المؤلفون: Robinson, John C., Vaglio Pret, Alessandro

المساهمون: Hua, Hong, Argaman, Naamah, Nikolov, Daniel K.

المصدر: Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V

الاتاحة: http://dx.doi.org/10.1117/12.2691004

المؤلفون: Argaman, Naamah, Hua, Hong, Nikolov, Daniel K., Robinson, John C., Vaglio Pret, Alessandro

المصدر: Proceedings of SPIE; March 2024, Vol. 12913 Issue: 1 p129130T-129130T-6, 1162177p

المؤلفون: He, Chen, Grosch, Paul, Anilturk, Onder, Witowski, Joyce, Ford, Carl, Kalyan, Rahul, Robinson, John C., Price, David W., Rathert, Jay, Saville, Barry, Lee, Dave

المصدر: 2022 IEEE International Test Conference (ITC)

الاتاحة: http://dx.doi.org/10.1109/itc50671.2022.00050
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983911.pdf?arnumber=9983911

المؤلفون: Robinson, John C., Brunner, Tim, Lorusso, Gian

المصدر: Journal of Micro/Nanolithography, MEMS, and MOEMS ; volume 17, issue 04, page 1 ; ISSN 1932-5150

الاتاحة: http://dx.doi.org/10.1117/1.jmm.17.4.041000
https://www.spiedigitallibrary.org/journalArticle/Download?urlId=10.1117%2F1.JMM.17.4.041000

المؤلفون: Messinis, C., van Schaijk, T. T. M., Pandey, N., Tenner, V. T., Koolen, A., Witte, S., de Boer, J. F., den Boef, A. J., Robinson, John C., Sendelbach, Matthew J.

المساهمون: Atoms, Molecules, Lasers, ARCNL, Amsterdam Neuroscience - Brain Imaging, LaserLaB - Biophotonics and Microscopy, LaserLaB - Physics of Light, Physics and Astronomy, Robinson, John C., Sendelbach, Matthew J., Amsterdam Neuroscience - Systems & Network Neuroscience, VU University medical center

المصدر: Metrology, Inspection, and Process Control XXXVI, 90-100
STARTPAGE=90;ENDPAGE=100;TITLE=Metrology, Inspection, and Process Control XXXVI
Messinis, C, Van Schaijk, T T M, Pandey, N, Tenner, V T, Koolen, A, Witte, S, De Boer, J F & Den Boef, A J 2022, Fast and Robust Overlay Metrology from Visible to Infrared Wavelengths Using Dark-field Digital Holographic Microscopy . in J C Robinson & M J Sendelbach (eds), Metrology, Inspection, and Process Control XXXVI ., 120530B, Proceedings of SPIE-The International Society for Optical Engineering, vol. 12053, SPIE, pp. 90-100, Metrology, Inspection, and Process Control XXXVI 2022, Virtual, Online, 23/05/22 . https://doi.org/10.1117/12.2604201
Metrology, Inspection, and Process Control XXXVI, 12053
Messinis, C, van Schaijk, T T M, Pandey, N, Tenner, V T, Koolen, A, Witte, S, de Boer, J F & den Boef, A J 2022, Fast and Robust Overlay Metrology from Visible to Infrared Wavelengths Using Dark-field Digital Holographic Microscopy . in J C Robinson & M J Sendelbach (eds), Metrology, Inspection, and Process Control XXXVI . vol. 12053, 120530B, Proceedings of SPIE-The International Society for Optical Engineering, vol. 12053, SPIE, Metrology, Inspection, and Process Control XXXVI 2022, Virtual, Online, 23/05/2022 . https://doi.org/10.1117/12.2604201

مصطلحات موضوعية: Digital holographic microscopy, semiconductor manufacturing, SDG 7 - Affordable and Clean Energy, dark-field imaging, overlay metrology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a05508789b5f75f56e9a433359de8e64
https://research.vu.nl/en/publications/d32a4193-303c-49fa-9f01-0cb406dfb39a

المؤلفون: Adan, Ofer, Robinson, John C.

المساهمون: Adan, Ofer, Robinson, John C.

المصدر: Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV

الاتاحة: http://dx.doi.org/10.1117/12.2592866

المؤلفون: Robinson, John C.

المصدر: Journal of Religion, Spirituality & Aging ; volume 30, issue 2, page 100-111 ; ISSN 1552-8030 1552-8049

الاتاحة: http://dx.doi.org/10.1080/15528030.2016.1265476
https://www.tandfonline.com/doi/pdf/10.1080/15528030.2016.1265476

المؤلفون: Robinson, John C., Barnett, Bobby

المصدر: SID Symposium Digest of Technical Papers ; volume 53, issue S1, page 125-128 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1002/sdtp.15869
https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.15869

المؤلفون: Robinson, John C.

المصدر: SID Symposium Digest of Technical Papers ; volume 53, issue 1, page 481-484 ; ISSN 0097-966X 2168-0159

الاتاحة: http://dx.doi.org/10.1002/sdtp.15527
https://onlinelibrary.wiley.com/doi/pdf/10.1002/sdtp.15527

المؤلفون: Robinson, John C., Sherman, Kara, Price, David W., Rathert, Jay

المساهمون: Adan, Ofer, Robinson, John C.

المصدر: Metrology, Inspection, and Process Control for Microlithography XXXIV

الاتاحة: http://dx.doi.org/10.1117/12.2551539

المؤلفون: Hoogesteger, Marinus, Mukherjee, Dipankar, Nijmeijer, Henk, Sadeghian, Hamed, Robinson, John C., Sendelbach, Matthew J.

المساهمون: Group Lopez Arteaga, Dynamics and Control, ICMS Core, EAISI Foundational, EAISI Mobility, EAISI High Tech Systems, EAISI Health

المصدر: Metrology, Inspection, and Process Control XXXVI

مصطلحات موضوعية: Scanning Probe Microscopy, Subsurface, Nanosheet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ce3cb49bd566e3763d45329af30de098
https://research.tue.nl/en/publications/5a8af9a7-ef6f-43e0-8367-6078ee527995

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Yeh, June, Chouaib, Houssam

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124962R-124962R-9, 1124668p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Kim, Hyunsok, Ju, Jaewuk, Jeong, Ikhyun, Hong, Baikkyu, Nam, Sunouk, Lee, Changkyu, Lee, Kangmin, Jang, Sumin, Lee, Jaeyoun, Yang, Hongcheon, Jeong, Minho, Kim, Mingyu, Su, Hongpeng, Zhou, Wayne, Oh, Nanglyeom, Choi, Dongsub, Yaziv, Tal, Spielberg, Hedvi, Bachar, Ohad, Milo, Renan, Dirawi, Rawi

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124962E-124962E-9, 1124668p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Oh, Juntaek, Son, Jaehyeon, Hwang, Eunsoo, Ahn, Jinwoo, Lee, Jaewon, Oh, Byungkwan, Lee, Donggun, Lim, Seunga, Kang, Kihun, Im, Sangil, Jeong, Jibin, Yun, Taehyun, Lee, Jinsoo, Yoon, Changhyeong, Cho, Hyukjoon, Kim, Gangbu, Kang, Byeongki, Moon, Hankyoul, Hwang, Jong-hyun, Park, Youngkyu, Kim, Taejoong, Lee, Suyoung, Yang, Yusin, Lee, Myungjun

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124962X-124962X-7, 1124666p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., McBennett, Brendan, Beardo, Albert, Nelson, Emma E., Li, Baowen, Kaptyen, Henry C., Murnane, Margaret M., Knobloch, Joshua L.

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963P-124963P-4, 1124672p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Jung, Woosung, Cho, Jong-Hoi, Lim, SungHun, Lee, TaeSeop, Choi, DaeYoung, Seo, Jong-Hyun, Lee, SeungHyun, Lee, JunKyoung, Kim, You Jin, Yeo, Jeong Ho, Brikker, Alex, Meir, Roi, Alkoken, Ran, Han, Kyeongju, Lim, Sujin, Choi, KyungJae, Kwak, Chanhee, Shin, Hyeon Sang

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963E-124963E-13, 12371351p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Kim, Hyunsok, Jeong, Ikhyun, Hong, Baikkyu, Ham, Sejung, Kim, Dongsu, Lim, Dongsuk, Lee, Kangmin, Lee, Jeongpyo, Jung, Minho, Oh, Nanglyeom, Choi, Dongsub, Spielberg, Hedvi, Bachar, Ohad

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963O-124963O-7, 1124675p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Grauer, Yoav, Eisenbach, Shlomo, Penia, Motti, Elka, Dror, Simkin, Arkady, Safrani, Avner, Megged, Efi

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963D-124963D-17, 12371355p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Song, Gilwoo, Kang, Dooho, Kim, Sungchai, Park, Sungwon, Jo, Taeyong, Kum, Euiseok, Lee, Jonghyun, Park, Dooho, Kim, Dongmin, Uh, Sungwoon, Kim, Jaehyung

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963N-124963N-6, 1124674p

المؤلفون: Robinson, John C., Sendelbach, Matthew J., Ridane, Mohamed, Chen, Ivy, Song, Jaden, Nikolsky, Peter, Chen, Kuan-Ming, Lee, Shinyeong, Park, Sean, Lin, Kolos, Su, Yu-Chi, Cho, Kyoyeon, Yu, Ethan, Park, James, Elmalk, Abdalmohsen, Hsieh, Chih-Hung, Serebryakov, Alexander, Zhang, Lei, Jee, Taekwon, You, Joonsang, Lee, Hong-Goo, Park, Jongmin, Kim, Jungchan, Kim, Sang-Woo, Hong, Seungmo, Seo, Jaewook

المصدر: Proceedings of SPIE; April 2023, Vol. 12496 Issue: 1 p124963C-124963C-7, 1124675p