المؤلفون: F. Perisse A, P. Venet B, G. Rojat B

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://hal.archives-ouvertes.fr/docs/00/14/05/48/PDF/Preprint_Microelectronics_Reliability_Journal_2004.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.371.8265; http://hal.archives-ouvertes.fr/docs/00/14/05/48/PDF/Preprint_Microelectronics_Reliability_Journal_2004.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.371.8265
http://hal.archives-ouvertes.fr/docs/00/14/05/48/PDF/Preprint_Microelectronics_Reliability_Journal_2004.pdf

المؤلفون: Pinatel, C, Vuye, S, Riet, M., Dubon-Chevalier, C, Rojat, B, Lermoyer, A

المصدر: 25th European Microwave Conference, 1995

الاتاحة: http://dx.doi.org/10.1109/euma.1995.336909
http://xplorestaging.ieee.org/ielx5/4137114/4137115/04137121.pdf?arnumber=4137121