المؤلفون: Qiang, Lanpeng¹ (AUTHOR) qianglanpeng@163.com, Chereau, Emmanuel² (AUTHOR), Regreny, Philippe¹ (AUTHOR), Avit, Geoffrey² (AUTHOR), Trassoudaine, Agnès² (AUTHOR), Gil, Evelyne² (AUTHOR), André, Yamina² (AUTHOR), Bluet, Jean-Marie¹ (AUTHOR), Albertini, David¹ (AUTHOR), Brémond, Georges¹ (AUTHOR)

المصدر: Journal of Applied Physics. 7/21/2024, Vol. 136 Issue 3, p1-6. 6p.

مصطلحات موضوعية: *MOLECULAR beam epitaxy, *SECONDARY ion mass spectrometry, *AUDITING standards, *MOLECULAR structure, *THICK films, *GALLIUM arsenide

المؤلفون: Sun, L.¹ (AUTHOR) ijie.sun-3@postgrad.manchester.ac.uk, Kruszewski, P.² (AUTHOR), Markevich, V. P.¹ (AUTHOR), Dawe, C. A.¹ (AUTHOR), Peaker, A. R.¹ (AUTHOR), Crowe, I. F.¹ (AUTHOR), Plesiewicz, J.² (AUTHOR), Prystawko, P.² (AUTHOR), Grzanka, Sz.² (AUTHOR), Grzanka, E.² (AUTHOR), Jakiela, R.³ (AUTHOR), Binks, D.¹ (AUTHOR), Halsall, M. P.¹ (AUTHOR)

المصدر: Journal of Applied Physics. 5/7/2024, Vol. 135 Issue 17, p1-7. 7p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *SCHOTTKY barrier diodes, *OPTICAL measurements, *ULTRAVIOLET detectors, *ELECTRON emission, *DILUTE alloys

المؤلفون: Lechner, E. M.¹ (AUTHOR) lechner@jlab.org, Angle, J. W.² (AUTHOR), Palczewski, A. D.¹ (AUTHOR), Stevie, F. A.³ (AUTHOR), Kelley, M. J.^1,4 (AUTHOR), Reece, C. E.¹ (AUTHOR)

المصدر: Journal of Applied Physics. 4/7/2024, Vol. 135 Issue 13, p1-11. 11p.

مصطلحات موضوعية: *NIOBIUM, *SECONDARY ion mass spectrometry, *DEPTH profiling, *BATHYMETRY, *ITRACONAZOLE

مصطلحات جغرافية: LONDON (England)

المؤلفون: Mizuno, Tomohisa¹ (AUTHOR) mizuno@kanagawa-u.ac.jp, Murakawa, Koki¹ (AUTHOR)

المصدر: Journal of Applied Physics. 1/14/2024, Vol. 135 Issue 2, p1-12. 12p.

مصطلحات موضوعية: *QUANTUM dots, *SECONDARY ion mass spectrometry, *PHOTOLUMINESCENCE, *ATOM trapping, *ELECTRON traps

المؤلفون: Vázquez-González, Perla J.¹ (AUTHOR) rafael.mg@tuxtla.tecnm.mx, Paniagua-Chávez, Martha L.¹ (AUTHOR), Zebadua-Chavarria, Lizette A.² (AUTHOR), Mota-Grajales, Rafael¹ (AUTHOR), Meza-Avendaño, C. A.³ (AUTHOR) carlos.meza@unicach.mx, Campos-González, Enrique⁴ (AUTHOR) enrique.campos.conacyt@inin.gob.mx, Escobosa-Echavarría, A.⁵ (AUTHOR) escobosa@cinvestav.mx, Hu, Yaoqiao⁶ (AUTHOR) yaoqiao.hu@utdallas.edu, Pérez-Ramos, Aldo E.⁷ (AUTHOR) dr.aldo@itoaxaca.edu.mx, Manuel-Matuz⁸ (AUTHOR) mjmatuz@tapachula.tecnm.mx, Hernández-Gutiérrez, Carlos A.¹ (AUTHOR) carlos.hg@tuxtla.tecnm.mx

المصدر: Nanomaterials (2079-4991). Jan2025, Vol. 15 Issue 2, p85. 16p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *FIELD emission electron microscopy, *X-ray photoelectron spectroscopy, *BAND gaps, *DENSITY functional theory

المؤلفون: McKibbin, Seann J.^1,2,3,4 (AUTHOR) seann.mckibbin@gmail.com, Ávila, Janaína N.^3,5 (AUTHOR), Ireland, Trevor R.^3,6 (AUTHOR), Van Ginneken, Matthias^1,7,8,9 (AUTHOR), Soens, Bastien¹ (AUTHOR), Van Maldeghem, Flore¹ (AUTHOR), Huber, Matthew¹⁰ (AUTHOR), Baeza, Leonardo³ (AUTHOR), Patkar, Aditya³ (AUTHOR), Vanhaecke, Frank¹¹ (AUTHOR), Debaille, Vinciane⁷ (AUTHOR), Claeys, Philippe¹ (AUTHOR), Goderis, Steven¹ (AUTHOR)

المصدر: Rapid Communications in Mass Spectrometry: RCM. Jan2025, Vol. 39 Issue 1, p1-15. 15p.

مصطلحات موضوعية: *LASER ablation inductively coupled plasma mass spectrometry, *SECONDARY ion mass spectrometry, *SPHERULES (Geology), *CHEMICAL models, *ANALYTICAL samples (Chemistry), *OXYGEN isotopes, *SILICON isotopes

المؤلفون: Klump, Andrew¹ (AUTHOR) andrew.klump12@gmail.com, Hartmann, Carsten¹ (AUTHOR), Bickermann, Matthias¹ (AUTHOR), Straubinger, Thomas¹ (AUTHOR)

المصدر: CrystEngComm. 1/14/2025, Vol. 27 Issue 2, p184-190. 7p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *RANDOM forest algorithms, *DOPING agents (Chemistry), *ABSORPTION spectra, *SINGLE crystals

المؤلفون: Khan, Saleh Ahmed¹ (AUTHOR), Ibreljic, Ahmed¹ (AUTHOR), Margiotta, Stephen¹ (AUTHOR), Bhuiyan, A. F. M. Anhar Uddin¹ (AUTHOR) anhar_bhuiyan@uml.edu

المصدر: Applied Physics Letters. 1/6/2025, Vol. 126 Issue 1, p1-9. 9p.

مصطلحات موضوعية: *ATOMIC force microscopy, *SECONDARY ion mass spectrometry, *CARRIER density, *SURFACE roughness, *CHEMICAL vapor deposition

Alternate Title: Microstructure Characterization and Mineral Morphology of Tea-Dust Glaze Made in the Ding Kiln of the Northern Song Dynasty.

المؤلفون: 徐建业^1,2 cheam22@163.com, 王富芳^1,2, 梁汉东^1,2 HDL6688@vip.sina.com, 李展平^3,4 zhanpingli@mail.tsinghua.edu.cn

المصدر: Rock & Mineral Analysis. Jan2025, Vol. 44 Issue 1, p115-126. 12p.

مصطلحات موضوعية: *MINERALS, *SECONDARY ion mass spectrometry, *LASER ablation inductively coupled plasma mass spectrometry, *SCANNING electron microscopy, *OPTICAL microscopes, *RAMAN lasers, *LASER plasmas, SONG dynasty, China, 960-1279

المؤلفون: Hose, Dirk¹ (AUTHOR) dirk.hose@vub.be, Ray, Seemun² (AUTHOR), Rößler, Sina³ (AUTHOR), Thormann, Ulrich² (AUTHOR), Schnettler, Reinhard⁴ (AUTHOR), de Veirman, Kim¹ (AUTHOR), El Khassawna, Thaqif² (AUTHOR), Heiss, Christian² (AUTHOR), Hild, Anne⁵ (AUTHOR), Zahner, Daniel⁴ (AUTHOR), Alagboso, Francisca² (AUTHOR), Henss, Anja⁶ (AUTHOR), Beck, Susanne¹ (AUTHOR), Emde-Rajaratnam, Martina¹ (AUTHOR), Burhenne, Jürgen⁷ (AUTHOR), Bamberger, Juliane⁸ (AUTHOR), Menu, Eline¹ (AUTHOR), de Bruyne, Elke¹ (AUTHOR), Gelinsky, Michael⁹ (AUTHOR), Kampschulte, Marian⁸ (AUTHOR)

المصدر: Journal of Hematology & Oncology. 12/18/2024, Vol. 17 Issue 1, p1-20. 20p.

مصطلحات موضوعية: *LIQUID chromatography-mass spectrometry, *SECONDARY ion mass spectrometry, *MEDICAL sciences, *PLASMA cells, *BONE marrow cells

المؤلفون: Dalou, Celia¹ (AUTHOR) celia.dalou@univ-lorraine.fr, Riguet, Lenny^1,2 (AUTHOR), Villeneuve, Johan¹ (AUTHOR), Tissandier, Laurent¹ (AUTHOR), Rigaudier, Thomas¹ (AUTHOR), Cividini, Damien¹ (AUTHOR), Zollinger, Julien³ (AUTHOR), Paris, Guillaume¹ (AUTHOR)

المصدر: Geostandards & Geoanalytical Research. Dec2024, Vol. 48 Issue 4, p927-940. 14p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *IRON meteorites, *MELT spinning, *SULFUR isotopes, *ALLOYS

المؤلفون: Jin, Shiyun¹ (AUTHOR) sjin@gia.edu, Saxey, David W.² (AUTHOR), Quadir, Zakaria² (AUTHOR), Reddy, Steven M.^2,3 (AUTHOR), Rickard, William D. A.² (AUTHOR), Fougerouse, Denis^2,3 (AUTHOR), Sun, Xiao² (AUTHOR), Palke, Aaron C.¹ (AUTHOR)

المصدر: Contributions to Mineralogy & Petrology. Dec2024, Vol. 179 Issue 12, p1-15. 15p.

مصطلحات موضوعية: *ATOM-probe tomography, *SECONDARY ion mass spectrometry, *TRANSMISSION electron microscopes, *EARTH sciences, *PHYSICAL geology, *LASER ablation inductively coupled plasma mass spectrometry

المؤلفون: Liu, Ming-Chang^1,2 (AUTHOR) liu88@llnl.gov, Matsuda, Nozomi² (AUTHOR), McKeegan, Kevin D.² (AUTHOR), Dunham, Emilie T.^1,2 (AUTHOR), McCain, Kaitlyn A.^1,2 (AUTHOR)

المصدر: Geochimica et Cosmochimica Acta. Dec2024, Vol. 386, p48-62. 15p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *SOLAR system, *ISOTOPIC fractionation, *CHONDRITES, *INHOMOGENEOUS materials

المؤلفون: Zhang, Wan-Feng^1,2 (AUTHOR), Yang, Qing¹ (AUTHOR) qingy@gig.ac.cn, Xia, Xiao-Ping³ (AUTHOR), Zheng, De-Wen⁴ (AUTHOR), Cui, Ze-Xian¹ (AUTHOR), Zhang, Yan-Qiang¹ (AUTHOR), Xu, Yi-Gang^1,2 (AUTHOR)

المصدر: JAAS (Journal of Analytical Atomic Spectrometry). Dec2024, Vol. 39 Issue 12, p2974-2981. 8p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *OXYGEN isotopes, *ISOTOPIC analysis, *ANALYTICAL chemistry, *BISMUTH

المؤلفون: Cao, Wentian¹ (AUTHOR) caowentian@sdnu.edu.cn, Qin, Xiaoqi¹ (AUTHOR), Wang, Shuyun¹ (AUTHOR)

المصدر: AIP Advances. Dec2024, Vol. 14 Issue 12, p1-7. 7p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *ENERGY levels (Quantum mechanics), *HALL effect, *CARRIER density, *PHONON scattering

المؤلفون: Tamadaddi, Chetana^1,2 (AUTHOR), Choi, Juseok³ (AUTHOR), Ghasemi, Masoud⁴ (AUTHOR), Kim, Seong H^2,3 (AUTHOR), Gomez, Enrique D^2,4 (AUTHOR), Gomez, Esther W^2,3 (AUTHOR), Anderson, Charles T^1,2 (AUTHOR)

المصدر: Annals of Botany. Dec2024, Vol. 134 Issue 6, p1097-1111. 15p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *FIELD emission electron microscopy, *TRANSCRIPTION factors, *PLANT cell walls, *ARABIDOPSIS thaliana, *X-ray emission spectroscopy

المؤلفون: Bonito Oliva, V.^1,2 (AUTHOR) valeria.bonito-oliva@ikz-berlin.de, Mangelinck, D.³ (AUTHOR), Hagedorn, S.⁴ (AUTHOR), Bracht, H.⁵ (AUTHOR), Irmscher, K.¹ (AUTHOR), Hartmann, C.¹ (AUTHOR), Vennéguès, P.² (AUTHOR), Albrecht, M.¹ (AUTHOR)

المصدر: Journal of Applied Physics. 9/7/2023, Vol. 134 Issue 9, p1-9. 9p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *DISLOCATION density, *DIFFUSION coefficients, *DEPTH profiling, *THERMOCHEMISTRY

المؤلفون: Langørgen, Amanda¹ (AUTHOR) amandl@uio.no, Kalmann Frodason, Ymir¹ (AUTHOR), Karsthof, Robert¹ (AUTHOR), von Wenckstern, Holger^1,2 (AUTHOR), Thue Jensen, Ingvild Julie^1,3 (AUTHOR), Vines, Lasse¹ (AUTHOR), Grundmann, Marius² (AUTHOR)

المصدر: Journal of Applied Physics. 7/7/2023, Vol. 134 Issue 1, p1-6. 6p.

مصطلحات موضوعية: *ZINC oxide films, *SECONDARY ion mass spectrometry, *INDIUM tin oxide, *CONDUCTION bands, *BUFFER layers, *SPECTROMETRY, *PULSED lasers, *SAPPHIRES

المؤلفون: Kim, Okhyeon¹ (AUTHOR), Choi, Yoonho¹ (AUTHOR), Kim, Changgyu¹ (AUTHOR), Kim, Hye-Lee^1,2 (AUTHOR), Lee, Won-Jun^1,2 (AUTHOR) wjlee@sejong.ac.kr

المصدر: Ceramics International. Nov2024:Part A, Vol. 50 Issue 22, p45044-45051. 8p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *ATOMIC layer deposition, *SILICON oxide films, *SILICON oxide, *STRAY currents

المؤلفون: Kang, Jun-Kyu¹ (AUTHOR) kangjunkyu4843@gmail.com, Yoon, Seo Jeong¹ (AUTHOR), Park, Honghyun² (AUTHOR) honghyun61@kims.re.kr, Lee, Seung-Jae³ (AUTHOR), Baek, Jaehoon⁴ (AUTHOR), Jeon, In-Yup^1,5 (AUTHOR) iyjeon79@wku.ac.kr, Gwak, So-Jung^1,6 (AUTHOR) iyjeon79@wku.ac.kr

المصدر: International Journal of Molecular Sciences. Nov2024, Vol. 25 Issue 22, p12414. 13p.

مصطلحات موضوعية: *SECONDARY ion mass spectrometry, *COLONY-forming units assay, *X-ray photoelectron spectroscopy, *ESCHERICHIA coli, *GRAPHENE oxide