المؤلفون: Soraya Zangenehzadeh, Emil Agocs, Fenja Schröder, Nassima Amroun, Rebekka Biedendieck, Dieter Jahn, Axel Günther, Lei Zheng, Bernhard Roth, Hans-Hermann Johannes, Wolfgang Kowalsky

المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-11 (2024)

مصطلحات موضوعية: Spectroscopic ellipsometry, Surface plasmon resonance, Electro-optic polarization modulation, E. coli bacteria, Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/08ba5b4f24c94d698bde8e258809613c

المؤلفون: Hoang Tung Nguyen, Van Long Le, Thi Mai Nguyen, Xuan Khuyen Bui, Thi Giang Nguyen, Nhat Linh Nguyen, Xuan Au Nguyen, Tae Jung Kim

المصدر: Nanomaterials, Vol 15, Iss 1, p 76 (2025)

مصطلحات موضوعية: MoS 2 and WS 2 heterostructures, spectroscopic ellipsometry, dielectric function, temperature dependence, critical point, exciton, Chemistry, QD1-999

Relation: https://www.mdpi.com/2079-4991/15/1/76; https://doaj.org/toc/2079-4991; https://doaj.org/article/d8b964c42224420398b829d6e5b88739

الاتاحة: https://doi.org/10.3390/nano15010076
https://doaj.org/article/d8b964c42224420398b829d6e5b88739

المؤلفون: Anna Szekeres, Sashka Alexandrova, Mihai Anastasescu, Hermine Stroescu, Mariuca Gartner, Peter Petrik

المصدر: Micro, Vol 4, Iss 3, Pp 426-441 (2024)

مصطلحات موضوعية: low-energy H+ ion implantation of c-Si, dry oxidation of H+-implanted silicon, UV–vis–IR spectroscopic ellipsometry, electroreflectance spectroscopy, AFM imaging, Physics, QC1-999, Microscopy, QH201-278.5, Microbiology, QR1-502, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2673-8023/4/3/27; https://doaj.org/toc/2673-8023

URL الوصول: https://doaj.org/article/dbb68e48a7e44addb3220f9bf75b3493

المؤلفون: Seref Kalem

المصدر: Scientific Reports, Vol 14, Iss 1, Pp 1-9 (2024)

مصطلحات موضوعية: Silicon suboxide, Oxides, Energy dispersive X-ray, Localized vibrational modes, Photoluminescence, Spectroscopic ellipsometry, Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/b26dd565e88148248f96dcbcf17044e0

المؤلفون: Alireza Mikhchin, Seyed Iman Hosseini, Saeid Khodadadi Najaf Abadi, Babak Mohammadhosseini, Somayeh Mehrabian

المصدر: Heliyon, Vol 10, Iss 22, Pp e40171- (2024)

مصطلحات موضوعية: Cu-DLC, Simultaneous DC-RF magnetron sputtering, Raman spectroscopy, Spectroscopic ellipsometry, Nanoindentation, Science (General), Q1-390, Social sciences (General), H1-99

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2405844024162020; https://doaj.org/toc/2405-8440

URL الوصول: https://doaj.org/article/02da760877f8423e81fb8230f0657eab

المؤلفون: Jorge Luis Vazquez‐Arce, Tibor Suta, Bálint Fodor, László Makai, Oscar Contreras, Amin Bahrami, Kornelius Nielsch, Hugo Tiznado

المصدر: Advanced Materials Interfaces, Vol 11, Iss 26, Pp n/a-n/a (2024)

مصطلحات موضوعية: atomic layer deposition, black TiO2, optical properties, spectroscopic ellipsometry, thin films, Physics, QC1-999, Technology

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2196-7350

URL الوصول: https://doaj.org/article/597f5de8b7554c01b61e2fd1d2754f2c

المؤلفون: Liyuan Ma, Xipeng Xu, Changcai Cui, Mai Gao, Tukun Li, Shan Lou, Paul J. Scott, Xiangqian Jiang, Wenhan Zeng

المصدر: Photonics, Vol 12, Iss 1, p 60 (2025)

مصطلحات موضوعية: spectroscopic ellipsometry, whale optimization algorithm, thickness, refractive index, tin oxide, Applied optics. Photonics, TA1501-1820

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2304-6732/12/1/60; https://doaj.org/toc/2304-6732

URL الوصول: https://doaj.org/article/0b92042ec04c40b99db4d254c45e6622

المؤلفون: Zhe Chuan Feng, Manika Tun Nafisa, Yao Liu, Li Zhang, Yingming Wang, Xiaorong Xia, Ze Tao, Chuanwei Zhang, Jeffrey Yiin, Benjamin Klein, Ian Ferguson

المصدر: Photonics, Vol 11, Iss 12, p 1161 (2024)

مصطلحات موضوعية: AlN crystals, physical vapor transport, temperature-dependent Raman scattering, variable-angle spectroscopic ellipsometry, atomic force microscopy, residual tensile stress, Applied optics. Photonics, TA1501-1820

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2304-6732/11/12/1161; https://doaj.org/toc/2304-6732

URL الوصول: https://doaj.org/article/c23349b425c34025af043ff3dcea451a

المؤلفون: Jiamin Liu, Deng Xie, Zhe Chuan Feng, Manika Tun Nafisa, Lingyu Wan, Zhi-Ren Qiu, Dong-Sing Wuu, Chuanwei Zhang, Jeffrey Yiin, Hao-Hsiung Lin, Weijie Lu, Benjamin Klein, Ian T. Ferguson, Shiyuan Liu

المصدر: Nanomaterials, Vol 14, Iss 23, p 1957 (2024)

مصطلحات موضوعية: Mg0.1Zn0.9O, metal–organic vapor phase epitaxy, X–ray diffraction, spectroscopic ellipsometry, Raman spectroscopy, enharmonic phonon process, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/14/23/1957; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/92d3cb1b2a414753981ea16a5c1d77f7

المؤلفون: Jiang Zijie, Gan Zhuofei, Liang Chuwei, Li Wen-Di

المصدر: Nanophotonics, Vol 13, Iss 7, Pp 1181-1189 (2024)

مصطلحات موضوعية: spectroscopic ellipsometry, deep neural network, in-situ measurement, interference lithography, nanoimprint lithography, reactive-ion etching, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2192-8614

URL الوصول: https://doaj.org/article/fd1eaf9e86834108a578191b97a6b71a

المؤلفون: Zhe Chuan Feng, Ming Tian, Xiong Zhang, Manika Tun Nafisa, Yao Liu, Jeffrey Yiin, Benjamin Klein, Ian Ferguson

المصدر: Nanomaterials, Vol 14, Iss 21, p 1769 (2024)

مصطلحات موضوعية: AlGaN-GaN, high x(Al), metal–organic chemical vapor deposition, spectroscopic ellipsometry, X-ray diffraction, Raman scattering, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/14/21/1769; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/a08b91d0c63b4b2588c06c4269cf9bd1

المؤلفون: Despoina Tselekidou, Kyparisis Papadopoulos, Konstantinos C. Andrikopoulos, Aikaterini K. Andreopoulou, Joannis K. Kallitsis, Stergios Logothetidis, Argiris Laskarakis, Maria Gioti

المصدر: Nanomaterials, Vol 14, Iss 20, p 1623 (2024)

مصطلحات موضوعية: blue-light emitting OLEDs, polyfluorene, polycarbazole, spectroscopic ellipsometry, color selectivity, Chemistry, QD1-999

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2079-4991/14/20/1623; https://doaj.org/toc/2079-4991

URL الوصول: https://doaj.org/article/f17d3385cb874411a2606ffa890000f1

المؤلفون: Maria Fernanda Villa-Bracamonte, Jose Raul Montes-Bojorquez, Arturo A. Ayon

المصدر: Results in Optics, Vol 15, Iss , Pp 100640- (2024)

مصطلحات موضوعية: Perovskite, Spectroscopic ellipsometry, Optical properties, Refractive index, Dielectric function, MAPbI3, Optics. Light, QC350-467

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2666950124000373; https://doaj.org/toc/2666-9501

URL الوصول: https://doaj.org/article/3567f3ec456d49d0958ea6550a9b7985

المؤلفون: Alexandros Zachariadis, Michalis Chatzidis, Despoina Tselekidou, Olaf Wurzinger, Dietmar Keiper, Peter K. Baumann, Michael Heuken, Kyparisis Papadopoulos, Argiris Laskarakis, Stergios Logothetidis, Maria Gioti

المصدر: Micromachines, Vol 15, Iss 9, p 1089 (2024)

مصطلحات موضوعية: 8-Quinolinolato Lithium, Liq, Spectroscopic Ellipsometry, OLED, OVPD, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/15/9/1089; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/cab9772598f74db79e657fdfd135693a

المؤلفون: Alexandra M. Patron, Kayleigh L. Coleman, Thomas J. Mullen

المصدر: Micromachines, Vol 15, Iss 7, p 826 (2024)

مصطلحات موضوعية: spectroscopic ellipsometry, metal-ligated multilayer, molecular ruler, hybrid nanolithography, mercaptohexadecanoic acid, self-assembled monolayer, Mechanical engineering and machinery, TJ1-1570

وصف الملف: electronic resource

Relation: https://www.mdpi.com/2072-666X/15/7/826; https://doaj.org/toc/2072-666X

URL الوصول: https://doaj.org/article/09c31247846b4f98abf68339f157b82f

المؤلفون: József Bálint Renkó, Alekszej Romanenko, Tamás Bíró, Péter János Szabó, Péter Petrik, Attila Bonyár

المصدر: Heliyon, Vol 10, Iss 3, Pp e25271- (2024)

مصطلحات موضوعية: In-situ, Color etching, Beraha˗I, Optical microscopy, Spectroscopic ellipsometry, Layer development kinetics, Science (General), Q1-390, Social sciences (General), H1-99

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2405844024013021; https://doaj.org/toc/2405-8440

URL الوصول: https://doaj.org/article/a04c4c0bb9914d499109b4335eedfc48

المؤلفون: Jordi Sans, Ingrid Azevedo Gonçalves, Robert Quintana

المصدر: Advanced Materials Interfaces, Vol 11, Iss 2, Pp n/a-n/a (2024)

مصطلحات موضوعية: hydration layers, hydrogel coating, plasma‐induced polymerization, QCM‐D, spectroscopic ellipsometry, Physics, QC1-999, Technology

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2196-7350

URL الوصول: https://doaj.org/article/6f199894dcf342e080674b4eda1ae70d

المؤلفون: Chowdhary, Nimarta Kaur, Gougousi, Theodosia

مصطلحات موضوعية: UMBC Materials Physics Lab, spectroscopic ellipsometry, atomic layer deposition, optical characterization

الاتاحة: https://dx.doi.org/10.13016/m2oef1-pgzh
https://mdsoar.org/handle/11603/37420

المؤلفون: Sypniewska, Małgorzata, Pokladko-Kowar, Monika, Kaczmarek-Kedziera, Anna, Brumboiu, Iulia, E, Figà, Viviana, Apostoluk, Aleksandra, Song, Peng, Liu, Junyan, Szczesny, Robert, Gondek, Ewa, Derkowska-Zielinska, Beata

المساهمون: Nicolaus Copernicus University Toruń, Cracow University of Technology, Università degli studi di Palermo - University of Palermo, INL - Matériaux Fonctionnels et Nanostructures (INL - MFN), Institut des Nanotechnologies de Lyon (INL), École Centrale de Lyon (ECL), Université de Lyon-Université de Lyon-Université Claude Bernard Lyon 1 (UCBL), Université de Lyon-École Supérieure de Chimie Physique Électronique de Lyon (CPE)-Institut National des Sciences Appliquées de Lyon (INSA Lyon), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS)-École Centrale de Lyon (ECL), Université de Lyon-Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-Centre National de la Recherche Scientifique (CNRS), Harbin Institute of Technology (HIT)

المصدر: ISSN: 1230-3402 ; Opto-Electronics Review ; https://hal.science/hal-04803582 ; Opto-Electronics Review, 2024, ⟨10.24425/opelre.2023.146105⟩.

مصطلحات موضوعية: Tris(8-hydroxyquinoline)aluminium, polypyrrole, OLED, photo-and electro-luminescence, spectroscopic ellipsometry, [SPI]Engineering Sciences [physics]

الاتاحة: https://hal.science/hal-04803582
https://hal.science/hal-04803582v1/document
https://hal.science/hal-04803582v1/file/OPELRE_2023_31_2_%20M_Sypniewska.pdf
https://doi.org/10.24425/opelre.2023.146105

المؤلفون: Vazquez‐Arce, Jorge Luis, Suta, Tibor, Fodor, Bálint, Makai, László, Contreras, Oscar, Bahrami, Amin, Nielsch, Kornelius, Tiznado, Hugo

مصطلحات موضوعية: ddc:540, ddc:600, atomic layer deposition, black TiO 2, optical properties, spectroscopic ellipsometry, thin films

وصف الملف: application/pdf

Relation: ESSN:2196-7350; https://oa.tib.eu/renate/handle/123456789/16797; https://doi.org/10.34657/15819

الاتاحة: https://oa.tib.eu/renate/handle/123456789/16797
https://doi.org/10.34657/15819