المؤلفون: Jan Skalka, Matus Valko

المصدر: IEEE Access, Vol 12, Pp 157996-158024 (2024)

مصطلحات موضوعية: Rapid guessing behavior, solution behavior, microlearning, response time threshold, RTRA methods, low stakes assessment, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10731845/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/ea45ab3235344b8a8c14545e8aeb6012