المؤلفون: K Isawa, K Yamada, M Nagano, M Ohashi, S Ogota, S Sudo, Y Yaegashi, 井澤 和幸, 八重樫 裕司, 大子田 誠也, 大橋 正義, 山田 和芳, 永野 貢, 須藤 皓

المصدر: Meeting Abstracts of the Physical Society of Japan. 1997, :697

المؤلفون: S. Ogota, K. Miyaguchi, F. Sato, Y. Igarashi, M. Hayashi, S. Hasegawa, Kazuyuki Isawa

المصدر: Physica C: Superconductivity and its Applications. 470:1529-1533

مصطلحات موضوعية: Materials science, business.industry, Scanning electron microscope, Energy Engineering and Power Technology, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, law.invention, Superalloy, Optics, Creep, Electron diffraction, Optical microscope, Scanning SQUID microscopy, law, Nondestructive testing, Metallography, Electrical and Electronic Engineering, Composite material, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::80d0c2c3ff8b6b8db2f35695a0e3a483
https://doi.org/10.1016/j.physc.2010.05.155

المؤلفون: K. ISAWA, Y. YAEGASHI, S. OGOTA, M. NAGANO, S. SUDO, K. YAMADA, H. YAMAUCHI

Relation: http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100415340; oai:t2r2.star.titech.ac.jp:00017070

الاتاحة: http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100415340

المؤلفون: M. Kamei, Y. Aoki, S. Ogota, Tadataka Morishita, T. Usui

المصدر: IEEE Transactions on Applied Superconductivity. 3:1598-1600

مصطلحات موضوعية: X-ray spectroscopy, Auger electron spectroscopy, Materials science, Reflection high-energy electron diffraction, Auger effect, Analytical chemistry, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, symbols.namesake, Lattice constant, Electron diffraction, symbols, Electrical and Electronic Engineering, Thin film, Spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e0720b387cb02227c14bbcce46ce72c
https://doi.org/10.1109/77.233898

المؤلفون: T. Morishita, S. Ogota, S. S. Rao

المصدر: Advances in Superconductivity IX ISBN: 9784431684756
Advances in Superconductivity IX

مصطلحات موضوعية: Surface (mathematics), Optics, Diffuse scattering, Materials science, business.industry, X-ray, business, Incidence (geometry)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c85fd0fac86078fc1e861f59a171d3b4
https://doi.org/10.1007/978-4-431-68473-2_102

المؤلفون: Y. Kanke, Z. Liu, N. Futaki, Tadataka Morishita, S. Ogota

المصدر: MRS Proceedings. 401

مصطلحات موضوعية: Total internal reflection, Carbon film, Reflection high-energy electron diffraction, Materials science, Reflection (mathematics), Condensed matter physics, Electron diffraction, Thin film, Spectroscopy, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::662f9390dd080df1e2796538809b7205
https://doi.org/10.1557/proc-401-399

المؤلفون: T. Morishita, S. Ogota, N. Futaki

المصدر: Advances in Superconductivity VI ISBN: 9784431682684

مصطلحات موضوعية: Materials science, Reflection (mathematics), Lattice constant, Reflection high-energy electron diffraction, Electron diffraction, Condensed matter physics, Cathode ray, Incident beam, Substrate (electronics), Thin film

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8418fb55014063fc155a98a0b5efb8fc
https://doi.org/10.1007/978-4-431-68266-0_229

المؤلفون: K. Isawa, M. Nagano, S. Ogota, S. Sudo, Y. Yaegashi, 井澤 和幸, 八重樫 祐司, 大子田 誠也, 永野 貢, 須藤 皓

المصدر: Meeting Abstracts of the Physical Society of Japan. 1997, :619