المؤلفون: B. Adolphi, Wolf-Joachim Fischer, Jürgen Schreiber, V. Melev, O. Berger, S. Tierbach

المصدر: Journal of Materials Science: Materials in Electronics. 11:331-346

مصطلحات موضوعية: Diffraction, Materials science, Scanning electron microscope, Analytical chemistry, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry.chemical_compound, X-ray photoelectron spectroscopy, chemistry, Phthalocyanine, Sublimation (phase transition), Wafer, Crystallite, Electrical and Electronic Engineering, Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::44fbf96e5150894a3cc4c100ed149c6f
https://doi.org/10.1023/a:1008933516940