المؤلفون: Ronald D. Schrimpf, Lloyd W. Massengill, C.J. Nicklaw, R.J. Milanowski, B.W. Offord, R.J. Graves, Kenneth F. Galloway, M.E. Wood, E.P. Kelley, M.P. Pagey

المصدر: IEEE Transactions on Nuclear Science. 45:2593-2599

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Silicon on insulator, Trapping, Buried oxide, Mesa, Back channel, Nuclear Energy and Engineering, MOSFET, Optoelectronics, Irradiation, Electrical and Electronic Engineering, business, computer, Leakage (electronics), computer.programming_language

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8a28dea77e7ac635038a8309acfb8d65
https://doi.org/10.1109/23.736502

المؤلفون: S.E. Kerns, Bharat L. Bhuva, R.J. Milanowski, K.T. Henegar, M.P. Pagey

المصدر: IEEE Transactions on Nuclear Science. 42:1758-1763

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Silicon, business.industry, Annealing (metallurgy), Oxide, chemistry.chemical_element, chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, Optoelectronics, X-ray lithography, Charge carrier, Irradiation, Electrical and Electronic Engineering, business, Forming gas, NMOS logic

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed7a9aca27b287a6a5bf770d3b9b8de5
https://doi.org/10.1109/23.488776

المؤلفون: R.J. Milanowski, Bharat L. Bhuva, A.I. Matta, Lloyd W. Massengill, M.P. Pagey, S.E. Kerns

المصدر: IEEE Transactions on Nuclear Science. 40:1360-1366

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Passivation, Hydrogen, business.industry, Annealing (metallurgy), Oxide, chemistry.chemical_element, Condensed Matter::Materials Science, chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, Radiation damage, Optoelectronics, Charge carrier, Irradiation, Electrical and Electronic Engineering, business, Forming gas

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d94b48b2753c261cdd8803f8b302e52b
https://doi.org/10.1109/23.273531

المؤلفون: A. Michez, R.J. Graves, Ronald D. Schrimpf, C.R. Cirba, S.C. Witczak, Daniel M. Fleetwood, R.J. Milanowski, Frédéric Saigné

المساهمون: Vanderbilt University School of Engineering [Nashville] (VUSE), Centre d'Electronique et de Micro-optoélectronique de Montpellier (CEM2), Université Montpellier 2 - Sciences et Techniques (UM2)-Centre National de la Recherche Scientifique (CNRS), Sandia National Laboratories [Albuquerque] (SNL), Sandia National Laboratories - Corporation

المصدر: IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 1998, 45 (6), pp.2352-2360. ⟨10.1109/23.736454⟩

مصطلحات موضوعية: 010302 applied physics, Nuclear and High Energy Physics, Materials science, 010308 nuclear & particles physics, business.industry, Bipolar junction transistor, Transistor, Charge (physics), Trapping, 01 natural sciences, Space charge, Molecular physics, law.invention, [SPI.TRON]Engineering Sciences [physics]/Electronics, Nuclear Energy and Engineering, law, 0103 physical sciences, Optoelectronics, Irradiation, Electrical and Electronic Engineering, Current (fluid), business, ComputingMilieux_MISCELLANEOUS, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fa0a9e8cfacb934591a2c73fcdc0c083
https://hal.archives-ouvertes.fr/hal-01801597

المؤلفون: N. Bui, R.J. Milanowski, Bharat L. Bhuva, B. Deem, E. Snyder, S. Kerns, M.P. Pagey

المصدر: Proceedings of International Reliability Physics Symposium RELPHY-96.

مصطلحات موضوعية: Coupling, Materials science, MOSFET, Electronic engineering, Semiconductor device modeling, N channel, Unified Model, Biological system, Circuit reliability, Device degradation, Degradation (telecommunications)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::84a6c31909d660c8cd12de75737b673c
https://doi.org/10.1109/relphy.1996.492132