المؤلفون: Roblin, Patrick, Hernandez, Apolinar Reynoso, Marchetti, Mauro, Stelson, Angela, Rumiantsev, Andrej

المصدر: IEEE Microwave Magazine; December 2024, Vol. 25 Issue: 12 p33-36, 4p

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 233-238 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-31

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 199-212 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-23

المؤلفون: Heuermann, Holger, Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 234-238 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-32

المؤلفون: Rumiantsev, Andrej, Doerner, Ralf, Sakalas, Paulius

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 214-218 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-27

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 119-129 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-10

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 109-117 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-9

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 213-231 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-26

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 193-198 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-21

المؤلفون: Rumiantsev, Andrej

المصدر: ISBN 9781003338994.

الاتاحة: http://dx.doi.org/10.1201/9781003338994

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 163-180 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-14

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 181-191 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-18

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 51-67 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-5

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 97-107 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-8

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 69-87 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-6

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 147-161 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-13

المؤلفون: Rumiantsev, Andrej, Corson, Phillip L., Sweeney, Susan L., Arz, Uwe

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 182-188 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-19

المؤلفون: Rumiantsev, Andrej, Doerner, Ralf

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 219-223 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-28

المؤلفون: Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 131-134 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-11

المؤلفون: Doerner, Ralf, Rumiantsev, Andrej

المصدر: On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond ; page 164-169 ; ISBN 9781003338994

الاتاحة: http://dx.doi.org/10.1201/9781003338994-15