يعرض 1 - 20 نتائج من 66 نتيجة بحث عن '"Rajeev Rajendran"', وقت الاستعلام: 0.50s تنقيح النتائج
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    Academic Journal
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    Conference

    المساهمون: Sendelbach, Matthew J., Schuch, Nivea G.

    المصدر: Metrology, Inspection, and Process Control XXXVIII

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    Academic Journal
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    Periodical

    المصدر: Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129552Y-129552Y-9, 1165978p

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    Academic Journal

    المصدر: The Journal of Chemical Physics, 146 (8)

    مصطلحات موضوعية: info:eu-repo/classification/ddc/540, Chemistry

    وصف الملف: application/application/pdf

    Relation: info:eu-repo/semantics/altIdentifier/wos/000395901000021; info:eu-repo/grantAgreement/EC/FP7/307270; info:eu-repo/grantAgreement/SNF/Projektförderung in Mathematik, Natur- und Ingenieurwissenschaften (Abteilung II)/159875; http://hdl.handle.net/20.500.11850/183013

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    Academic Journal
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    Academic Journal
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    Academic Journal
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    Electronic Resource
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    Conference
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    Conference

    المساهمون: Bodermann, Bernd, Frenner, Karsten, Silver, Richard M.

    المصدر: Modeling Aspects in Optical Metrology VII

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    Academic Journal

    المصدر: Journal of micro/nanolithography, MEMS and MOEMS 19(1), 014002 (2020). doi:10.1117/1.JMM.19.1.014002

    مصطلحات موضوعية: info:eu-repo/classification/ddc/620

    جغرافية الموضوع: DE

    Relation: info:eu-repo/semantics/altIdentifier/issn/1537-1646; info:eu-repo/semantics/altIdentifier/wos/WOS:000590135700005; info:eu-repo/semantics/altIdentifier/issn/1817-6461; info:eu-repo/semantics/altIdentifier/issn/1932-5150; info:eu-repo/semantics/altIdentifier/issn/1932-5134; https://publications.rwth-aachen.de/record/808693; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2020-12232%22

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    Academic Journal
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    Conference

    المساهمون: Ronse, Kurt G., Gargini, Paolo A., Hendrickx, Eric, Naulleau, Patrick P., Itani, Toshiro

    المصدر: International Conference on Extreme Ultraviolet Lithography 2018

  16. 16
    Conference

    المساهمون: Adan, Ofer, Ukraintsev, Vladimir A.

    المصدر: Metrology, Inspection, and Process Control for Microlithography XXXII

  17. 17
    Conference

    المساهمون: Felix, Nelson M., Goldberg, Kenneth A.

    المصدر: Extreme Ultraviolet (EUV) Lithography IX

  18. 18
    Conference
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