المؤلفون: Krishnan S. Rengarajan, Saroj Mondal, Ravindra Kapre

المصدر: IET Circuits, Devices and Systems, Vol 15, Iss 6, Pp 581-593 (2021)

مصطلحات موضوعية: clocks, CMOS logic circuits, logic design, low‐power electronics, system‐on‐chip, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1751-858X; https://doaj.org/toc/1751-8598

URL الوصول: https://doaj.org/article/167aa376c93f42388bcc789f11cb147b

المؤلفون: Krishnaswamy Ramkumar, Long Hinh, Ravindra Kapre, Samanta Santanu Kumar, Swatilekha Saha, Vineet Agrawal, Venkatraman Prabhakar

المصدر: 2020 IEEE International Memory Workshop (IMW).

مصطلحات موضوعية: 010302 applied physics, Artificial neural network, Computer science, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Non-volatile memory, Noise, Neuromorphic engineering, In-Memory Processing, 0103 physical sciences, Electronic engineering, Enhanced Data Rates for GSM Evolution, 0210 nano-technology, Efficient energy use

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47f04574aad9904999b26fa5b7dc1d1e
https://doi.org/10.1109/imw48823.2020.9108127

المؤلفون: Swatilekha Saha, Venkatraman Prabhakar, Krishnaswamy Ramkumar, Ravindra Kapre, Vineet Agrawal, Srikanta Samanta, Long T Hinh

المصدر: IRPS

مصطلحات موضوعية: 010302 applied physics, business.industry, Computer science, Process (computing), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Non-volatile memory, Reliability (semiconductor), Neuromorphic engineering, 0103 physical sciences, Key (cryptography), Noise (video), Analog memory, 0210 nano-technology, business, Computer hardware

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e939770ddcb780bd3f0266439f581237
https://doi.org/10.1109/irps45951.2020.9129638

المؤلفون: S. Lakshminarayanan, Linda Cui, Ravindra Kapre, Srikanth Govindaswamy

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).

مصطلحات موضوعية: Interconnection, Materials science, Silicon, business.industry, Transistor, chemistry.chemical_element, High voltage, Dielectric, Chip, law.invention, chemistry, law, Logic gate, Electronic engineering, Optoelectronics, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b2b4c6ae4307133b6fac1fb07519b9f8
https://doi.org/10.1109/ipfa.2017.8060156

المؤلفون: K.N. ManjulaRani, N. Lakshminarayanan, Nayan Patel, Samanta Santanu Kumar, Geetha Narasimhan, Helmut Puchner, Ravindra Kapre, Ram Mohan Mooraka

المصدر: 2009 IEEE International Integrated Reliability Workshop Final Report.

مصطلحات موضوعية: Engineering, business.industry, Transistor, Analytical equations, law.invention, Substrate (building), law, MOSFET, Electronic engineering, Degradation (geology), business, Reliability model, NMOS logic, Communication channel

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::96a56b2c808222068fea0af7be8f8e7c
https://doi.org/10.1109/irws.2009.5383015

المؤلفون: C-L. Hou, G. Narasimhan, C-W. Fan, M. Whately, M-C. Hsieh, S.W. Lu, K-L. Yeh, W-J. Liao, P-G. Ma, S. Lakshminarayanan, J. Tung, S-C. Lin, J. Joung, F-C. Liu, W-C. Tseng, M. Slanina, Ravindra Kapre

المصدر: ISQED

مصطلحات موضوعية: Engineering, business.industry, Transistor, Electrical engineering, Biasing, Hardware_PERFORMANCEANDRELIABILITY, Process corners, law.invention, Threshold voltage, law, Electronic engineering, Static random-access memory, business, Standby power, NMOS logic, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::926437f24dff7da3251b03705e325961
https://doi.org/10.1109/isqed.2009.4810340

المؤلفون: M.V.R. Reddy, Helmut Puchner, D. Sajoto, T. Nigam, J. Tandigan, M. Whately, K. Shakeri, Ravindra Kapre, S. Lakshminarayanan, K. Jang

المصدر: 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Computer science, Memory architecture, Sram cell, Electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, Static random-access memory, Write margin, Scaling, Leakage (electronics), Voltage, Threshold voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::27d0d6f90b22358a13b3dec118065038
https://doi.org/10.1109/relphy.2007.369863

المؤلفون: Scott E. Thompson, Igor Polishchuk, Sagy Levy, Krishnaswamy Ramkumar, Nirav Shah, Ravindra Kapre, Oliver Pohland

المصدر: 2006 64th Device Research Conference.

مصطلحات موضوعية: Stress (mechanics), Contact process, Materials science, CMOS, business.industry, Contact resistance, Electrical engineering, Optoelectronics, Strained silicon, Static random-access memory, business, NMOS logic, PMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::eca002547ec779838565c35b824ee429
https://doi.org/10.1109/drc.2006.305174

المؤلفون: S. Wong, D. Radaelli, J. Majjiga, Ravindra Kapre, Helmut Puchner, S. Sharifzadeh, R. Chao

المصدر: 2006 IEEE International Reliability Physics Symposium Proceedings.

مصطلحات موضوعية: Engineering, Soft error, Nuclear testing, CMOS, business.industry, Electronic engineering, Process (computing), Single event latchup, Static random-access memory, business, Datasheet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cffdb388588e0ce50e6188975c80ac6c
https://doi.org/10.1109/relphy.2006.251342

المؤلفون: Sundar Narayanan, G. Narasimhan, Krishnaswamy Ramkumar, Alain Blosse, R. Gettle, Ravindra Kapre, Shahin Sharifzadeh, C.T. Hsu, Prabhuram Gopalan

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

مصطلحات موضوعية: Materials science, CMOS, Gate oxide, business.industry, Shallow trench isolation, Gate dielectric, Parasitic element, Electrical engineering, Optoelectronics, Equivalent oxide thickness, Nitride, business, Leakage (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::228f4009aff15eb2bdfe7547cd3934cd
https://doi.org/10.1109/iedm.2004.1419256