المؤلفون: Buchel, J., Vasilopoulos, A., Kersting, B., Odermatt, F., Brew, K., Ok, I., Choi, S., Saraf, I., Chan, V., Philip, T., Saulnier, N., Narayanan, V., Gallo, M. Le, Sebastian, A.

المساهمون: Horizon Europe

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019486
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019486.pdf?arnumber=10019486

المؤلفون: Gong, N., Rasch, M.J., Seo, S.-C., Gasasira, A., Solomon, P., Bragaglia, V., Consiglio, S., Higuchi, H., Park, C., Brew, K., Jamison, P., Catano, C., Saraf, I., Athena, F.F., Silvestre, C., Liu, X., Khan, B., Jain, N., Mcdermott, S., Johnson, R., Estrada-Raygoza, I., Li, J., Gokmen, T., Li, N., Pujari, R., Carta, F., Miyazoe, H., Frank, M.M., Koty, D., Yang, Q., Clark, R., Tapily, K., Wajda, C., Mosden, A., Shearer, J., Metz, A., Teehan, S., Saulnier, N., Offrein, B. J., Tsunomura, T., Leusink, G., Narayanan, V., Ando, T.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019569
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019569.pdf?arnumber=10019569

المؤلفون: Kim, Y., Seo, S.-C., Consiglio, S., Jamison, P., Higuchi, H., Rasch, M., Wu, E. Y., Kong, D., Saraf, I., Catano, C., Muralidhar, R., Nguyen, S., DeVries, S., Van der Straten, O., Sankarapandian, M., Pujari, R. N., Gasasira, A., Mcdermott, S. M., Miyazoe, H., Koty, D., Yang, Q., Yan, H., Clark, R., Tapily, K., Engelmann, S., Robison, R. R., Wajda, C., Mosden, A., Tsunomura, T., Soave, R., Saulnier, N., Haensch, W., Leusink, G., Biolsi, P., Narayanan, V., Ando, T.

المساهمون: IBM Research AI Hardware Center

المصدر: IEEE Electron Device Letters ; volume 42, issue 5, page 759-762 ; ISSN 0741-3106 1558-0563

الاتاحة: http://dx.doi.org/10.1109/led.2021.3066181
http://xplorestaging.ieee.org/ielx7/55/9415873/09380426.pdf?arnumber=9380426

المؤلفون: Goeckner, M, Ogawa, D, Saraf, I, Overzet, L

المصدر: Journal of Physics: Conference Series ; volume 162, page 012014 ; ISSN 1742-6596

الاتاحة: http://dx.doi.org/10.1088/1742-6596/162/1/012014
http://stacks.iop.org/1742-6596/162/i=1/a=012014/pdf

المؤلفون: Wu, H., Gluschenkov, O., Tsutsui, G., Niu, C., Brew, K., Durfee, C., Prindle, C., Kamineni, V., Mochizuki, S., Lavoie, C., Nowak, E., Liu, Z., Yang, J., Choi, S., Demarest, J., Yu, L., Carr, A., Wang, W., Strane, J., Tsai, S., Liang, Y., Amanapu, H., Saraf, I., Ryan, K., Lie, F., Kleemeier, W., Choi, K., Cave, N., Yamashita, T., Knorr, A., Gupta, D., Haran, B., Guo, D., Bu, H., Khare, M.

المصدر: 2018 IEEE International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm.2018.8614661
http://xplorestaging.ieee.org/ielx7/8601505/8614478/08614661.pdf?arnumber=8614661

المؤلفون: Saraf, I., Goeckner, M., Goodlin, Brian, Kirmse, Karen, Overzet, L.

المصدر: Applied Physics Letters ; volume 98, issue 16 ; ISSN 0003-6951 1077-3118

الاتاحة: http://dx.doi.org/10.1063/1.3579542
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.3579542/14448855/161502_1_online.pdf

المؤلفون: Ogawa, D., Saraf, I., Sra, A., Timmons, R., Goeckner, M., Overzet, L.

المصدر: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2009, Vol. 27 Issue 2, p342-351, 10p, 2 Black and White Photographs, 2 Diagrams, 1 Chart, 7 Graphs

مصطلحات موضوعية: CHEMICAL vapor deposition, HIGH temperature plasmas, THIN films, HEXANE, PLASMA heating

المؤلفون: Saraf, SMRITI

المساهمون: S. Saraf, I. Bensalha and D.A. Gorog

المصدر: http://www.la-press.com/antiplatelet-resistance---does-it-exist-and-how-to-measure-it-article-a1629.

مصطلحات موضوعية: Clinical Medicine Insights: Cardiology, Volume: 2009, Issue: 3

وصف الملف: PDF

Relation: http://www.la-press.com/redirect_file.php?fileId=2231&filename=1629-CMC-Antiplatelet-Resistance---Does-it-Exist-and-How-to-Measure-it?.pdf&fileType=pdf

الاتاحة: http://www.la-press.com/redirect_file.php?fileId=2231&filename=1629-CMC-Antiplatelet-Resistance---Does-it-Exist-and-How-to-Measure-it?.pdf&fileType=pdf