المؤلفون: Chakraborty, S., Tien, K., Frolov, D., Frank, D., Rosno, P., Yeck, M., Bulzacchelli, J., Baks, C., Richetta, R., Schmerbeck, T., Underwood, D., Glick, J., Robertazzi, R., Carter, A., Snell, B., Ramirez, D., Inoue, K., Wisnieff, D., Moertl, D., Betke, J., Lekuch, S., Timmerwilke, J., Joshi, R., Davies, A., Song, P., Gaucher, B., Friedman, D.

المصدر: 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) ; page 153-156

الاتاحة: http://dx.doi.org/10.1109/esserc62670.2024.10719526
http://xplorestaging.ieee.org/ielx8/10719398/10719399/10719526.pdf?arnumber=10719526

المؤلفون: Robertazzi, R., Frank, D., Tien, K., Timmerwilke, J., Song, Peilin, Friedman, Daniel

المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS)

الاتاحة: http://dx.doi.org/10.1109/vts60656.2024.10538856
http://xplorestaging.ieee.org/ielx7/10538470/10538498/10538856.pdf?arnumber=10538856

المؤلفون: Jackman, J., Chatzicharalampous, C., Saketos, M., Stelling, J., Sung, L., Robertazzi, R., Bray, M.

المصدر: Fertility and Sterility ; volume 110, issue 4, page e121 ; ISSN 0015-0282

الاتاحة: http://dx.doi.org/10.1016/j.fertnstert.2018.07.364
https://api.elsevier.com/content/article/PII:S0015028218309567?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0015028218309567?httpAccept=text/plain

المؤلفون: Worledge, D. C., Hu, G., Abraham, David W., Sun, J. Z., Trouilloud, P. L., Nowak, J., Brown, S., Gaidis, M. C., O'Sullivan, E. J., Robertazzi, R. P.

المصدر: Applied Physics Letters ; volume 108, issue 13 ; ISSN 0003-6951 1077-3118

الاتاحة: https://doi.org/10.1063/1.4945255
https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4945255/14478665/139901_1_online.pdf

المؤلفون: Nowak, J. J., Robertazzi, R. P., Sun, J. Z., Hu, G., Abraham, David W., Trouilloud, P. L., Brown, S., Gaidis, M. C., O'Sullivan, E. J., Gallagher, W. J., Worledge, D. C.

المصدر: IEEE Magnetics Letters ; volume 2, page 3000204-3000204 ; ISSN 1949-307X 1949-3088

الاتاحة: http://dx.doi.org/10.1109/lmag.2011.2155625
http://xplorestaging.ieee.org/ielx5/5165412/5703216/05875962.pdf?arnumber=5875962

المؤلفون: Hu, G., Kim, D., Kim, J., Kothandaraman, C., Lauer, G., Lee, H K, Marchack, N., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Nowak, J. J., Trouilloud, P. L., Woo, S., Worledge, D. C., Gottwald, M. G., Brown, S. L., Doris, B., D'Emic, C. P., Hashemi, P., Houssameddine, D., He, Q.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm19573.2019.8993604
http://xplorestaging.ieee.org/ielx7/8971803/8993428/08993604.pdf?arnumber=8993604

المؤلفون: Hu, G., Nowak, J. J., Lauer, G., Lee, J. H., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Marchack, N., Murthy, S., Kothandaraman, C., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/vlsi-tsa.2017.7942445
http://xplorestaging.ieee.org/ielx7/7937567/7942432/07942445.pdf?arnumber=7942445

المؤلفون: Hu, G., Gottwald, M. G., He, Q., Park, J. H., Lauer, G., Nowak, J. J., Brown, S. L., Doris, B., Edelstein, D., Evarts, E. R., Hashemi, P., Khan, B., Kim, Y. H., Kothandaraman, C., Marchack, N., O'Sullivan, E. J., Reuter, M., Robertazzi, R. P., Sun, J. Z., Suwannasiri, T., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm.2017.8268515
http://xplorestaging.ieee.org/ielx7/8255107/8268301/08268515.pdf?arnumber=8268515

المؤلفون: Pesenson, L, Robertazzi, R. P, Buhrman, R. A, Cypher, S. R, Hunt, B. D

المصدر: Physical Review Letters. 67

مصطلحات موضوعية: Electronics And Electrical Engineering

URL الوصول: https://ntrs.nasa.gov/citations/19920031061

المؤلفون: Worledge, D. C., Trouilloud, P. L., Gaidis, M. C., Lu, Y., Abraham, D. W., Assefa, S., Brown, S., Galligan, E., Kanakasabapathy, S., Nowak, J., O’Sullivan, E., Robertazzi, R., Wright, G., Gallagher, W. J.

المصدر: Journal of Applied Physics; 10/1/2006, Vol. 100 Issue 7, p074506, 6p, 7 Graphs

مصطلحات موضوعية: RANDOM access memory, COMPUTER storage devices, PROPERTIES of matter, ANISOTROPY, CRYSTALLOGRAPHY

المؤلفون: Worledge, D., Annunziata, A. J., Brown, S., Chen, W., Harms, J., Hu, G., Kim, Y., Kothandaraman, C., Lauer, G., Lee, J., Liu, L., Murthy, S., Nowak, J., O'Sullivan, E., Park, J., Robertazzi, R., Sun, J. Z., Trouilloud, P.

المصدر: 2015 IEEE Magnetics Conference (INTERMAG) ; page 1-1

الاتاحة: http://dx.doi.org/10.1109/intmag.2015.7157006
http://xplorestaging.ieee.org/ielx7/7128764/7156490/07157006.pdf?arnumber=7157006

المؤلفون: Hu, G., Lee, J. H., Nowak, J. J., Sun, J. Z., Harms, J., Annunziata, A., Brown, S., Chen, W., Kim, Y. H., Lauer, G., Liu, L., Marchack, N., Murthy, S., O'Sullivan, E. J., Park, J. H., Reuter, M., Robertazzi, R. P., Trouilloud, P. L., Zhu, Y., Worledge, D. C.

المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) ; page 26.3.1-26.3.4

الاتاحة: http://dx.doi.org/10.1109/iedm.2015.7409772
http://xplorestaging.ieee.org/ielx7/7402013/7409598/07409772.pdf?arnumber=7409772

المؤلفون: Worledge, D. C., Gajek, M., Abraham, D. W., Brown, S., Gaidis, M. C., Hu, G., Nowak, J., O'Sullivan, E. J., Robertazzi, R. P., Sun, J. Z., Trouilloud, P. L., Gallagher, W. J.

المصدر: 2012 4th IEEE International Memory Workshop ; page 1-3

الاتاحة: http://dx.doi.org/10.1109/imw.2012.6213652
http://xplorestaging.ieee.org/ielx5/6213613/6213616/06213652.pdf?arnumber=6213652

المؤلفون: Sun, J. Z., Robertazzi, R. P., Nowak, J. J., Trouilloud, P. L., Hu, G., Gaidis, M. C., Brown, S. L., Abraham, D. W., O'Sullivan, E. J., Gallagher, W. J., Worledge, D. C., Kent, A. D.

المصدر: 69th Device Research Conference ; page 171-174

الاتاحة: http://dx.doi.org/10.1109/drc.2011.5994475
http://xplorestaging.ieee.org/ielx5/5981430/5994397/05994475.pdf?arnumber=5994475

المؤلفون: Worledge, D. C., Hu, G., Trouilloud, P. L., Abraham, D. W., Brown, S., Gaidis, M. C., Nowak, J., O'Sullivan, E. J., Robertazzi, R. P., Sun, J. Z., Gallagher, W. J.

المصدر: 2010 International Electron Devices Meeting ; page 12.5.1-12.5.4

الاتاحة: http://dx.doi.org/10.1109/iedm.2010.5703349
http://xplorestaging.ieee.org/ielx5/5692854/5703218/05703349.pdf?arnumber=5703349

المؤلفون: PAGANO S, FRUNZIO L., CRISTIANO R., MUKHANOV O., KIRICHENKO A., ROBERTAZZI R., MEZZETTI, Enrica, GOZZELINO, LAURA, GERBALDO, Roberto

المساهمون: Pagano, S, Frunzio, L., Cristiano, R., Mukhanov, O., Kirichenko, A., Robertazzi, R., Mezzetti, Enrica, Gozzelino, Laura, Gerbaldo, Roberto

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000071955200133; ispartofbook:APPLIED SUPERCONDUCTIVITY 1997; 3rd European Conference on Applied Superconductivity (EUCAS 1997); volume:158; firstpage:539; lastpage:542; numberofpages:4; journal:INSTITUTE OF PHYSICS CONFERENCE SERIES; http://hdl.handle.net/11583/1401510

الاتاحة: http://hdl.handle.net/11583/1401510

المؤلفون: Lu, Pong-Fei, Cao, Nianzheng, Sigal, Leon, Woltgens, Pieter, Robertazzi, R., Heidel, D.

المصدر: ISLPED'06 Proceedings of the 2006 International Symposium on Low Power Electronics and Design ; page 85-88

الاتاحة: http://dx.doi.org/10.1109/lpe.2006.4271812

المؤلفون: Pong-Fei Lu, Sigal, L., Cao, N., Woltgens, P., Robertazzi, R., Heidel, D.

المصدر: 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) ; page 165-167

الاتاحة: http://dx.doi.org/10.1109/soi.2004.1391601
http://xplorestaging.ieee.org/ielx5/9580/30296/01391601.pdf?arnumber=1391601

المؤلفون: Bette, A., DeBrosse, J., Gogl, D., Hoenigschmid, H., Robertazzi, R., Arndt, C., Braun, D., Casarotto, D., Havreluk, R., Lammers, S., Obermaier, W., Reohr, W., Viehmann, H., Gallagher, W.J., Muller, G.

المصدر: 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) ; page 217-220

الاتاحة: http://dx.doi.org/10.1109/vlsic.2003.1221207
http://xplorestaging.ieee.org/ielx5/8656/27435/01221207.pdf?arnumber=1221207

المؤلفون: Yi-hua Tang, Hunt, R.T., Robertazzi, R., Fisher, M., Coughlin, J., Patt, R., Trac, E.

المصدر: Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements ; page SUPL11-SUPL12

الاتاحة: http://dx.doi.org/10.1109/cpem.1996.547397
http://xplorestaging.ieee.org/ielx3/3924/11362/00547397.pdf?arnumber=547397