المؤلفون: Vorontsov, Pavel A., Salnikov, Vitalii D., Savin, Valerii V., Vorontsov, Stanislav A., Omelyanchik, Alexander S., Shvets, Petr V., Panina, Larissa V., Ershov, Petr A., Rodionova, Valeria V.

المصدر: Crystals (2073-4352); Jan2025, Vol. 15 Issue 1, p47, 12p

مصطلحات موضوعية: THICK films, ATOMIC force microscopy, THIN films, DIELECTRIC properties, SCANNING electron microscopy