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1
المؤلفون: Scott M. Johnson, R. N. Jacobs, Jeffrey M. Peterson, L. O. Bubulac, J. M. Arias, D. D. Lofgreen, J. W. Bangs, Andrew J. Stoltz, L. A. Almeida, M. Reddy, J. D. Benson, A. Wang
المصدر: Journal of Electronic Materials. 48:6194-6202
مصطلحات موضوعية: 010302 applied physics, Materials science, Analytical chemistry, Oxide, Polishing, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Impurity, Desorption, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, Deposition (law), Molecular beam epitaxy
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2
المؤلفون: L. A. Almeida, B. Pinkie, B. Wissman, Alexander Brown, R. N. Jacobs, Andrew J. Stoltz, J. D. Benson, J. Arias
المصدر: Journal of Electronic Materials. 48:6138-6144
مصطلحات موضوعية: 010302 applied physics, In situ, Materials science, Oxide, Nucleation, Analytical chemistry, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Wavelength, chemistry, Desorption, 0103 physical sciences, Materials Chemistry, Electrical and Electronic Engineering, Dislocation, 0210 nano-technology, Molecular beam epitaxy
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3
المؤلفون: Andrew J. Stoltz, A. Yulius, L. A. Almeida, L. O. Bubulac, Jeffrey M. Peterson, Scott M. Johnson, M. Carmody, M. Jaime-Vasquez, P. J. Smith, A. Wang, J. D. Benson, M. Reddy, R. N. Jacobs, D. D. Lofgreen, J. M. Arias, J. W. Bangs, Priyalal Wijewarnasuriya
المصدر: Journal of Electronic Materials. 47:5671-5679
مصطلحات موضوعية: 010302 applied physics, Materials science, Solid-state physics, Analytical chemistry, Hot spot (veterinary medicine), 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Focused ion beam, Electronic, Optical and Magnetic Materials, Impurity, 0103 physical sciences, Scanning transmission electron microscopy, Materials Chemistry, Electrical and Electronic Engineering, 0210 nano-technology, Molecular beam epitaxy
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4
المؤلفون: D. D. Lofgreen, Priyalal Wijewarnasuriya, Scott M. Johnson, J. K. Markunas, R. N. Jacobs, Kelly A. Jones, J. Arias, Jeffrey M. Peterson, L. A. Almeida, M. Reddy, P. J. Smith, L. O. Bubulac, Andrew J. Stoltz, M. Jaime-Vasquez, J. D. Benson
المصدر: Journal of Electronic Materials. 46:5418-5423
مصطلحات موضوعية: 010302 applied physics, Auger electron spectroscopy, Materials science, business.industry, Infrared, Scanning electron microscope, Energy-dispersive X-ray spectroscopy, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Optics, 0103 physical sciences, Materials Chemistry, Optoelectronics, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, business, Molecular beam epitaxy, Dark current
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5
المؤلفون: M. Vaghayenegar, David J. Smith, J. D. Benson, R. N. Jacobs, L. A. Almeida, Andrew J. Stoltz
المصدر: Journal of Electronic Materials. 46:5007-5019
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Annealing (metallurgy), 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Etch pit density, Transmission electron microscopy, 0103 physical sciences, Materials Chemistry, Partial dislocations, Electrical and Electronic Engineering, Dislocation, 0210 nano-technology, Burgers vector, Molecular beam epitaxy
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6
المؤلفون: R. N. Jacobs, Priyalal Wijewarnasuriya, C. M. Lennon, J. K. Markunas, Andrew J. Stoltz, L. O. Bubulac, J. M. Arias, Jeffrey M. Peterson, Kelly A. Jones, D. D. Lofgreen, M. Reddy, M. Jaime-Vasquez, J. D. Benson, P. J. Smith, L. A. Almeida, Scott M. Johnson
المصدر: Journal of Electronic Materials. 45:4502-4510
مصطلحات موضوعية: 010302 applied physics, Materials science, Solid-state physics, Analytical chemistry, Polishing, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Impurity, 0103 physical sciences, Materials Chemistry, Wafer, Electrical and Electronic Engineering, 0210 nano-technology, Molecular beam epitaxy
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7
المؤلفون: A. Yulius, C. M. Lennon, L. A. Almeida, Priyalal Wijewarnasuriya, R. N. Jacobs, Jeffrey M. Peterson, M. Jaime-Vasquez, R. Hirsch, Andrew J. Stoltz, S. Motakef, M. Reddy, J. D. Benson, M. F. Vilela, P. J. Smith, M. Carmody, J. K. Markunas, L. O. Bubulac, J. M. Arias, D. D. Lofgreen, J. Fiala, Scott M. Johnson
المصدر: Journal of Electronic Materials. 44:3082-3091
مصطلحات موضوعية: Materials science, Analytical chemistry, Polishing, chemistry.chemical_element, Substrate (electronics), Contamination, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Impurity, Materials Chemistry, Wafer, Electrical and Electronic Engineering, Inclusion (mineral), Tellurium, Molecular beam epitaxy
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8
المؤلفون: C. Nozaki, M. Jaime Vasquez, C. M. Lennon, B. Wissman, R. N. Jacobs, C. Taylor, Joseph G. Pellegrino, L. A. Almeida, J. Arias
المصدر: Journal of Electronic Materials. 44:3076-3081
مصطلحات موضوعية: Materials science, Solid-state physics, business.industry, Annealing (metallurgy), Condensed Matter Physics, Curvature, Cadmium telluride photovoltaics, Thermal expansion, Electronic, Optical and Magnetic Materials, Residual stress, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Thin film, business, Molecular beam epitaxy
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9
المؤلفون: Priyalal Wijewarnasuriya, Jeffrey M. Peterson, D. D. Lofgreen, L. A. Almeida, Daeyeon Lee, G. Bostrup, R. N. Jacobs, Y. Chen, Andrew J. Stoltz, Scott M. Johnson, L. O. Bubulac, M. Jaime-Vasquez, M. Carmody, M. Reddy, J. D. Benson, A. Yulius, G. Brill, M. F. Vilela, J. K. Markunas, S. Couture, P. J. Smith
المصدر: Journal of Electronic Materials. 43:3993-3998
مصطلحات موضوعية: Materials science, Solid-state physics, Analytical chemistry, chemistry.chemical_element, Condensed Matter Physics, Dark field microscopy, Electronic, Optical and Magnetic Materials, Crystallography, chemistry, Materials Chemistry, Wafer, Undercut, Electrical and Electronic Engineering, Tellurium, Deposition (law), Molecular beam epitaxy
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10
المؤلفون: K. Brogden, C. M. Lennon, P. J. Smith, N. Supola, R. N. Jacobs, Patrick Maloney, Andrew J. Stoltz, M. Jaime-Vasquez, Alexander Brown, J. D. Benson, L. A. Almeida, J. K. Markunas
المصدر: Journal of Electronic Materials. 43:3708-3717
مصطلحات موضوعية: Materials science, business.industry, Sensing applications, Material system, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Characterization (materials science), High surface, Materials Chemistry, Surface roughness, Optoelectronics, Electrical and Electronic Engineering, business, Surface reconstruction
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11
المؤلفون: M. F. Vilela, David R. Rhiger, Jeffrey M. Peterson, L. O. Bubulac, Y. Chen, J. A. Arias, M. Jaime-Vasquez, P. J. Smith, C. M. Lennon, J. W. Bangs, R. N. Jacobs, J. D. Benson, E. A. Patten, Scott M. Johnson, J. K. Markunas, G. Brill, Priyalal Wijewarnasuriya, L. A. Almeida, D. D. Lofgreen, Andrew J. Stoltz
المصدر: Journal of Electronic Materials. 42:3217-3223
مصطلحات موضوعية: Materials science, Annealing (metallurgy), business.industry, chemistry.chemical_element, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystallography, Etch pit density, chemistry, Impurity, Getter, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Indium, Molecular beam epitaxy
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12
المؤلفون: R. N. Jacobs, Joseph G. Pellegrino, S. Sivananthan, J. Arias, L. A. Almeida, A. E. Brown, M. Jaime-Vasquez, C. M. Lennon
المصدر: Journal of Electronic Materials. 42:3224-3230
مصطلحات موضوعية: Electron mobility, Materials science, Condensed matter physics, Annealing (metallurgy), Doping, Analytical chemistry, Atmospheric temperature range, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Gallium arsenide, chemistry.chemical_compound, chemistry, Hall effect, Materials Chemistry, Surface layer, Electrical and Electronic Engineering, Molecular beam epitaxy
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13
المؤلفون: J. K. Markunas, Joseph G. Pellegrino, J. D. Benson, R. N. Jacobs, C. M. Lennon, P. J. Smith, L. A. Almeida, J. Arias
المصدر: Journal of Electronic Materials. 42:3344-3348
مصطلحات موضوعية: Materials science, Solid-state physics, Annealing (metallurgy), Kinetics, Analytical chemistry, Activation energy, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Electron diffraction, Materials Chemistry, Sublimation (phase transition), Electrical and Electronic Engineering, Molecular beam epitaxy
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14
المؤلفون: R. N. Jacobs, J. J. Kim, M. Jaime-Vasquez, C. Nozaki, David J. Smith, L. A. Almeida
المصدر: Journal of Electronic Materials. 42:3142-3147
مصطلحات موضوعية: Materials science, Solid-state physics, business.industry, Polishing, Heterojunction, Condensed Matter Physics, Microanalysis, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystal, Transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Molecular beam epitaxy
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15
المؤلفون: S. Farrell, R. N. Jacobs, Y. Chen, G. Brill, M. Salmon, L. A. Almeida, J. D. Benson, J. Zu, Andrew J. Stoltz, C. M. Lennon, P. J. Smith, Priyalal Wijewarnasuriya
المصدر: Journal of Electronic Materials. 42:3148-3155
مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Detector, Condensed Matter Physics, Focused ion beam, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Optics, Etch pit density, Getter, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Dislocation, business
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16
المؤلفون: R. N. Jacobs, S. Farrell, L. A. Almeida, M. Salmon, J. D. Benson, A. Newell, Andrew J. Stoltz, G. Brill
المصدر: Journal of Crystal Growth. 366:88-94
مصطلحات موضوعية: Materials science, Annealing (metallurgy), Infrared, business.industry, Heterojunction, Condensed Matter Physics, Focused ion beam, Cadmium telluride photovoltaics, Inorganic Chemistry, Crystallography, Etch pit density, Scanning transmission electron microscopy, Materials Chemistry, Optoelectronics, Dislocation, business
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17
المؤلفون: J. Arias, L. A. Almeida, R. N. Jacobs, Joseph G. Pellegrino, M. Jaime-Vasquez, C. Nozaki, J. D. Benson
المصدر: Journal of Electronic Materials. 41:2975-2980
مصطلحات موضوعية: Materials science, Solid-state physics, Annealing (metallurgy), Analytical chemistry, Nanowire, Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Overpressure, Crystallography, Electron diffraction, Thermal, Materials Chemistry, Electrical and Electronic Engineering, Molecular beam epitaxy
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18
المؤلفون: R. N. Jacobs, S. Farrell, Andrew J. Stoltz, Y. Chen, G. Brill, P. J. Smith, M. Carmody, J. D. Benson, L. A. Almeida, Priyalal Wijewarnasuriya
المصدر: Journal of Electronic Materials. 41:2949-2956
مصطلحات موضوعية: Materials science, Silicon, business.industry, chemistry.chemical_element, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, Gallium arsenide, Crystallography, chemistry.chemical_compound, Semiconductor, Etch pit density, chemistry, Materials Chemistry, Optoelectronics, Infrared detector, Electrical and Electronic Engineering, Dislocation, business, Dark current
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19
المؤلفون: Daeyeon Lee, D. D. Edwall, M. Carmody, J. K. Markunas, J. M. Arias, D. Benson, R. N. Jacobs, Andrew J. Stoltz, A. Almeida, E. Piquette, A. Yulius
المصدر: Journal of Electronic Materials. 41:2719-2724
مصطلحات موضوعية: Electron mobility, Materials science, Solid-state physics, business.industry, Substrate (electronics), Condensed Matter Physics, Cadmium telluride photovoltaics, Electronic, Optical and Magnetic Materials, Crystal, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Dislocation, business, Layer (electronics), Molecular beam epitaxy
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20
المؤلفون: J. D. Benson, David J. Smith, R. N. Jacobs, Andrew J. Stoltz, L. A. Almeida, M. Vaghayenegar
المصدر: Microscopy and Microanalysis. 23:1526-1527
مصطلحات موضوعية: 010302 applied physics, Materials science, Condensed matter physics, Annealing (metallurgy), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Cadmium telluride photovoltaics, Etch pit density, Transmission electron microscopy, 0103 physical sciences, Dislocation, 0210 nano-technology, Instrumentation, Burgers vector, Molecular beam epitaxy, Bar (unit)