المؤلفون: Milazzo, Rosario, De Marco, Vincenzo, De Sio, Corrado, Fosson, Sophie, Morra, Lia, Sterpone, Luca

المساهمون: Milazzo, Rosario, De Marco, Vincenzo, De Sio, Corrado, Fosson, Sophie, Morra, Lia, Sterpone, Luca

مصطلحات موضوعية: Reliability, Resilience, Fault-Tolerance, Error Mitigation, Deep Neural Network, Deep Learning, Machine Learning, Self-Supervised Learning

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-5934-3; info:eu-repo/semantics/altIdentifier/wos/WOS:001227439800021; ispartofbook:2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems; firstpage:110; lastpage:115; numberofpages:6; https://hdl.handle.net/11583/2986869; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85192865124; https://ieeexplore.ieee.org/document/10508923

الاتاحة: https://hdl.handle.net/11583/2986869
https://doi.org/10.1109/DDECS60919.2024.10508923
https://ieeexplore.ieee.org/document/10508923

المؤلفون: Cora, Giorgio, De Sio, Corrado, Rizzieri, Daniele, Azimi, Sarah, Sterpone, Luca

المساهمون: Cora, Giorgio, De Sio, Corrado, Rizzieri, Daniele, Azimi, Sarah, Sterpone, Luca

مصطلحات موضوعية: Fault Injection, FPGA, Reliability, RISC-V, Robustne, Single Event Upset, Soft Errors

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-5934-3; ispartofbook:2024 IEEE 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS); 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems; firstpage:31; lastpage:36; numberofpages:6; https://hdl.handle.net/11583/2987728; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85192823320; https://ieeexplore.ieee.org/document/10508921

الاتاحة: https://hdl.handle.net/11583/2987728
https://doi.org/10.1109/DDECS60919.2024.10508921
https://ieeexplore.ieee.org/document/10508921

المؤلفون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

المساهمون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

مصطلحات موضوعية: CNN, Algorithm, Systolic Array, Reliability, FPGA

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-6175-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001323546200050; ispartofbook:IEEE International NEWCAS Conference; 22nd IEEE International NEWCAS Conference 2024; firstpage:248; lastpage:252; numberofpages:5; https://hdl.handle.net/11583/2990347; https://ieeexplore.ieee.org/document/10666350

الاتاحة: https://hdl.handle.net/11583/2990347
https://doi.org/10.1109/NewCAS58973.2024.10666350
https://ieeexplore.ieee.org/document/10666350

المؤلفون: Portaluri,Andrea, Azimi,Sarah, Saracino,Andrea, Sterpone,Luca, Kilic,Alp, Dupuis,Damien

المساهمون: Portaluri, Andrea, Azimi, Sarah, Saracino, Andrea, Sterpone, Luca, Kilic, Alp, Dupuis, Damien

مصطلحات موضوعية: NanoXplore, radiation-hardened, FPGA, CAD, routing, GPU

وصف الملف: ELETTRONICO

Relation: volume:13; issue:14; numberofpages:14; journal:ELECTRONICS; https://hdl.handle.net/11583/2991091; https://www.mdpi.com/2079-9292/13/14/2803

الاتاحة: https://hdl.handle.net/11583/2991091
https://doi.org/10.3390/electronics13142803
https://www.mdpi.com/2079-9292/13/14/2803

المؤلفون: Lange, Thomas, Balakrishnan, Aneesh, Glorieux, Maximilien, Alexandrescu, Dan, Sterpone, Luca

مصطلحات موضوعية: Computer Science - Hardware Architecture, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2008.13664

المؤلفون: Guzmán-Miranda, Hipólito, Sterpone, Luca, Violante, Massimo, Aguirre, Miguel A., Gutiérrez-Rizo, Manuel

المساهمون: Universidad de Sevilla. Departamento de Ingeniería Electrónica, Universidad de Sevilla. TIC-192 : Ingeniería Electrónica

مصطلحات موضوعية: Aerospace, Component substitution, Field programmable gate arrays (FPGA), Reliability

Relation: IEEE Transactions on Industrial Electronics, 58 (3), 814-821.; https://xplorestaging.ieee.org/document/5475234?denied=; https://idus.us.es/handle//11441/164024

الاتاحة: https://idus.us.es/handle//11441/164024

المؤلفون: Sterpone, Luca, Azimi, Sarah, Sio, Corrado De

المساهمون: European Space Agency

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ; volume 43, issue 4, page 1079-1092 ; ISSN 0278-0070 1937-4151

الاتاحة: http://dx.doi.org/10.1109/tcad.2023.3331976
http://xplorestaging.ieee.org/ielx7/43/10477239/10314789.pdf?arnumber=10314789

المؤلفون: Lange, Thomas, Balakrishnan, Aneesh, Glorieux, Maximilien, Alexandrescu, Dan, Sterpone, Luca

مصطلحات موضوعية: Computer Science - Machine Learning, Electrical Engineering and Systems Science - Signal Processing

URL الوصول: http://arxiv.org/abs/2002.09945

المؤلفون: Lange, Thomas, Balakrishnan, Aneesh, Glorieux, Maximilien, Alexandrescu, Dan, Sterpone, Luca

مصطلحات موضوعية: Electrical Engineering and Systems Science - Signal Processing, Computer Science - Machine Learning

URL الوصول: http://arxiv.org/abs/2002.08882

المؤلفون: Lange, Thomas, Glorieux, Maximilien, Alexandrescu, Dan, Sterpone, Luca

مصطلحات موضوعية: Computer Science - Hardware Architecture

URL الوصول: http://arxiv.org/abs/2002.05455

المؤلفون: Jenihhin, Maksim, Hamdioui, Said, Reorda, Matteo Sonza, Krstic, Milos, Langendoerfer, Peter, Sauer, Christian, Klotz, Anton, Huebner, Michael, Nolte, Joerg, Vierhaus, Heinrich Theodor, Selimis, Georgios, Alexandrescu, Dan, Taouil, Mottaqiallah, Schrijen, Geert-Jan, Raik, Jaan, Sterpone, Luca, Squillero, Giovanni, Dyka, Zoya

مصطلحات موضوعية: Computer Science - Cryptography and Security, Computer Science - Distributed, Parallel, and Cluster Computing, Computer Science - Software Engineering, Electrical Engineering and Systems Science - Signal Processing

URL الوصول: http://arxiv.org/abs/1912.01561

المؤلفون: Vacca, Eleonora, Ajmone, Giorgio, Sterpone, Luca

المساهمون: Vacca, Eleonora, Ajmone, Giorgio, Sterpone, Luca

مصطلحات موضوعية: Systolic Array, Fault Detection, TPU, ABFT, DFT

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-4291-8; info:eu-repo/semantics/altIdentifier/wos/WOS:001146866200084; ispartofbook:2023 IEEE 41st International Conference on Computer Design (ICCD); The 41st IEEE International Conference on Computer Design; firstpage:596; lastpage:604; numberofpages:9; https://hdl.handle.net/11583/2982644; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85182326767; https://ieeexplore.ieee.org/document/10360983

الاتاحة: https://hdl.handle.net/11583/2982644
https://doi.org/10.1109/ICCD58817.2023.00095
https://ieeexplore.ieee.org/document/10360983

المؤلفون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

المساهمون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

مصطلحات موضوعية: AI, Hardware Accelerator, Single Event Transient, Soft Error, Tensor Processing Unit

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001012062000034; ispartofbook:26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems; 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems; firstpage:175; lastpage:180; numberofpages:6; https://hdl.handle.net/11583/2977969; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85162246761; https://ieeexplore.ieee.org/document/10139763

الاتاحة: https://hdl.handle.net/11583/2977969
https://doi.org/10.1109/DDECS57882.2023.10139763
https://ieeexplore.ieee.org/document/10139763

المؤلفون: Azimi,Sarah, De Sio, Corrado, Sterpone, Luca

المساهمون: Azimi, Sarah, De Sio, Corrado, Sterpone, Luca

مصطلحات موضوعية: CNN, Violence Recognition, Edge Devices

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-2486-0; info:eu-repo/semantics/altIdentifier/wos/WOS:001103233000013; ispartofbook:2023 IEEE International Symposium on Technology and Society (ISTAS); IEEE International Symposium on Technology and Society (ISTAS23); firstpage:1; lastpage:4; numberofpages:4; https://hdl.handle.net/11583/2981724; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85178514099; https://ieeexplore.ieee.org/document/10305989

الاتاحة: https://hdl.handle.net/11583/2981724
https://doi.org/10.1109/ISTAS57930.2023.10305989
https://ieeexplore.ieee.org/document/10305989

المؤلفون: Ruospo, Annachiara, Gavarini, Gabriele, De Sio, Corrado, Guerrero Balaguera, Juan David, Sterpone, Luca, Sonza Reorda, Matteo, Sanchez, Ernesto, Mariani, Riccardo, Aribido, Joseph, Athavale, Jyotika

المساهمون: Ruospo, Annachiara, Gavarini, Gabriele, De Sio, Corrado, Guerrero Balaguera, Juan David, Sterpone, Luca, Sonza Reorda, Matteo, Sanchez, Ernesto, Mariani, Riccardo, Aribido, Joseph, Athavale, Jyotika

مصطلحات موضوعية: Statistical Fault Injection, Reliability, Convolutional Neural Network, Fault Injection

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-9624-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001027444200081; ispartofbook:IEEE Design, Automation and Test in Europe Conference (DATE); IEEE Design, Automation and Test in Europe Conference (DATE); firstpage:1; lastpage:6; numberofpages:6; https://hdl.handle.net/11583/2974299; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85161879983; https://ieeexplore.ieee.org/document/10136998

الاتاحة: https://hdl.handle.net/11583/2974299
https://doi.org/10.23919/DATE56975.2023.10136998
https://ieeexplore.ieee.org/document/10136998

المؤلفون: Azimi, Sarah, De Sio, Corrado, Carlucci, Francesco, Sterpone, Luca

المساهمون: Azimi, Sarah, De Sio, Corrado, Carlucci, Francesco, Sterpone, Luca

مصطلحات موضوعية: Signal for Help, Gesture Recognition, Convolutional Neural Networks

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:001306715500010; volume:17; firstpage:1; lastpage:24; numberofpages:24; journal:INTELLIGENT SYSTEMS WITH APPLICATIONS; https://hdl.handle.net/11583/2974541; https://www.sciencedirect.com/science/article/pii/S2667305322001119

الاتاحة: https://hdl.handle.net/11583/2974541
https://doi.org/10.1016/j.iswa.2022.200174
https://www.sciencedirect.com/science/article/pii/S2667305322001119

المؤلفون: De Sio, Corrado, Azimi, Sarah, Portaluri, Andrea, Rizzieri, Daniele, Vacca, Eleonora, Sterpone, Luca, Merodio Codinachs, David

المساهمون: De Sio, Corrado, Azimi, Sarah, Portaluri, Andrea, Rizzieri, Daniele, Vacca, Eleonora, Sterpone, Luca, Merodio Codinachs, David

مصطلحات موضوعية: MBU, Proton Radiation Test, Real-Time Operating System, SEU, Soft Processor

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-7123-9; info:eu-repo/semantics/altIdentifier/wos/WOS:001164255500056; ispartofbook:2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS); IEEE Radiation and its Effects on Components and Systems 2022; firstpage:1; lastpage:4; numberofpages:4; http://hdl.handle.net/11583/2970911; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85185563903; https://ieeexplore.ieee.org/document/10412414

الاتاحة: http://hdl.handle.net/11583/2970911
https://doi.org/10.1109/RADECS55911.2022.10412414
https://ieeexplore.ieee.org/document/10412414

المؤلفون: Portaluri, Andrea, Azimi, Sarah, De Sio, Corrado, Sterpone, Luca, Merodio Codinachs, David

المساهمون: Portaluri, Andrea, Azimi, Sarah, De Sio, Corrado, Sterpone, Luca, Merodio Codinachs, David

مصطلحات موضوعية: DMA, Fault Injection, MBU, FPGA, Radiation-induced Effect, Reconfigurable SoC, SEU

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000865857100007; ispartofbook:IEEE International Symposium on On-Line Testing and Robust System Design; IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022); firstpage:1; lastpage:7; numberofpages:7; https://hdl.handle.net/11583/2970901; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85141367569; https://ieeexplore.ieee.org/document/9897262

الاتاحة: https://hdl.handle.net/11583/2970901
https://doi.org/10.1109/IOLTS56730.2022.9897262
https://ieeexplore.ieee.org/document/9897262

المؤلفون: Du, Boyang, Azimi, Sarah, Moramarco, Annarita, Sabena, Davide, Parisi, Filippo, Sterpone, Luca

المساهمون: Du, Boyang, Azimi, Sarah, Moramarco, Annarita, Sabena, Davide, Parisi, Filippo, Sterpone, Luca

مصطلحات موضوعية: Automotive electronics, reliability, system validation, system verification, testing

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000732319100001; volume:16; issue:2; firstpage:2495; lastpage:2506; numberofpages:12; journal:IEEE SYSTEMS JOURNAL; http://hdl.handle.net/11583/2898672; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85105862976; https://ieeexplore.ieee.org/document/9425022

الاتاحة: http://hdl.handle.net/11583/2898672
https://doi.org/10.1109/JSYST.2021.3069548
https://ieeexplore.ieee.org/document/9425022

المؤلفون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

المساهمون: Vacca, Eleonora, Azimi, Sarah, Sterpone, Luca

مصطلحات موضوعية: Reliability, Radiation effect, Design Mitigation Technique, Layouts, FPGA

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000920730100003; volume:138; numberofpages:6; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11583/2971149; https://www.sciencedirect.com/science/article/abs/pii/S002627142200302X?via=ihub

الاتاحة: http://hdl.handle.net/11583/2971149
https://doi.org/10.1016/j.microrel.2022.114778
https://www.sciencedirect.com/science/article/abs/pii/S002627142200302X?via=ihub