المؤلفون: S. K. Mukundan, C.R. Cirba, Ronald D. Schrimpf, M.P. Pagey, Kenneth F. Galloway

المصدر: Journal of Technology Computer Aided Design TCAD. :1-13

مصطلحات موضوعية: Materials science, Silicon, business.industry, Energy balance, Oxide, chemistry.chemical_element, Silicon on insulator, Substrate (electronics), PMOS logic, chemistry.chemical_compound, chemistry, Electronic engineering, Optoelectronics, Degradation (geology), business, Hot-carrier injection

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7048c6b2355bac031945c63c50ae090f
https://doi.org/10.1109/tcad.1996.6449178

المؤلفون: K.F. Galloway, Ronald D. Schrimpf, S. K. Mukundan, M.P. Pagey

المصدر: 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460).

مصطلحات موضوعية: Materials science, Silicon, business.industry, Energy balance, Oxide, chemistry.chemical_element, Heterojunction, Trapping, Trap (computing), Condensed Matter::Materials Science, chemistry.chemical_compound, Semiconductor, chemistry, MOSFET, Electronic engineering, Optoelectronics, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d687915daf3ffe6b634ccb66af5f7a13
https://doi.org/10.1109/irws.1999.830565