المؤلفون: Andrzej Wojenski, Paweł Linczuk, Piotr Kolasinski, Maryna Chernyshova, Didier Mazon, Grzegorz Kasprowicz, Krzysztof T. Pozniak, Michał Gaska, Tomasz Czarski, Rafał Krawczyk

المصدر: International Journal of Electronics and Telecommunications, Vol vol. 67, Iss No 1, Pp 109-114 (2021)

مصطلحات موضوعية: data quality monitoring, fpga, verilog/vhdl, hdl, gem detector, sxr plasma diagnostics, modular measurement system, data evaluation, tokamak, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Telecommunication, TK5101-6720

وصف الملف: electronic resource

Relation: https://journals.pan.pl/Content/118872/PDF/15_3156_Wojenski_skl3.pdf; https://doaj.org/toc/2081-8491; https://doaj.org/toc/2300-1933

URL الوصول: https://doaj.org/article/ada27605e5924ebe8eb1a052865be79e

المؤلفون: Wojeński, Andrzej, Linczuk, Pawel, Kolasinski, Piotr, Chernyshova, Maryna, Mazon, Didier, Kasprowicz, Grzegorz, Pozniak, Krzysztof T., Gaska, Michal, Czarski, Tomasz, Krawczyk, Rafal

المساهمون: EUROfusion Consortium, Polish Ministry of Science and Higher Education

المصدر: International Journal of Electronics and Telecommunications; Vol 67, No 1 (2021); 109-114 ; 2300-1933

مصطلحات موضوعية: data quality monitoring, FPGA, Verilog/VHDL, HDL, GEM detector, SXR plasma diagnostics, modular measurement system, data evaluation, tokamak

وصف الملف: application/pdf

Relation: http://ijet.pl/index.php/ijet/article/view/10.24425-ijet.2021.135951/785; http://ijet.pl/index.php/ijet/article/downloadSuppFile/10.24425-ijet.2021.135951/2622; http://ijet.pl/index.php/ijet/article/downloadSuppFile/10.24425-ijet.2021.135951/2623; http://ijet.pl/index.php/ijet/article/downloadSuppFile/10.24425-ijet.2021.135951/2624; http://ijet.pl/index.php/ijet/article/view/10.24425-ijet.2021.135951

الاتاحة: http://ijet.pl/index.php/ijet/article/view/10.24425-ijet.2021.135951

المؤلفون: Andrzej Wojenski, Krzysztof T. Pozniak, Didier Mazon, Maryna Chernyshova

المصدر: International Journal of Electronics and Telecommunications, Vol vol. 64, Iss No 4, Pp 473-479 (2018)

مصطلحات موضوعية: data quality monitoring, system modeling, fpga, verilog/vhdl, hdl, gem detector, sxr plasma diagnostics, modular measurement system, data evaluation, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Telecommunication, TK5101-6720

وصف الملف: electronic resource

Relation: https://journals.pan.pl/Content/107763/PDF/64_1647.pdf; https://doaj.org/toc/2081-8491; https://doaj.org/toc/2300-1933

URL الوصول: https://doaj.org/article/769e32b0b06041dcb93fb9b6c1bdc421

المؤلفون: Wojenski, Andrzej, Linczuk, Paweł, Piotr, Kolasinski, Chernyshova, Maryna, Mazon, Didier, Kasprowicz, Grzegorz, Pozniak, Krzysztof T., Gaska, Michał, Czarski, Tomasz, Krawczyk, Rafał

مصطلحات موضوعية: data quality monitoring, FPGA, Verilog-VHDL, HDL, GEM detector, SXR plasma diagnostics, modular measurement system, data evaluation, tokamak

URL الوصول: http://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-0e026edb-179a-4ac9-a63e-e423ee364ecc

المؤلفون: Wojenski, A., Poźniak, K., Mazon, D., Chernyshova, M.

مصطلحات موضوعية: data quality monitoring, system modeling, FPGA, Verilog-VHDL, HDL, GEM detector, SXR plasma diagnostics, modular measurement system, data evaluation

URL الوصول: http://yadda.icm.edu.pl/baztech/element/bwmeta1.element.baztech-75ba36b7-568a-41bd-9d90-aa1298dc4ea9