrénées, Laboratoire de Physique des Solides (LPS), Centre National de la Recherche Scientifique (CNRS)-Université Paris-Sud - Paris 11 (UP11), Institut National Polytechnique (Toulouse) (Toulouse INP), Centre National de la Recherche Scientifique - CNRS (FRANCE), Institut National Polytechnique de Toulouse - Toulouse INP (FRANCE), Université Paris-Saclay (FRANCE), Université Toulouse III - Paul Sabatier - UT3 (FRANCE), Université Toulouse - Jean Jaurès - UT2J (FRANCE), Université Toulouse 1 Capitole - UT1 (FRANCE), Université Paris-Sud 11 (FRANCE), Institut National Polytechnique de Toulouse - INPT (FRANCE)

المصدر: 9th IEEE Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS 2018)
9th IEEE Workshop on Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS 2018), Sep 2018, Amsterdam, Netherlands. ⟨10.1109/WHISPERS.2018.8747104⟩
WHISPERS

مصطلحات موضوعية: Materials science, Spectrum-image, Inpainting, Electron Energy Loss Spectroscopy EELS, 02 engineering and technology, Iterative reconstruction, 01 natural sciences, Imaging phantom, law.invention, Partial sampling, Data cube, Traitement des images, Optics, law, 0103 physical sciences, 010302 applied physics, business.industry, Electron energy loss spectroscopy, Scanning Transmission Electron Microscope STEM, Hyperspectral imaging, Multi-band imaging, 021001 nanoscience & nanotechnology, [INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV], Image reconstruction, Cube, Electron microscope, 0210 nano-technology, business

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8341b9deb3f082c98db6053867e46978
https://hal.archives-ouvertes.fr/hal-02289995

المؤلفون: Masatada Yodogawa, Naoya Shibata, Shigekazu Hidaka, Takahisa Yamamoto, Teruyasu Mizoguchi, Yuichi Ikuhara, Yukio Sato, 佐藤 幸生, 山本 剛久, 幾原 雄一, 日高 重和, 柴田 直哉, 淀川 正忠, 溝口 照康

المصدر: Preprints of Annual Meeting of The Ceramic Society of Japan Preprints of Fall Meeting of The Ceramic Society of Japan. 2009, :17

المؤلفون: Chiaki Kato, Masahiro Yamamoto, Yasutaka Soma

المصدر: MATERIALS TRANSACTIONS. 2012, 53(1):195

المؤلفون: Typovský, Viktor

Thesis Advisors: Walek, Petr, Potočňák, Tomáš

مصطلحات موضوعية: point spread function (PSF), imaging aberrations, scanning transmission electron microscope (STEM), wave optics, image deconvolution, simulace, point spread function( PSF), simulation, dekonvoluce obrazu, zobrazovací vady, vlnová optika, model, skenovácí transmisní elektronový mikroskop (STEM)

الاتاحة: http://www.nusl.cz/ntk/nusl-377767

المؤلفون: Wessel, Ashley M.

المساهمون: Weatherford, Todd R., Porter, Matthew A., Electrical Computer Engineering

مصطلحات موضوعية: scanning electron microscope (SEM), sample preparation, high electron mobility transistor (HEMT), transmission electron microscope (TEM), Electron microscopy, scanning transmission electron microscope (STEM), electron dispersive spectrometry (EDS), focused ion beam (FIB), Gallium Nitride (GaN)

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2778::a119681044a1679afd66488211e24292
https://hdl.handle.net/10945/41457

المؤلفون: Yurdakul, Hilmi, Idrobo, Juan C., Pennycook, Stephen J., Turan, Servet

المساهمون: Anadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümü, Turan, Servet

مصطلحات موضوعية: Ceramics, Rare Earth, Scanning Transmission Electron Microscope (Stem), Sialon, Z-Contrast Microscopy

وصف الملف: application/pdf

Relation: Scripta Materialia; Makale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanı; https://dx.doi.org/10.1016/j.scriptamat.2011.06.038; https://hdl.handle.net/11421/21674; 65; 656; 659

الاتاحة: https://hdl.handle.net/11421/21674
https://doi.org/10.1016/j.scriptamat.2011.06.038

المؤلفون: Servet Turan, Juan C. Idrobo, Stephen J. Pennycook, Hilmi Yurdakul

المساهمون: Anadolu Üniversitesi, Mühendislik Fakültesi, Malzeme Bilimi ve Mühendisliği Bölümü, Turan, Servet

مصطلحات موضوعية: Sialon, Ytterbium, Ceramics, Materials science, Scanning electron microscope, Mechanical Engineering, Metals and Alloys, Analytical chemistry, Mineralogy, chemistry.chemical_element, Z-Contrast Microscopy, Condensed Matter Physics, Scanning Transmission Electron Microscope (Stem), law.invention, Cerium, chemistry, Mechanics of Materials, Transmission electron microscopy, law, Rare Earth, Scanning transmission electron microscopy, Microscopy, General Materials Science, Electron microscope

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::bee4182b8fb9f69a03ed5910bd8f9023
https://aperta.ulakbim.gov.tr/record/19473

المؤلفون: Brockt, Georg

المساهمون: Kubalek, Erich

مصطلحات موضوعية: Fakultät für Ingenieurwissenschaften » Elektrotechnik und Informationstechnik, Condensed Matter::Materials Science, InGaN, scanning transmission electron microscope (STEM), Z-contrast, superlattice, heterostructure, ddc:620, ddc:62, electron energy-loss spectroscopy (EELS), bandgab, dielectric function, GaN

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od_______788::a3c035d6bfa0e2e1f1f590fb869f29ff
https://duepublico2.uni-due.de/receive/duepublico_mods_00005369

المؤلفون: Melichárek, Václav

المساهمون: Mach, Jindřich, Doležel, Pavel

المصدر: MELICHÁREK, V. Návrh manipulátoru pro TEM [online]. Brno: Vysoké učení technické v Brně. Fakulta strojního inženýrství. 2020.

مصطلحات موضوعية: Elektronová mikroskopie, prozařovací elektronový mikroskop (TEM), rastrovací prozařovací mikroskop (STEM), manipulátor vzorku, vzorek, objektiv, Electron microscopy, transmission electron microscope (TEM), scanning transmission electron microscope (STEM), sample manipulator, sample, objective

وصف الملف: text/html

Relation: http://hdl.handle.net/11012/192367

الاتاحة: http://hdl.handle.net/11012/192367