المؤلفون: Ran, Z. Y., Luo, Z., Li, J. L., Meng, L., Liu, Y. H., Hu, J., He, J. L., Li, Q.

المساهمون: Natural Science Foundation of China, China Postdoctoral Science Foundation

المصدر: 2024 IEEE 5th International Conference on Dielectrics (ICD) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/icd59037.2024.10613259
http://xplorestaging.ieee.org/ielx8/10613003/10613009/10613259.pdf?arnumber=10613259

المؤلفون: Ran, Z. Y., Du, B. X., Xiao, Meng, Liu, H. L., Xing, J. W.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 28, issue 4, page 1308-1316 ; ISSN 1070-9878 1558-4135

الاتاحة: https://doi.org/10.1109/tdei.2021.009694
http://xplorestaging.ieee.org/ielx7/94/9515774/09515809.pdf?arnumber=9515809

المؤلفون: Zhang, J. H., Du, B. X., Xiao, Meng, Liu, H. L., Chen, Ke, Ran, Z. Y.

المساهمون: National Natural Science Foundation of China

المصدر: 2022 IEEE International Conference on High Voltage Engineering and Applications (ICHVE)

الاتاحة: http://dx.doi.org/10.1109/ichve53725.2022.9961711
http://xplorestaging.ieee.org/ielx7/9961325/9961221/09961711.pdf?arnumber=9961711

المؤلفون: Liu, Haoliang, Du, B. X., Xiao, Meng, Ran, Z. Y.

المساهمون: National Natural Science Foundation of China

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 29, issue 3, page 997-1004 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2022.3168368
http://xplorestaging.ieee.org/ielx7/94/9808410/09760389.pdf?arnumber=9760389

المؤلفون: Ran, Z. Y., Du, B. X., Xiao, M., Liu, H. L., Xing, J. W.

المساهمون: Chinese National Natural Science Foundation, State Key Laboratory of Power Transmission Equipment and System Security

المصدر: 2021 International Conference on Electrical Materials and Power Equipment (ICEMPE)

الاتاحة: http://dx.doi.org/10.1109/icempe51623.2021.9509158
http://xplorestaging.ieee.org/ielx7/9509030/9508989/09509158.pdf?arnumber=9509158

المؤلفون: Ran, Z. Y., Du, B. X., Li, Jin, Yao, H., Xing, J. W., Dong, J. N.

المساهمون: National Natural Science Foundation of China, Natural Science Foundation of Tianjin City

المصدر: 2020 IEEE 3rd International Conference on Dielectrics (ICD)

الاتاحة: http://dx.doi.org/10.1109/icd46958.2020.9341892
http://xplorestaging.ieee.org/ielx7/9341294/9341806/09341892.pdf?arnumber=9341892

المؤلفون: Ran, Z. Y., Du, B. X., Xiao, M., Liu, H. L., Xing, J. W.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 28, issue 1, page 175-182 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2020.009128
http://xplorestaging.ieee.org/ielx7/94/9351850/09351857.pdf?arnumber=9351857

المؤلفون: Du, B. X., Xing, J. W., Ran, Z. Y., Liu, H. L., Xiao, Meng, Li, Jian

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 28, issue 6, page 1917-1924 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2021.009688
http://xplorestaging.ieee.org/ielx7/94/9679679/09679688.pdf?arnumber=9679688

المؤلفون: Ran, Z. Y., Du, B. X., Xiao, Meng

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 28, issue 5, page 1547-1554 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2021.009583
http://xplorestaging.ieee.org/ielx7/94/9594861/09594874.pdf?arnumber=9594874

المؤلفون: Ran, Z. Y., Du, B. X., Xiao, M., Li, Jin

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 28, issue 3, page 964-971 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2021.009387
http://xplorestaging.ieee.org/ielx7/94/9450682/09450699.pdf?arnumber=9450699

المؤلفون: Du, B. X., Ran, Z. Y., Li, J., Liang, H. C., Yao, H.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 27, issue 4, page 1305-1312 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2020.008761
http://xplorestaging.ieee.org/ielx7/94/9160393/09160429.pdf?arnumber=9160429

المؤلفون: Liang, H. C., Du, B. X., Li, J., Ran, Z. Y., Wang, Z. H., Kong, X. X., Liu, H. L., Guo, P. X.

المصدر: 2018 IEEE 2nd International Conference on Dielectrics (ICD) ; volume 17, page 1-4

الاتاحة: http://dx.doi.org/10.1109/icd.2018.8514596
http://xplorestaging.ieee.org/ielx7/8450563/8514559/08514596.pdf?arnumber=8514596

المؤلفون: Du, B. X., Ran, Z. Y., Li, J., Liang, H. C.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 26, issue 3, page 818-825 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2019.007778
http://xplorestaging.ieee.org/ielx7/94/8726001/08726029.pdf?arnumber=8726029

المؤلفون: Du, B. X., Liang, H. C., Li, J., Ran, Z. Y.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation ; volume 25, issue 4, page 1202-1210 ; ISSN 1070-9878 1558-4135

الاتاحة: http://dx.doi.org/10.1109/tdei.2018.007079
http://xplorestaging.ieee.org/ielx7/94/8424343/08424353.pdf?arnumber=8424353

المؤلفون: Du, B. X., Liang, H. C., Li, J., Wang, Z. H., Ran, Z. Y., Liu, H. L.

المصدر: IEEE Transactions on Dielectrics & Electrical Insulation; Dec2019, Vol. 26 Issue 6, p1956-1964, 9p

مصطلحات موضوعية: CENTRIFUGAL force, FLASHOVER, ELECTRIC fields, CENTRIFUGATION, ELECTRIC potential

المؤلفون: Du, B. X., Liang, H. C., Li, J., Ran, Z. Y.

المصدر: IEEE Transactions on Dielectrics & Electrical Insulation; Aug2018, Vol. 25 Issue 4, p1202-1210, 9p

مصطلحات موضوعية: ELECTRIC fields, SURFACE charges, HYDRODYNAMICS, HIGH voltages, ELECTROSTATICS

المؤلفون: Ye, H. J., Hu, C. M., Huang, Y. X., Ran, Z. Y., Tian, S. Y., Liu, J. Q., Zhao, Z. X.

المصدر: Physical Review B ; volume 46, issue 10, page 6630-6632 ; ISSN 0163-1829 1095-3795

الاتاحة: http://dx.doi.org/10.1103/physrevb.46.6630
http://link.aps.org/article/10.1103/PhysRevB.46.6630
http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevB.46.6630/fulltext

المؤلفون: Li, J. Q., Chen, C., Yang, D. Y., Li, F. H., Yao, Y. S., Ran, Z. Y., Wang, W. K., Zhao, Z. X.

المصدر: Zeitschrift für Physik B Condensed Matter; June 1989, Vol. 74 Issue: 2 p165-172, 8p

المؤلفون: Li, J. Q., Chen, C., Yang, D. Y., Li, F. H., Yao, Y. S., Ran, Z. Y., Wang, W. K., Zhao, Z. X.

المصدر: Zeitschrift f�r Physik B Condensed Matter ; volume 74, issue 2, page 165-172 ; ISSN 0722-3277 1434-6036

الاتاحة: http://dx.doi.org/10.1007/bf01307382
http://link.springer.com/content/pdf/10.1007/BF01307382.pdf
http://link.springer.com/article/10.1007/BF01307382/fulltext.html
http://link.springer.com/content/pdf/10.1007/BF01307382

المؤلفون: Yang, D Y, Li, J Q, Li, F H, Zhou, Y Q, Chen, L Q, Huang, Y Z, Ran, Z Y, Zhao, Z X

المصدر: Superconductor Science and Technology ; volume 1, issue 2, page 100-101 ; ISSN 0953-2048 1361-6668

الاتاحة: http://dx.doi.org/10.1088/0953-2048/1/2/011