المؤلفون: Jedari Ghourichaei, Masoud, Kerimzade, Umut, Demirkazik, Levent, Pruchnik, Bartosz, Kwoka, Krzysztof, Badura, Dominik, Piasecki, Tomasz, Toymus, Alp Timucin, Aydin, Onur, Aksoy, Bekir, Aydogan, Cemal, Nadar, Gokhan, Rangelow, Ivo W., Beker, Levent, Yalcinkaya, Arda Deniz, Bayraktar, Halil, Gotszalk, Teodor, Alaca, Burhanettin Erdem

المساهمون: Narodowe Centrum Badań i Rozwoju

المصدر: Advanced Materials Technologies ; ISSN 2365-709X 2365-709X

الاتاحة: http://dx.doi.org/10.1002/admt.202400022
https://onlinelibrary.wiley.com/doi/pdf/10.1002/admt.202400022

المؤلفون: Gacka, Ewelina, Pruchnik, Bartosz, Tamulewicz-Szwajkowska, Magdalena, Badura, Dominik, Rangelow, Ivo W., Gotszalk, Teodor

المساهمون: European Cooperation in Science and Technology, Narodowe Centrum Nauki

المصدر: Measurement ; page 114815 ; ISSN 0263-2241

الاتاحة: http://dx.doi.org/10.1016/j.measurement.2024.114815
https://api.elsevier.com/content/article/PII:S0263224124007000?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0263224124007000?httpAccept=text/plain

المؤلفون: Dallorto, Stefano, Lorenzon, Monica, Szornel, Julia, Schwartzberg, Adam, Goodyear, Andy, Cooke, Mike, Hofmann, Martin, Rangelow, Ivo W, Cabrini, Stefano

المصدر: Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 37(5)

مصطلحات موضوعية: Engineering, Materials Engineering

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/5ff55702
https://escholarship.org/content/qt5ff55702/qt5ff55702.pdf

المؤلفون: Dallorto, Stefano, Goodyear, Andy, Cooke, Mike, Szornel, Julia E, Ward, Craig, Kastl, Christoph, Schwartzberg, Adam, Rangelow, Ivo W, Cabrini, Stefano

المصدر: Plasma Processes and Polymers. 16(9)

مصطلحات موضوعية: Engineering, Nanotechnology, aspect ratio independent etching, atomic layer etching, ion energy distribution, plasma etching, self-limiting process, Atomic, Molecular, Nuclear, Particle and Plasma Physics, Physical Chemistry (incl. Structural), Materials Engineering, Applied Physics, Macromolecular and materials chemistry, Materials engineering, Nuclear and plasma physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/4cn657t1
https://escholarship.org/content/qt4cn657t1/qt4cn657t1.pdf

المؤلفون: Becker, Sid, Gutschmidt, Stefanie, Rangelow, Ivo W.

المساهمون: Ilmenau Scientific Colloquium. Technische Universität Ilmenau, 60 (Ilmenau) : 2023.09.04-08

مصطلحات موضوعية: article, ddc:620

وصف الملف: 2 Seiten

Relation: Engineering for a changing world -- 10.22032/dbt.58663 -- urn:nbn:de:gbv:ilm1-2023isc:1 -- http://uri.gbv.de/document/gvk:ppn:1869512545; https://doi.org/10.22032/dbt.58885

الاتاحة: https://doi.org/10.22032/dbt.58885
https://nbn-resolving.org/urn:nbn:de:gbv:ilm1-2023isc-103:7
https://www.db-thueringen.de/receive/dbt_mods_00058885
https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00061775/ilm1-2023isc-103.pdf

المؤلفون: Dallorto, Stefano, Staaks, Daniel, Schwartzberg, Adam, Yang, XiaoMin, Lee, Kim Y, Rangelow, Ivo W, Cabrini, Stefano, Olynick, Deirdre L

المصدر: Nanotechnology. 29(40)

مصطلحات موضوعية: Engineering, Materials Engineering, Chemical Sciences, Nanotechnology, double patterning, bit patterned media, atomic layer deposition, sequential infiltration synthesis, template fabrication, Nanoscience & Nanotechnology

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/2mq5j0t3
https://escholarship.org/content/qt2mq5j0t3/qt2mq5j0t3.pdf

المؤلفون: Gacka, Ewelina, Kunicki, Piotr, Łysik, Paulina, Gajewski, Krzysztof, Ciechanowicz, Paulina, Pucicki, Damian, Majchrzak, Dominika, Gotszalk, Teodor, Piasecki, Tomasz, Busani, Tito, Rangelow, Ivo W., Hommel, Detlef

المساهمون: Narodowe Centrum Nauki

المصدر: Ultramicroscopy ; volume 248, page 113713 ; ISSN 0304-3991

الاتاحة: http://dx.doi.org/10.1016/j.ultramic.2023.113713
https://api.elsevier.com/content/article/PII:S030439912300030X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S030439912300030X?httpAccept=text/plain

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 25-53 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_2
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_2

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 171-226 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_7
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_7

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 55-83 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_3
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_3

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 287-328 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_10
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_10

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: ISBN 9783031442322 9783031442339.

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9.pdf
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 1-23 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_1
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_1

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 329-364 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_11
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_11

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 249-285 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_9
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_9

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 109-150 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_5
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_5

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 227-248 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_8
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_8

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 151-169 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_6
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_6

المؤلفون: Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal

المصدر: Active Probe Atomic Force Microscopy ; page 85-108 ; ISBN 9783031442322 9783031442339

الاتاحة: http://dx.doi.org/10.1007/978-3-031-44233-9_4
https://link.springer.com/content/pdf/10.1007/978-3-031-44233-9_4

المؤلفون: Rangelow, Ivo W., Schenkel, Thomas, Persaud, Arun, Durrani, Zahid, Jones, Mervyn, Pietscher, Hans-Georg, Dietrich, Fabian, Tan, Aditya S., Stauffenberg, Jaqueline, Manske, Eberhard, Froehlich, Thomas, Karpuzov, Dimitre

المصدر: 2024 31st International Conference on Mixed Design of Integrated Circuits and System (MIXDES)

الاتاحة: http://dx.doi.org/10.23919/mixdes62605.2024.10614012
http://xplorestaging.ieee.org/ielx8/10613861/10613931/10614012.pdf?arnumber=10614012