-
1Academic Journal
المؤلفون: Vermeij, T., Wijnen, J., Peerlings, R.H.J., Geers, M.G.D., Hoefnagels, J.P.M.
المصدر: Vermeij , T , Wijnen , J , Peerlings , R H J , Geers , M G D & Hoefnagels , J P M 2024 , ' A quasi-2D integrated experimental–numerical approach to high-fidelity mechanical analysis of metallic microstructures ' , Acta Materialia , vol. 264 , 119551 . https://doi.org/10.1016/j.actamat.2023.119551
مصطلحات موضوعية: 2D testing, Crystal plasticity, Crystalline materials, EBSD, Experimental–numerical testing, Integrated testing, Micromechanics, SEM-DIC
وصف الملف: application/pdf
-
2Academic Journal
المؤلفون: Olivier Verschatse, Wim Van Paepegem, Karen De Clerck, Lode Daelemans
المصدر: Polymer Testing, Vol 125, Iss , Pp 108134- (2023)
مصطلحات موضوعية: SEM-DIC, Micromechanical testing, Polymers, Epoxy, Polymers and polymer manufacture, TP1080-1185
وصف الملف: electronic resource
-
3Academic Journal
المؤلفون: Vermeij, T., Peerlings, R.H.J., Geers, M.G.D., Hoefnagels, J.P.M.
المصدر: Vermeij , T , Peerlings , R H J , Geers , M G D & Hoefnagels , J P M 2023 , ' Automated identification of slip system activity fields from digital image correlation data ' , Acta Materialia , vol. 243 , 118502 . https://doi.org/10.1016/j.actamat.2022.118502
مصطلحات موضوعية: Cross slip, Crystallographic slip, Diffuse slip, Micro-plasticity, SEM-DIC, Slip system identification
وصف الملف: application/pdf
الاتاحة: https://research.tue.nl/en/publications/5d22550f-9c6d-4929-bf37-b63957055f0b
https://doi.org/10.1016/j.actamat.2022.118502
https://pure.tue.nl/ws/files/240266959/2023_Vermeij_EtAl_ActaMater_Automated_identification_of_slip_system_activity_fields_from_digital_image_correlation_data.pdf
http://www.scopus.com/inward/record.url?scp=85142144014&partnerID=8YFLogxK -
4Academic Journal
المؤلفون: Vermeij, T., Verstijnen, J.A.C., Ramirez y Cantador, T.J.J., Blaysat, B., Neggers, J., Hoefnagels, J.P.M.
المصدر: Vermeij , T , Verstijnen , J A C , Ramirez y Cantador , T J J , Blaysat , B , Neggers , J & Hoefnagels , J P M 2022 , ' A Nanomechanical Testing Framework Yielding Front &Rear-Sided, High-Resolution, Microstructure-Correlated SEM-DIC Strain Fields ' , Experimental Mechanics , vol. 62 , no. 9 , pp. 1625-1646 . https://doi.org/10.1007/s11340-022-00884-0
مصطلحات موضوعية: Interface mechanics, Microstructure strain alignment, Nano SEM-DIC, Nano tensile testing
وصف الملف: application/pdf
الاتاحة: https://research.tue.nl/en/publications/93e62ef7-c2b0-4125-963d-a9170abffe83
https://doi.org/10.1007/s11340-022-00884-0
https://pure.tue.nl/ws/files/216284136/2022_Vermeij_et_al_ExpMech_NanoMechanical_Testing_Alignment_framework.pdf
https://pure.tue.nl/ws/files/226381527/s11340_022_00884_0.pdf
http://www.scopus.com/inward/record.url?scp=85135892894&partnerID=8YFLogxK -
5Academic Journal
المصدر: Crystals; Volume 11; Issue 4; Pages: 435
مصطلحات موضوعية: crystal plasticity, twinning, detwinning, dislocation, X-ray diffraction, SEM-DIC, Magnesium
وصف الملف: application/pdf
Relation: Inorganic Crystalline Materials; https://dx.doi.org/10.3390/cryst11040435
-
6Academic Journal
المؤلفون: Y. Mammadi, A. Joseph, A. Joulain, J. Bonneville, C. Tromas, S. Hedan, V. Valle
المصدر: Materials & Design, Vol 192, Iss , Pp 108665- (2020)
مصطلحات موضوعية: Fracture, FIB-SEM-DIC, Image correlation, Residual strains, Materials of engineering and construction. Mechanics of materials, TA401-492
وصف الملف: electronic resource
-
7Academic Journal
المؤلفون: Itsuki KAWATA, Kenta KIKUCHI, Masahiro TAKANASHI, Masayuki TSUKADA, Shigeru YASUDA, Shinya MIYAZAKI, 塚田 理之, 安田 茂, 宮崎 信弥, 川田 樹, 菊池 健太, 高梨 正祐
المصدر: The Proceedings of the Materials and Mechanics Conference. 2022, :0512
-
8
المؤلفون: T. Vermeij, J.A.C. Verstijnen, T.J.J. Ramirez y Cantador, B. Blaysat, J. Neggers, J.P.M. Hoefnagels
المساهمون: Group Geers, Group Hoefnagels, Mechanics of Materials, Mechanical Engineering
المصدر: Experimental Mechanics, 62(9), 1625-1646. Springer
مصطلحات موضوعية: Condensed Matter - Materials Science, Nano tensile testing, Mechanics of Materials, Mechanical Engineering, Aerospace Engineering, Nano SEM-DIC, Physics - Applied Physics, Interface mechanics, Microstructure strain alignment
وصف الملف: application/pdf
-
9Academic Journal
المؤلفون: Eugene S. Statnik, Codrutza Dragu, Cyril Besnard, Alexander J.G. Lunt, Alexey I. Salimon, Aleksey Maksimkin, Alexander M. Korsunsky
المصدر: Polymers; Volume 12; Issue 11; Pages: 2607
مصطلحات موضوعية: SEM-DIC, Ncorr, porous UHMWPE, Deben Microtest, Avizo, tomography
وصف الملف: application/pdf
Relation: Polymer Applications; https://dx.doi.org/10.3390/polym12112607
-
10
المؤلفون: T. Vermeij, R.H.J. Peerlings, M.G.D. Geers, J.P.M. Hoefnagels
المساهمون: Group Hoefnagels, Group Geers, Mechanics of Materials, Group Peerlings
المصدر: Acta Materialia, 243:118502. Elsevier
مصطلحات موضوعية: Condensed Matter - Materials Science, Polymers and Plastics, Micro-plasticity, Slip system identification, Metals and Alloys, Ceramics and Composites, Materials Science (cond-mat.mtrl-sci), FOS: Physical sciences, Diffuse slip, Cross slip, SEM-DIC, Crystallographic slip, Electronic, Optical and Magnetic Materials
وصف الملف: application/pdf
-
11
المؤلفون: Alexander J.G. Lunt, Aleksey V. Maksimkin, Cyril Besnard, Alexander M. Korsunsky, Codrutza Dragu, Alexey I. Salimon, Eugene S. Statnik
المصدر: Polymers
Volume 12
Issue 11مصطلحات موضوعية: Digital image correlation, Materials science, Polymers and Plastics, Scanning electron microscope, Avizo, Deben Microtest, 02 engineering and technology, tomography, 010402 general chemistry, 01 natural sciences, Article, chemistry.chemical_compound, Composite material, Porosity, Ultra-high-molecular-weight polyethylene, General Chemistry, Polyethylene, SEM-DIC, 021001 nanoscience & nanotechnology, porous UHMWPE, 0104 chemical sciences, chemistry, Deformation bands, Ncorr, Deformation (engineering), 0210 nano-technology, Porous medium
وصف الملف: application/pdf
-
12Dissertation/ Thesis
المؤلفون: Mammadi, Younes
المساهمون: Institut Pprime UPR 3346 (PPrime Poitiers ), Université de Poitiers = University of Poitiers (UP)-École Nationale Supérieure de Mécanique et d’Aérotechnique Poitiers (ISAE-ENSMA )-Centre National de la Recherche Scientifique (CNRS), Université de Poitiers, Valéry Valle, Stéphen Hedan
المصدر: https://theses.hal.science/tel-04086860 ; Mécanique des matériaux [physics.class-ph]. Université de Poitiers, 2020. Français. ⟨NNT : 2020POIT2288⟩.
مصطلحات موضوعية: Fracture, Fib-Sem-Dic, Image correlation, Residual strains, Corrélation d'images, Déformation résiduelles, [SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph], [INFO.INFO-TI]Computer Science [cs]/Image Processing [eess.IV]
Relation: NNT: 2020POIT2288; tel-04086860; https://theses.hal.science/tel-04086860; https://theses.hal.science/tel-04086860/document; https://theses.hal.science/tel-04086860/file/2020-MAMMADI-Younes-These.pdf
-
13Dissertation/ Thesis
المؤلفون: Mammadi, Younes
المساهمون: Poitiers, Valle, Valéry, Hedan, Stéphen
مصطلحات موضوعية: Fracture, Fib-Sem-Dic, Corrélation d'images, Déformation résiduelles, Image correlation, Residual strains
Time: 620
-
14
المؤلفون: Oelker, Anne
المساهمون: Urai, Janos, Viggiani, Gioacchino
المصدر: Aachen 1 Online-Ressource (181, LXXL Seiten) : Illustrationen, Diagramme, Karten (2019). doi:10.18154/RWTH-2019-09913 = Dissertation, Rheinisch-Westfälische Technische Hochschule Aachen, 2019
مصطلحات موضوعية: X-ray, DIC, BIB, SEM, microstructure, ddc:550, deformation, microscopy, triaxial testing, clay, Boom Clay, Boom Clay, clay, deformation, triaxial testing, BIB, SEM, DIC, X-ray, microstructure, microscopy
-
15Dissertation/ Thesis
المؤلفون: Farrell, Sean
المساهمون: Diak, Bradley, Pilkey, Keith, Mechanical and Materials Engineering
مصطلحات موضوعية: metal matrix composite, digital image correlation, SEM-DIC, cast, aluminum, aluminium, yield, fracture, tib2, Al-Cu-Mg-Ag, A205, particulate, age-hardenable, mechanical testing, structure-property relationship, yield strength, Failure, intergranular, Damage, Strengthening mechanisms, FIB-SEM, 3D Reconstruction, Microstructure, FIB 3D Reconstruction, X-ray Tomography
Relation: Canadian theses; http://hdl.handle.net/1974/30231
الاتاحة: http://hdl.handle.net/1974/30231
-
16
المؤلفون: Esquivel, Javier
المصدر: Open Access Theses
مصطلحات موضوعية: Computer Sciences, Materials Science and Engineering, Digital image correlation, Aerospace Engineering, Applied sciences, SEM-DIC, Scanning electron microscopy
وصف الملف: application/pdf