يعرض 1 - 20 نتائج من 42 نتيجة بحث عن '"Renz, Arne Benjamin"', وقت الاستعلام: 0.44s تنقيح النتائج
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    Dissertation/ Thesis
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    Academic Journal
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    Academic Journal

    المساهمون: RCUK | Engineering and Physical Sciences Research Council

    المصدر: Nature Materials ; volume 23, issue 1, page 95-100 ; ISSN 1476-1122 1476-4660

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    Conference

    وصف الملف: application/pdf

    Relation: https://wrap.warwick.ac.uk/184601/7/WRAP-design-optimization-3.3-kV-silicon-carbide-semi-superjunction-schottky-power-devices-2024.pdf; Melnyk, Kyrylo, Renz, Arne Benjamin, Cao, Qinze, Gammon, Peter M., Shah, Vishal, Lophitis, Neophytos , Rahimo, Munaf, Nistor, Iulian, Borghese, Alessandro, Maresca, Luca, Irace, Andrea and Antoniou, Marina (2024) Design and optimization of 3.3 kV silicon carbide semi-superjunction schottky power devices. In: The 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD), Bremen, Germany, 02 - 06 Jun 2024 (In Press)

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    Academic Journal

    المساهمون: Engineering and Physical Science Research Council, Innovate U.K. funded TRASiCA

    المصدر: IEEE Transactions on Electron Devices ; volume 69, issue 1, page 298-303 ; ISSN 0018-9383 1557-9646

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    Academic Journal

    المساهمون: Royal Society through AdvanSiC Project, European Union’s Horizon Europe Program through AdvanSiC Project

    المصدر: IEEE Transactions on Electron Devices ; volume 71, issue 9, page 5573-5580 ; ISSN 0018-9383 1557-9646

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    Academic Journal

    وصف الملف: application/pdf

    Relation: European Commission 720827; Applied physics letters; Vol. 118, issue 24 (June 2021), art. 242101; https://ddd.uab.cat/record/274138; urn:10.1063/5.0054433; urn:oai:ddd.uab.cat:274138; urn:scopus_id:85108010085; urn:articleid:10773118v118n24p242101; urn:icn2uab:6519370

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    Periodical

    المصدر: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 362 Issue: 1 p77-81, 5p

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    Periodical
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    Periodical

    المصدر: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 361 Issue: 1 p99-104, 6p

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    Periodical

    المصدر: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 360 Issue: 1 p177-182, 6p

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    Periodical

    المصدر: Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 358 Issue: 1 p97-102, 6p

  14. 14
    Conference

    وصف الملف: application/pdf

    Relation: https://wrap.warwick.ac.uk/id/eprint/187065/1/WRAP-robust-area-efficient-4H-SiC-1.2-3.3-kV-Floating-Field-Ring-%28FFR%29-Trench-FFR-termination-designs-analysis.pdf; Melnyk, Kyrylo, Gammon, Peter M., Renz, Arne Benjamin, Cao, Quize, Lophitis, Neophytos and Antoniou, Marina (2023) Robust and area efficient 4H-SiC 1.2 and 3.3 kV Floating Field Ring (FFR) and Trench-FFR termination designs and analysis. In: 2023 IEEE Energy Conversion Congress and Exposition (ECCE), Nashville, TN, USA, 29 Oct 2023 - 02 Nov 2023. Published in: 2023 IEEE Energy Conversion Congress and Exposition (ECCE) pp. 5342-5349. ISBN 9798350316445. doi:10.1109/ECCE53617.2023.10362098 ISSN 2329-3748. (In Press)

  15. 15
    Conference

    Relation: Renz, Arne Benjamin, Dai, Tianxiang, Antoniou, Marina, Cao, Qinze, Melnyk, Kyrylo, Tian, Xinkai, Stokeley, Katarzyna, Newton, Andrew, Shah, Vishal, Vavasour, Oliver J. and Gammon, P. M. (2023) The optimisation, fabrication and comparison of 10 kV-rated 4H-SiC IGBTs and MOSFETs. In: 2023 IEEE Energy Conversion Congress and Exposition (ECCE), Nashville, TN, USA, 29 Oct - 02 Nov 2023. Published in: 2023 IEEE Energy Conversion Congress and Exposition (ECCE) doi:10.1109/ecce53617.2023.10362455

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    Conference
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    Academic Journal

    Relation: Renz, Arne Benjamin, Vavasour, Oliver J., Gammon, Peter M., Li, Fan, Dai, Tianxiang, Baker, Guy, Grant, Nicholas E., Murphy, John D., Mawby, P. A. (Philip A.), Shah, Vishal and Gott, James A. (2022) (Invited, Digital Presentation) Improved reliability of 4H-SiC metal-oxide-semiconductor devices utilising atomic layer deposited layers with enhanced interface quality. ECS Transactions, 108 (2). pp. 43-49. doi:10.1149/10802.0043ecst ISSN 1938-5862.

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    Conference

    وصف الملف: application/pdf

    Relation: https://wrap.warwick.ac.uk/163701/1/WRAP-3.3%20kV-SiC-JBS-diodes-employing-P2O5-surface-passivation-treatment-improve-electrical-characteristics-Gammon-2021.pdf; Renz, Arne Benjamin, Vavasour, Oliver James, Shah, Vishal Ajit, Pathirana, Vasantha, Trajkovic, Tanya, Bonyadi, Yeganeh, Wu, Ruizhu, Ortiz-Gonzalez, Jose Angel , Rong, Xiaoyun, Baker, Guy, Mawby, Philip. A. and Gammon, Peter M. (2021) 3.3 kV SiC JBS diodes employing a P2O5 surface passivation treatment to improve electrical characteristics. In: 2021 IEEE Energy Conversion Congress and Exposition (ECCE), Vancouver, BC, Canada, 10-14 Oct 2021 pp. 5283-5288. doi:10.1109/ECCE47101.2021.9594999 ISSN 2329-3721.

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