المؤلفون: Xu, Q., Sharp, I.D., Yuan, C.W., Yi, D.O., Liao, C.Y., Glaeser, A.M., Minor, A.M., Beeman, J.W., Ridgway, M.C., Kluth, P., Ager III, J.W., Chrzan, D.C., Haller, E.E.

مصطلحات موضوعية: Materials science

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/5sj0d3x0

المؤلفون: Xu, Q., Sharp, I.D., Yuan, C.W., Yi, D.O., Liao, C.Y., Glaeser, A.M., Minor, A.M., Beeman, J.W., Ridgway, M.C., Kluth, P., Ager III, J.W., Chrzan, D.C., Haller, E.E.

مصطلحات موضوعية: Materials science

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/4fs5c916

المؤلفون: Yu, K.M., Walukiewicz, W., Wu, J., Mars, D.E., Scarpulla, M.A., Dubon, O.D., Ridgway, M.C., Geisz, J.F.

مصطلحات موضوعية: Materials science

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/6rz4k6jz

المؤلفون: Yu, K.M., Walukiewicz, W., Wu, J., Shan, W., Beeman, J.W., Scarpulla, M.A., Dubon, O.D., Ridgway, M.C., Mars, D.E., Chamberlin, D.R.

المصدر: Applied Physics Letters. 83(14)

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/3jv0c0h2

المؤلفون: Scarpulla, M.A., Dubon, O.D., Yu, K.M., Monteiro, O., Pillai, M.R., Aziz, M.J., Ridgway, M.C.

المصدر: Applied Physics Letters. 82(8)

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/8vq686dw

المؤلفون: Mirzaei, Sahar, Kremer, Felipe, Sprouster, David J., Araújo, Leandro Langie, Feng, Ruixing, Glover, C. J., Ridgway, M.C.

مصطلحات موضوعية: Nanopartículas, Espectroscopia de absorção de raios-x, Implantacao ionica, Germânio

وصف الملف: application/pdf

Relation: Journal of applied physics. New York. Vol. 118, no. 15 (Oct. 2015), 154309, 6 p.; http://hdl.handle.net/10183/164867; 000985715

الاتاحة: http://hdl.handle.net/10183/164867

المؤلفون: Kluth, Patrick, Sullivan, James P., Li, Weixing, Weed, Ryan, Schnohr, Claudia S., Giulian, Raquel, Araújo, Leandro Langie, Lei, Wen, Rodriguez, M. D., Afra, Boshra, Bierschenk, Thomas, Ewing, Rodney C., Ridgway, M.C.

مصطلحات موضوعية: Materiais porosos, Bombardeamento de ions, Microscopia eletrônica de transmissão

وصف الملف: application/pdf

Relation: Applied physics letters. New York. Vol. 104, no. 2 (Jan. 2014), 023105, 4 p.; http://hdl.handle.net/10183/142507; 000985709

الاتاحة: http://hdl.handle.net/10183/142507

المؤلفون: Ridgway, M.C., Bierschenk, Thomas, Giulian, Raquel, Afra, Boshra, Rodriguez, M. D., Araújo, Leandro Langie, Byrne, A. P., Kirby, Nigel, Pakarinen, O. H., Djurabekova, F., Nordlund, K., Schleberger, M., Osmani, O., Medvedev, N., Rethfeld, B., Kluth, Patrick

مصطلحات موضوعية: Semicondutores amorfos, Semicondutores elementares, Solidificação, Efeitos de feixe iônico, Germânio

وصف الملف: application/pdf

Relation: Physical review letters. New York. Vol. 110, no. 24 (June 2013), 245502, 5 p.; http://hdl.handle.net/10183/101366; 000897306

الاتاحة: http://hdl.handle.net/10183/101366

المؤلفون: Bierschenk, Thomas, Giulian, Raquel, Afra, Boshra, Rodriguez, M. D., Schauries, Daniel, Mudie, Stephen, Pakarinen, O. H., Djurabekova, F., Nordlund, K., Osmani, O., Medvedev, N., Rethfeld, B., Ridgway, M.C., Kluth, Patrick

مصطلحات موضوعية: Dinâmica molecular, Efeitos de radiação, Microestrutura cristalina, Semicondutores amorfos, Semicondutores elementares, Silício

وصف الملف: application/pdf

Relation: Physical review. B, Condensed matter and materials physics. Woodbury. Vol. 88, no. 17 (Nov. 2013), 174111, 5 p.; http://hdl.handle.net/10183/104567; 000906992

الاتاحة: http://hdl.handle.net/10183/104567

المؤلفون: Decoster, S., Glover, C. J., Johannessen, B., Giulian, Raquel, Sprouster, David J., Kluth, Patrick, Araújo, Leandro Langie, Hussain, Zohair S., Schnohr, Claudia S., Salama, H., Kremer, Felipe, Temst, Kristiaan, Vantomme, A., Ridgway, M.C.

مصطلحات موضوعية: Thin film, Lift-off, Semiconductor, Dielectric, Filmes finos dieletricos, Filmes finos semicondutores, Semicondutores amorfos, Crescimento de semicondutores, Estrutura fina estendida de absorção de raios x (EXAFS), Arseneto de galio, Compostos de indio, Compostos de silício

وصف الملف: application/pdf

Relation: Journal of synchrotron radiation. Copenhagen. Vol. 20, no. 3 (May 2013), p. 426-432; http://hdl.handle.net/10183/94424; 000897160

الاتاحة: http://hdl.handle.net/10183/94424

المؤلفون: Khalil, A.S., Chadderton, L.T., Stewart, A.M., Llewellyn, D.J., Ridgway, M.C., Byrne, A.P.

المصدر: Microscopy and Microanalysis ; volume 19, issue S2, page 1994-1995 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927613011963
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927613011963

المؤلفون: Kluth, Patrick, Pakarinen, O. H., Djurabekova, F., Giulian, Raquel, Ridgway, M.C., Byrne, A. P., Nordlund, K.

مصطلحات موضوعية: Física da matéria condensada, Semicondutores amorfos, Efeitos de feixe iônico, Dinâmica molecular, Sincrotrons, Compostos de silício, Ouro

وصف الملف: application/pdf

Relation: Journal of applied physics. Vol. 110, no. 12 (Dec. 2011), 123520, 5 p.; http://hdl.handle.net/10183/206613; 000829563

الاتاحة: http://hdl.handle.net/10183/206613

المؤلفون: Ridgway, M.C., Giulian, Raquel, Sprouster, David J., Kluth, Patrick, Araújo, Leandro Langie, Llewellyn, D. J., Byrne, A. P., Kremer, Felipe, Fichtner, Paulo Fernando Papaleo, Rizza, G., Amekura, H., Toulemonde, M.

مصطلحات موضوعية: Engenharia, Efeitos de feixe iônico, Propriedades termodinâmicas, Implantacao ionica, Nanopartículas, Compostos de silício

وصف الملف: application/pdf

Relation: Physical review letters. Melville. Vol. 106, no. 9 (Mar. 2011), 095505, 4 p.; http://hdl.handle.net/10183/118163; 000835223

الاتاحة: http://hdl.handle.net/10183/118163

المؤلفون: Amekura, H., Ishikawa, N., Okubo, N., Ridgway, M.C., Giulian, R., Mitsuishi, K., Nakayama, Y., Buchal, Ch., Mantl, S., Kishimoto, N.

المصدر: Physical review / B 83(20), 205401 (2011). doi:10.1103/PhysRevB.83.205401

مصطلحات موضوعية: info:eu-repo/classification/ddc/530

جغرافية الموضوع: DE

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000290162600005; info:eu-repo/semantics/altIdentifier/hdl/2128/10930; info:eu-repo/semantics/altIdentifier/issn/1098-0121; https://juser.fz-juelich.de/record/15789; https://juser.fz-juelich.de/search?p=id:%22PreJuSER-15789%22

الاتاحة: https://juser.fz-juelich.de/record/15789
https://juser.fz-juelich.de/search?p=id:%22PreJuSER-15789%22

المؤلفون: Giulian, Raquel, Kremer, Felipe, Araújo, Leandro Langie, Sprouster, David J., Kluth, Patrick, Fichtner, Paulo Fernando Papaleo, Byrne, A. P., Ridgway, M.C.

مصطلحات موضوعية: Física da matéria condensada, Materiais nanoestruturados, Efeitos de feixe iônico, Microscopia eletrônica de transmissão, Tamanho de partícula

وصف الملف: application/pdf

Relation: Physical review. B, Condensed matter and materials physics. Woodbury. Vol. 82, no. 11 (Sep. 2010), 113410, 4 p.; http://hdl.handle.net/10183/104534; 000828951

الاتاحة: http://hdl.handle.net/10183/104534

المؤلفون: Dogra, Rakesh, Byrne, A.P., Ridgway, M.C.

المصدر: Journal of Electronic Materials ; volume 38, issue 5, page 623-634 ; ISSN 0361-5235 1543-186X

الاتاحة: http://dx.doi.org/10.1007/s11664-009-0658-x
https://link.springer.com/content/pdf/10.1007/s11664-009-0658-x.pdf
https://link.springer.com/article/10.1007/s11664-009-0658-x/fulltext.html
http://www.springerlink.com/index/pdf/10.1007/s11664-009-0658-x

المؤلفون: DOGRA, R., BRETT, D.A., BYRNE, A.P., MESTNIK FILHO, J., LI, Y., RIDGWAY, M.C.

مصطلحات موضوعية: coulomb field, doped materials, impurities, n-type conductors, palladium 100, palladium, perturbed angular correlation, point defects, probability, silicon, spectroscopy, stability

وصف الملف: p. 245-248

Relation: Physica B, Condensed Matter; http://repositorio.ipen.br/handle/123456789/7745; 376-377

الاتاحة: http://repositorio.ipen.br/handle/123456789/7745

المؤلفون: Kenthirapalan, S., Tran, P.N., Kooij, T.W., Ridgway, M.C., Rauch, M., Brown, S.H.J., Mitchell, T.W., Matuschewski, K., Maier, A.G.

المصدر: International Journal for Parasitology, 50, 6-7, pp. 511-522

مصطلحات موضوعية: Radboudumc 4: lnfectious Diseases and Global Health RIMLS: Radboud Institute for Molecular Life Sciences

Relation: https://hdl.handle.net/2066/220061; https://doi.org/10.1016/j.ijpara.2020.03.009

الاتاحة: https://hdl.handle.net/2066/220061
https://doi.org/10.1016/j.ijpara.2020.03.009

المؤلفون: BRETT, D.A., DOGRA, R., BYRNE, A.P., MESTNIK FILHO, J., RIDGWAY, M.C.

مصطلحات موضوعية: palladium, vacancies, probes, silicon, perturbed angular correlation, electric fields, deep level transient spectroscopy, electron spin resonance

وصف الملف: 193202-1 193202-4

Relation: Physical Review, B; http://repositorio.ipen.br/handle/123456789/7649; 72

الاتاحة: http://repositorio.ipen.br/handle/123456789/7649

المؤلفون: Khalil, A.S., Llewellyn, D.J., Ridgway, M.C., Stewart, A.M., Byrne, A.P., Chadderton, L.T.

المصدر: Microscopy and Microanalysis ; volume 10, issue S02, page 580-581 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927604887750
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927604887750