المؤلفون: Belhadi, J., Ravaux, F., Bouyanfif, H., Jouiad, M., Marssi, M. El

المصدر: Applied Surface Science 512 (2020) 145761

مصطلحات موضوعية: Condensed Matter - Materials Science

URL الوصول: http://arxiv.org/abs/2012.03866

المؤلفون: D’Elia, A, Alfakes, B, Alkhazaleh, A, Banchi, L, Beretta, M, Carrazza, S, Chiarello, F, Di Gioacchino, D, Giachero, A, Henrich, F, Piedjou Komnang, A, Ligi, C, Maccarrone, G, Macucci, M, Palumbo, E, Pasquale, A, Piersanti, L, Ravaux, F, Rettaroli, A, Robbiati, M, Tocci, S, Gatti, C, D’Elia, Alessandro, Alfakes, Boulos, Alkhazaleh, Anas, Banchi, Leonardo, Beretta, Matteo, Carrazza, Stefano, Chiarello, Fabio, Di Gioacchino, Daniele, Giachero, Andrea, Henrich, Felix, Piedjou Komnang, Alex Stephane, Ligi, Carlo, Maccarrone, Giovanni, Macucci, Massimo, Palumbo, Emanuele, Pasquale, Andrea, Piersanti, Luca, Ravaux, Florent, Rettaroli, Alessio, Robbiati, Matteo, Tocci, Simone, Gatti, Claudio

مصطلحات الفهرس: microwave photon detection, qubit characterization, transmon, transmon simulation, info:eu-repo/semantics/article

URL: https://hdl.handle.net/10281/462000
info:eu-repo/semantics/altIdentifier/wos/WOS:001170112300001
volume:14
issue:4
journal:APPLIED SCIENCES

المؤلفون: Passi, V., Ravaux, F., Dubois, E., Clavaguera, S., Celle, C., Simonato, J.-P., Silvestri, L., Reggiani, S., Vuillaume, D., Raskin, Jean-Pierre, The 41st European Solid-State Device Research Conference – ESSDERC 2011, SINANO-NanoFunction Workshop

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Relation: boreal:241089; http://hdl.handle.net/2078.1/241089

الاتاحة: http://hdl.handle.net/2078.1/241089

المؤلفون: Passi, V., Ravaux, F., Dubois, E., Clavaguera, S., Carella, A., Celle, C., Simonato, J.P., Silvestri, L., Reggiani, S., Vuillaume, D., Raskin, J.P.

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie (IEMN) - UMR 8520 IEMN

وصف الملف: application/octet-stream

Relation: http://hdl.handle.net/20.500.12210/48713

الاتاحة: https://hdl.handle.net/20.500.12210/48713

المؤلفون: Kamoutsi H., Haidemenopoulos G.N., Mavros H., Karantonidis C., Floratos P., Alhosani Z., Cho P., Anjum D.H., Ravaux F., Polychronopoulou K.

المصدر: International Journal of Hydrogen Energy ; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85113397235&doi=10.1016%2fj.ijhydene.2021.08.005&partnerID=40&md5=2bfd097e9ce97ed23c88e74c253d5ee8

مصطلحات موضوعية: Aluminum corrosion, Copper alloys, High resolution transmission electron microscopy, High strength alloys, Magnesium alloys, Ternary alloys, 2024 alloy, 2024 aluminium alloys, Ageing treatments, Aging temperatures, Alloy 2024, Artificial aging treatments, Coherent precipitates, High strength aluminium alloys, Hydrogen trapping, Precipitate coherency, Aluminum alloys, Elsevier Ltd

Relation: http://hdl.handle.net/11615/74246

الاتاحة: http://hdl.handle.net/11615/74246
https://doi.org/10.1016/j.ijhydene.2021.08.005

المؤلفون: Ravaux, F., Dubois, Emmanuel, Chen, Z.K.

المساهمون: Microélectronique Silicium - IEMN (MICROELEC SI - IEMN), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL)-Centrale Lille-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-JUNIA (JUNIA), Université catholique de Lille (UCL)-Université catholique de Lille (UCL), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: ISSN: 0167-9317.

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

الاتاحة: https://hal.science/hal-00790413
https://hal.science/hal-00790413v1/document
https://hal.science/hal-00790413v1/file/2012-Ravaux-MNE-SBH-reduction-hal.pdf
https://doi.org/10.1016/j.mee.2012.05.045

المؤلفون: Saylan, S, Jaoude, M Abi, Humood, K, Ravaux, F, Shehhi, H F Al, Mohammad, B

المساهمون: UAE Space Agency

المصدر: Nanotechnology ; volume 31, issue 16, page 165202 ; ISSN 0957-4484 1361-6528

الاتاحة: http://dx.doi.org/10.1088/1361-6528/ab68fb
https://iopscience.iop.org/article/10.1088/1361-6528/ab68fb
https://iopscience.iop.org/article/10.1088/1361-6528/ab68fb/pdf

المؤلفون: Das, G, Nagaraja, S, Sridurai, V, Shinde, DB, Addicoat, M, Prakasam, T, Gándara, F, Ravaux, F, Sharma, SK, Nair, GG, Lai, Z, Jagannathan, R, Olson, MA, Trabolsi, A

وصف الملف: text

Relation: http://irep.ntu.ac.uk/id/eprint/36436/1/13892_Addicoat.pdf; DAS, G., NAGARAJA, S., SRIDURAI, V., SHINDE, D.B., ADDICOAT, M., PRAKASAM, T., GÁNDARA, F., RAVAUX, F., SHARMA, S.K., NAIR, G.G., LAI, Z., JAGANNATHAN, R., OLSON, M.A. and TRABOLSI, A., 2019. Redox-triggered buoyancy and size modulation of a dynamic covalent gel. Chemistry of Materials, 31 (11), pp. 4148-4155. ISSN 0897-4756

الاتاحة: http://irep.ntu.ac.uk/id/eprint/36436/
http://irep.ntu.ac.uk/id/eprint/36436/1/13892_Addicoat.pdf
https://doi.org/10.1021/acs.chemmater.9b00919

المؤلفون: Deokar, G., Rajput, N. S., Vancsó, P., Ravaux, F., Jouiad, M., Vignaud, D., Cecchet, F., Colomer, Jean-François

المصدر: Deokar , G , Rajput , N S , Vancsó , P , Ravaux , F , Jouiad , M , Vignaud , D , Cecchet , F & Colomer , J-F 2017 , ' Large area growth of vertically aligned luminescent MoS 2 nanosheets ' , Nanoscale , vol. 9 , no. 1 , pp. 277-287 . https://doi.org/10.1039/c6nr07965b

الاتاحة: https://researchportal.unamur.be/en/publications/cc53082e-86ef-42a8-8a63-9d99e2325c92
https://doi.org/10.1039/c6nr07965b
http://www.scopus.com/inward/record.url?scp=85007348955&partnerID=8YFLogxK

المؤلفون: Deokar, G., Vancsó, Péter, Arenal, R., Ravaux, F., Casanova-Chafer, J.

مصطلحات موضوعية: QD Chemistry / kémia

وصف الملف: text

Relation: http://real.mtak.hu/73764/1/MoS2_Carbon_Nanotube_Hybrid_Material_growth_and_Gas_Sensing_u.pdf; Deokar, G. and Vancsó, Péter and Arenal, R. and Ravaux, F. and Casanova-Chafer, J. (2017) MoS2-Carbon Nanotube Hybrid Material Growth and Gas Sensing. ADVANCED MATERIALS INTERFACES, 4 (24). p. 1700801. ISSN 2196-7350

الاتاحة: http://real.mtak.hu/73764/
http://real.mtak.hu/73764/1/MoS2_Carbon_Nanotube_Hybrid_Material_growth_and_Gas_Sensing_u.pdf
https://doi.org/10.1002/admi.201700801

المؤلفون: Jouiad, M., Marin, E., Devarapalli, R.S., Cormier, J., Ravaux, F., Le Gall, C., Franchet, J.-M.

المساهمون: Masdar Institute of Science and Technology Abu Dhabi, Laboratoire Hubert Curien (LabHC), Institut d'Optique Graduate School (IOGS)-Université Jean Monnet - Saint-Étienne (UJM)-Centre National de la Recherche Scientifique (CNRS), SNECMA Groupe SAFRAN, Institut Pprime UPR 3346 (PPrime Poitiers ), Université de Poitiers = University of Poitiers (UP)-École Nationale Supérieure de Mécanique et d’Aérotechnique Poitiers (ISAE-ENSMA )-Centre National de la Recherche Scientifique (CNRS), Institut Français de Recherche pour l'Exploitation de la Mer (IFREMER), Chaire OPALE

المصدر: ISSN: 0261-3069.

مصطلحات موضوعية: Alloy 718, Thermal aging, Thermal cycling, HRTEM, Ledge growth mechanism, [SPI]Engineering Sciences [physics], [SPI.MAT]Engineering Sciences [physics]/Materials

Relation: hal-02901681; https://minesparis-psl.hal.science/hal-02901681

الاتاحة: https://minesparis-psl.hal.science/hal-02901681
https://doi.org/10.1016/j.matdes.2016.04.048

المؤلفون: Silvestri, L., Reggiani, S., Passi, V., Ravaux, F., Dubois, Emmanuel, Raskin, J.P., Clavaguera, S., Carella, A., Celle, C., Simonato, J.P.

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: Proceedings of 41st European Solid-State Device Research Conference, ESSDERC 2011 ; 41st European Solid-State Device Research Conference, ESSDERC 2011 ; https://hal.science/hal-00800024 ; 41st European Solid-State Device Research Conference, ESSDERC 2011, 2011, Helsinki, Finland. paper ID 5173, 131-134

جغرافية الموضوع: Helsinki, Finland

Relation: hal-00800024; https://hal.science/hal-00800024

الاتاحة: https://hal.science/hal-00800024

المؤلفون: Universitat Rovira i Virgili, Deokar G; Vancsó P; Arenal R; Ravaux F; Casanova-Cháfer J; Llobet E; Makarova A; Vyalikh D; Struzzi C; Lambin P; Jouiad M; Colomer J-F

المصدر: Advanced Materials Interfaces; 10.1002/admi.201700801; Advanced Materials Interfaces. 4 (24):

مصطلحات الفهرس: Chemistry, Multidisciplinary,Materials Science, Multidisciplinary,Mechanical Engineering,Mechanics of Materials, Nanoplates, Mos2, Mos 2, Gas sensor, Dft calculations, Cnt, Química, Mechanics of materials, Mechanical engineering, Materials science, multidisciplinary, Materiais, Interdisciplinar, Chemistry, multidisciplinary, Astronomia / física, Journal Publications

URL: http://hdl.handle.net/20.500.11797/imarina9282670

المؤلفون: Passi, Vikram, Ravaux, F., Dubois, Emmanuel, Raskin, Jean-Pierre, 23rd IEEE International Conference on Micro Electro Mechanical Systems (MEMS 2010)

المساهمون: UCL - SST/ICTM - Institute for Information and Communication. Technologies, Electronics and Applied Mathematics

Relation: boreal:67476; http://hdl.handle.net/2078.1/67476

الاتاحة: http://hdl.handle.net/2078.1/67476
https://doi.org/10.1109/MEMSYS.2010.5442464

المؤلفون: Benyettou, F., Rezgui, R., Ravaux, F., Jaber, T., Blumer, K., Jouiad, M., Motte, L., Olsen, J.-C., Platas-Iglesias, C., Magzoub, M., Trabolsi, A.

المصدر: Journal of Materials Chemistry B ; volume 3, issue 36, page 7237-7245 ; ISSN 2050-750X 2050-7518

الاتاحة: http://dx.doi.org/10.1039/c5tb00994d
http://pubs.rsc.org/en/content/articlepdf/2015/TB/C5TB00994D

المؤلفون: Tang, Xing, Ravaux, F., Dubois, Emmanuel, Kasper, E., Alim, K., Nicolas, R., Raskin, J.P.

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)

المصدر: 35th International Conference on Micro & Nano Engineering, MNE 2009
https://hal.science/hal-00575272
35th International Conference on Micro & Nano Engineering, MNE 2009, 2009, Ghent, Belgium

جغرافية الموضوع: Ghent, Belgium

Relation: hal-00575272; https://hal.science/hal-00575272

الاتاحة: https://hal.science/hal-00575272

المؤلفون: Chen, Z.K., Dubois, Emmanuel, Ravaux, F., Danneville, Francois

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Microélectronique Silicium - IEMN (MICROELEC SI - IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Advanced NanOmeter DEvices - IEMN (ANODE - IEMN)

المصدر: ISSN: 0167-9317.

مصطلحات موضوعية: [SPI]Engineering Sciences [physics]

Relation: hal-00790412; https://hal.science/hal-00790412

الاتاحة: https://hal.science/hal-00790412
https://doi.org/10.1016/j.mee.2012.04.035

المؤلفون: Tang, X., Ravaux, F., Dubois, E., Kasper, E., Karmous, A., Reckinger, Nicolas, Raskin, J.-P.

المصدر: Tang , X , Ravaux , F , Dubois , E , Kasper , E , Karmous , A , Reckinger , N & Raskin , J-P 2009 , Self-aligned single-electron memory fabrication based on Si/SiGe/Si heterostructures . in 35th International Conference on Micro & Nano Engineering .

الاتاحة: https://researchportal.unamur.be/en/publications/a2b300c3-fc2d-48c2-be8c-b51ef5fd233b

المؤلفون: Ravaux F., Anjum D., Aubry C., Haidemenopoulos G., Kamoutsi H., Mavros H., Singh N., Qattan I., Das G., Patole S.

المصدر: Microscopy and Microanalysis ; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85094869496&doi=10.1017%2fS1431927620018413&partnerID=40&md5=af5048f83f45a3dadf3e030778313914

مصطلحات موضوعية: Cambridge University Press

Relation: http://hdl.handle.net/11615/78474

الاتاحة: http://hdl.handle.net/11615/78474
https://doi.org/10.1017/S1431927620018413

المؤلفون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Passi, V., Ravaux, F., Dubois, E., Clavaguera, S., Celle, C., Simonato, J.-P., Silvestri, L., Reggiani, S., Vuillaume, D., Raskin, Jean-Pierre, The 41st European Solid-State Device Research Conference – ESSDERC 2011, SINANO-NanoFunction Workshop

مصطلحات الفهرس: info:eu-repo/semantics/conferenceObject

URL: http://hdl.handle.net/2078.1/241089