المؤلفون: Orlowski, Bronislaw A., Guziewicz, E., Kowalski, B.J., Story, T., Mickevičius, Sigitas, Sipatov, A.Y., Chernyshova, M., Demchenko, I., Barrett, N., Taniguchi, M, Kimura, A., Sato, H., Sebenne, C.A., Lacharm, J.P, Drube, W.

المصدر: XXXI International school on the physics of semiconducting compounds : Jaszowiec 2002, Warsaw, 2002, p. 131

Relation: http://vu.lvb.lt/VU:ELABAPDB5134686&prefLang=en_US

الاتاحة: http://vu.lvb.lt/VU:ELABAPDB5134686&prefLang=en_US

المؤلفون: Orlowski, Bronislaw A., Guziewicz, E., Kowalski, B.J., Story, T., Mickevičius, Sigitas, Sipatov, A.Y., Chernyshova, M., Demchenko, I., Barrett, N., Taniguchi, M., Kimura, A., Sato, H., Sebenne, C.A., Lacharm, J.P., Medicherla, R., Drube, W.

المصدر: Synchrotron radiation in natural science, 2002, Vol. 1, no. 1, p. 52-53 ; ISSN 1644-7190

Relation: http://lmavb.lvb.lt/LMAVB:ELABAPDB5219370&prefLang=en_US

الاتاحة: http://lmavb.lvb.lt/LMAVB:ELABAPDB5219370&prefLang=en_US

المؤلفون: Orlowski, Bronislaw A., Guziewicz, E., Kowalski, B.J., Story, T., Mickevičius, Sigitas, Sipatov, A.Y., Chernyshova, M., Demchenko, I., Barrett, N., Taniguchi, M., Kimura, A., Sato, H., Sebenne, C.A., Lacharm, J.P, Medicherla, R., Drube, W.

المصدر: Journal of alloys and compounds, 2004, Vol.362, Iss.1-2, p. 198-201 ; ISSN 0925-8388

مصطلحات موضوعية: Layered magnetic-structures, Spectroscopy, Shifts, Pbs

Relation: http://lmavb.lvb.lt/LMAVB:ELABAPDB5331913&prefLang=en_US

الاتاحة: http://lmavb.lvb.lt/LMAVB:ELABAPDB5331913&prefLang=en_US

المؤلفون: del Pennino, U., Mariani, Carlo, Amoddeo, A., Proix, F., Sébenne, C.A.

المصدر: Hydrogen in Semiconductors ; page 487-491 ; ISBN 9780444891389

الاتاحة: http://dx.doi.org/10.1016/b978-0-444-89138-9.50065-6
https://api.elsevier.com/content/article/PII:B9780444891389500656?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:B9780444891389500656?httpAccept=text/plain

المؤلفون: Akremi, A., Lacharme, J.P., Sébenne, C.A.

المصدر: Hydrogen in Semiconductors ; page 503-506 ; ISBN 9780444891389

الاتاحة: http://dx.doi.org/10.1016/b978-0-444-89138-9.50068-1
https://api.elsevier.com/content/article/PII:B9780444891389500681?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:B9780444891389500681?httpAccept=text/plain

المؤلفون: Zerrouki, M, Lacharme, J.P, Ghamnia, M, Sébenne, C.A, Abidri, B

المصدر: Applied Surface Science ; volume 181, issue 1-2, page 160-165 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/s0169-4332(01)00376-2
https://api.elsevier.com/content/article/PII:S0169433201003762?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0169433201003762?httpAccept=text/plain

المؤلفون: Amimer, K, Eddrief, M, Sébenne, C.A

المصدر: Journal of Crystal Growth ; volume 217, issue 4, page 371-377 ; ISSN 0022-0248

الاتاحة: http://dx.doi.org/10.1016/s0022-0248(00)00533-9
https://api.elsevier.com/content/article/PII:S0022024800005339?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0022024800005339?httpAccept=text/plain

المؤلفون: Proix, F., Panella, V., El Monkad, S., Glebov, A., Lacharme, J.P., Eddrief, M., Amimer, K., Sébenne, C.A., Toennies, J.P.

المصدر: The European Physical Journal B ; volume 5, issue 4-6, page 919-926 ; ISSN 1434-6028

الاتاحة: http://dx.doi.org/10.1007/s100510050518
http://link.springer.com/content/pdf/10.1007/s100510050518.pdf
http://link.springer.com/article/10.1007/s100510050518/fulltext.html
http://link.springer.com/content/pdf/10.1007/s100510050518

المؤلفون: Zaı̈bi, M.-A, Lacharme, J.-P, Sébenne, C.A

المصدر: Surface Science ; volume 402-404, page 206-210 ; ISSN 0039-6028

الاتاحة: http://dx.doi.org/10.1016/s0039-6028(97)01015-7
https://api.elsevier.com/content/article/PII:S0039602897010157?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0039602897010157?httpAccept=text/plain

المؤلفون: Akremi, A, Lacharme, J.-P, Sébenne, C.A

المصدر: Surface Science ; volume 402-404, page 746-750 ; ISSN 0039-6028

الاتاحة: http://dx.doi.org/10.1016/s0039-6028(97)01016-9
https://api.elsevier.com/content/article/PII:S0039602897010169?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0039602897010169?httpAccept=text/plain

المؤلفون: Mercier, V., Sébenne, C.A., Chen, P., Bolmont, D., Proix, F.

المصدر: ISSN: 0302-0738.

مصطلحات موضوعية: adsorption, Auger effect, electronic density of states, Fermi level, gallium arsenide, gold, III V semiconductors, low energy electron diffraction, photoelectron spectra, surface electron states, surface structure, [PHYS.HIST]Physics [physics]/Physics archives

Relation: jpa-00210027; https://hal.science/jpa-00210027; https://hal.science/jpa-00210027/document; https://hal.science/jpa-00210027/file/ajp-jphys_1985_46_5_839_0.pdf

الاتاحة: https://hal.science/jpa-00210027
https://hal.science/jpa-00210027/document
https://hal.science/jpa-00210027/file/ajp-jphys_1985_46_5_839_0.pdf
https://doi.org/10.1051/jphys:01985004605083900

المؤلفون: Orlowski, B.A., Kowalski, B.J., Barrett, N., Martinotti, D., Guillot, C., Lacharme, J.-P., Sébenne, C.A.

المصدر: Applied Surface Science ; volume 104-105, page 282-285 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/s0169-4332(96)00158-4
https://api.elsevier.com/content/article/PII:S0169433296001584?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0169433296001584?httpAccept=text/plain

المؤلفون: Reqqass, H., Lacharme, J.-P., Sébenne, C.A., Eddrief, M., Le Thanh, V.

المصدر: Applied Surface Science ; volume 92, page 357-361 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/0169-4332(95)00255-3
https://api.elsevier.com/content/article/PII:0169433295002553?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:0169433295002553?httpAccept=text/plain

المؤلفون: Safta, N., Lacharme, J.-P., Sébenne, C.A.

المصدر: Surface Science Letters ; volume 287-288, page A385 ; ISSN 0167-2584

الاتاحة: http://dx.doi.org/10.1016/0167-2584(93)90442-l
https://api.elsevier.com/content/article/PII:016725849390442L?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:016725849390442L?httpAccept=text/plain

المؤلفون: Bischoff, J.L., Kubler, L., Bolmont, D., Sébenne, C.A., Lacharme, J.-P., Bonnet, J.E., Hricovini, K.

المصدر: Surface Science ; volume 293, issue 1-2, page 35-40 ; ISSN 0039-6028

الاتاحة: http://dx.doi.org/10.1016/0039-6028(93)90240-k
https://api.elsevier.com/content/article/PII:003960289390240K?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:003960289390240K?httpAccept=text/plain

المؤلفون: Bischoff, J.L., Kubler, L., Bolmont, D., Sébenne, C.A., Lacharme, J.-P., Bonnet, J.E., Hricovini, K.

المصدر: Surface Science Letters ; volume 293, issue 1-2, page A630 ; ISSN 0167-2584

الاتاحة: http://dx.doi.org/10.1016/0167-2584(93)90262-h
https://api.elsevier.com/content/article/PII:016725849390262H?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:016725849390262H?httpAccept=text/plain

المؤلفون: Orlowski, B.A., Lacharme, J.P., Sébenne, C.A.

المصدر: Applied Surface Science ; volume 56-58, page 224-227 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/0169-4332(92)90238-s
https://api.elsevier.com/content/article/PII:016943329290238S?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:016943329290238S?httpAccept=text/plain

المؤلفون: Chérif, S.M., Lacharme, J.-P., Sébenne, C.A.

المصدر: Surface Science ; volume 262, issue 1-2, page 33-41 ; ISSN 0039-6028

الاتاحة: http://dx.doi.org/10.1016/0039-6028(92)90457-h
https://api.elsevier.com/content/article/PII:003960289290457H?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:003960289290457H?httpAccept=text/plain

المؤلفون: Chérif, S.M., Lacharme, J.-P., Sébenne, C.A.

المصدر: Applied Surface Science ; volume 56-58, page 777-781 ; ISSN 0169-4332

الاتاحة: http://dx.doi.org/10.1016/0169-4332(92)90337-w
https://api.elsevier.com/content/article/PII:016943329290337W?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:016943329290337W?httpAccept=text/plain

المؤلفون: Chérif, S.M., Lacharme, J.-P., Sébenne, C.A.

المصدر: Surface Science ; volume 274, issue 2, page 257-262 ; ISSN 0039-6028

الاتاحة: http://dx.doi.org/10.1016/0039-6028(92)90529-f
https://api.elsevier.com/content/article/PII:003960289290529F?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:003960289290529F?httpAccept=text/plain