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1Academic Journal
المؤلفون: Endo, Shinichi, Ishikawa, Yuki, Shirakashi, Hina, Saito, Takeyasu
المصدر: Journal of Electronic Materials; Nov2024, Vol. 53 Issue 11, p7044-7056, 13p
مصطلحات موضوعية: SCANNING transmission electron microscopy, CIRCUIT board manufacturing, PRINTED circuit manufacturing, X-ray photoelectron spectroscopy, EPOXY resins
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2Academic Journal
المؤلفون: Endo, Shinichi, Ishikawa, Yuki, Shirakashi, Hina, Saito, Takeyasu
المصدر: Journal of Electronic Materials; Sep2024, Vol. 53 Issue 9, p5449-5459, 11p
مصطلحات موضوعية: FOURIER transform infrared spectroscopy, X-ray photoelectron spectroscopy, EPOXY resins, ATTENUATED total reflectance, ABSORPTION coefficients, DIELECTRIC materials
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3Conference
المؤلفون: Tanaka, Toshiaki, Nishizawa, Hideaki, Ozono, Mitsuru, Takahashi, Seiji, Yasuda, Masaaki, Doi, Toshiro, Kimuro, Hiroaki, Hirai, Hisatoshi, Minami, Yoichi, Saito, Takeyasu, Sasago, Masaru, Hirai, Yoshihiko
المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)
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4Academic Journal
المؤلفون: Ishikawa, Yuki, Takao, Tomoya, Saito, Takeyasu
المصدر: Microelectronics Reliability ; volume 143, page 114933 ; ISSN 0026-2714
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5Academic Journal
المؤلفون: Ishikawa, Yuki, Takao, Tomoya, Saito, Takeyasu
المصدر: Microelectronics Reliability ; volume 151, page 115233 ; ISSN 0026-2714
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6Academic Journal
المؤلفون: Okamoto, Naoki, Matsuda, Naohiro, Saito, Takeyasu
المصدر: Japanese Journal of Applied Physics ; volume 61, issue SC, page SC1075 ; ISSN 0021-4922 1347-4065
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7Academic Journal
المؤلفون: Akutsu Yusuke, Mokuno Yoshiaki, Ohmagari Shinya, Okamoto Naoki, Saito Takeyasu, Shinichiro Suzuki, Umezawa Hitoshi, 大曲 新矢, 岡本 尚樹, 杢野 由明, 梅沢 仁, 鈴木 伸一郎, 阿久津 悠介, 齊藤 丈靖
المصدر: JSAP Annual Meetings Extended Abstracts. 2017, :3936
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8Academic Journal
المؤلفون: Narumoto, Natsuki, Okamoto, Naoki, Saito, Takeyasu
المصدر: Journal of Materials Science: Materials in Electronics ; volume 32, issue 8, page 9990-9997 ; ISSN 0957-4522 1573-482X
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9
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10Conference
المؤلفون: Matsuda, Naohiro, Okamoto, Naoki, Saito, Takeyasu
المصدر: 2019 International Conference on Electronics Packaging (ICEP) ; volume 45, page 424-427
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11Conference
المؤلفون: Hokari, Kanade, Suzuki, Shinichiro, Okamoto, Naoki, Saito, Takeyasu, Ide, Isamu, Nishikawa, Masanobu, Onishi, Yoshikazu
المصدر: 2019 International Conference on Electronics Packaging (ICEP) ; volume 41, page 441-443
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12Academic Journal
المؤلفون: Kobayashi, Atsushi, Ohmagari, Shinya, Umezawa, Hitoshi, Takeuchi, Daisuke, Saito, Takeyasu
المصدر: Japanese Journal of Applied Physics ; volume 59, issue 8, page 089302 ; ISSN 0021-4922 1347-4065
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13
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14Conference
المؤلفون: Suzuki, Shinichiro, Ohmagari, Shinya, Akutsu, Yusuke, Okamoto, Naoki, Saito, Takeyasu, Umezawa, Hitoshi, Mokuno, Yoshiaki
المصدر: 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) ; volume 61, page 583-584
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15Conference
المؤلفون: Kashima, Hatsunori, Okamoto, Naoki, Saito, Takeyasu
المصدر: 2018 20th International Conference on Electronic Materials and Packaging (EMAP) ; volume 50, page 1-3
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16Conference
المؤلفون: Matsuda, Naohiro, Okamoto, Naoki, Saito, Takeyasu
المصدر: 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC)
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17Academic Journal
المؤلفون: Suzuki, Shin-ichiro, Ohmagari, Shinya, Kawashima, Hiroyuki, Saito, Takeyasu, Umezawa, Hitoshi, Takeuchi, Daisuke
المصدر: Thin Solid Films ; volume 680, page 81-84 ; ISSN 0040-6090
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18
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19Conference
المؤلفون: Takada, Yoko, Tamano, Rika, Okamoto, Naoki, Saito, Takeyasu, Yoshimura, Takeshi, Fujimura, Norifumi, Higuchi, Koji, Kitajima, Akira, Shishido, Rie
المصدر: 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM) ; page 1-4
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20Conference
المؤلفون: Tamano, Rika, Takada, Yoko, Okamoto, Naoki, Saito, Takeyasu, Higuchi, Koji, Kitajima, Akira, Yoshimura, Takeshi, Fujimura, Norifumi
المصدر: 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop (ISAF/ECAPD/PFM) ; page 1-4