-
1Academic Journal
المؤلفون: P. Zaumseil, D. Krüger, R. Kurps, O. Fursenko, P. Formanek
المساهمون: The Pennsylvania State University CiteSeerX Archives
مصطلحات موضوعية: AES, epitaxial layer, SiGe HBT, SIMS, spectroscopic ellipsometry, TEM, XRD, XRR
وصف الملف: application/pdf
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.699.2654; http://www.scientific.net/SSP.95-96.473.pdf
-
2
المؤلفون: Bernd Heinemann, Thomas Grabolla, Dirk Wolansky, Yuji Yamamoto, Andreas Trusch, R. Barth, Detlef Schmidt, Jürgen Drews, O. Fursenko, Steffen Marschmeyer, Alexander Scheit, Holger Rucker, R. Kurps
المصدر: IEEE Electron Device Letters. 35:814-816
مصطلحات موضوعية: Materials science, business.industry, Heterostructure-emitter bipolar transistor, Heterojunction bipolar transistor, Bipolar junction transistor, Transistor, Heterojunction, Ring oscillator, Electronic, Optical and Magnetic Materials, law.invention, law, Optoelectronics, Current-mode logic, Electrical and Electronic Engineering, business, Common emitter
-
3
المؤلفون: Yuji Yamamoto, Bernd Heinemann, R. Kurps, Holger Rücker
المصدر: ECS Transactions. 3:1069-1075
مصطلحات موضوعية: Materials science, Fabrication, Dopant, business.industry, Heterojunction bipolar transistor, Doping, chemistry.chemical_element, Heterojunction, Germanium, chemistry, Optoelectronics, business, Ternary operation, Boron
-
4
المؤلفون: O. Fursenko, Peter Zaumseil, Peter Formanek, R. Kurps, D. Krüger
المصدر: Solid State Phenomena. :473-482
مصطلحات موضوعية: X-ray reflectivity, Optics, Materials science, business.industry, Heterojunction bipolar transistor, Optoelectronics, General Materials Science, Condensed Matter Physics, business, Atomic and Molecular Physics, and Optics
-
5
المؤلفون: Peter Formanek, D. Krüger, R. Kurps, G. Weidner
المصدر: Solid State Phenomena. :77-82
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, chemistry, Inorganic chemistry, Oxide, Oxygen ions, chemistry.chemical_element, General Materials Science, Condensed Matter Physics, Oxygen, Atomic and Molecular Physics, and Optics
-
6
المؤلفون: Bernd Tillack, A.A. Efremov, R. Kurps, D. Krüger, Junichi Murota, G. Ph. Romanova, E. Bugiel
المصدر: Surface and Interface Analysis. 33:663-671
مصطلحات موضوعية: Materials science, Ion beam, Dopant, Drop (liquid), Analytical chemistry, Surfaces and Interfaces, General Chemistry, Chemical vapor deposition, Condensed Matter Physics, Epitaxy, Surfaces, Coatings and Films, Ion, Ion implantation, Sputtering, Materials Chemistry
-
7
المؤلفون: Christian Mai, R. Kurps, Bernd Tillack, P. Ostrovskyy, Lars Zimmermann, Yuji Yamamoto, Dieter Knoll, Anna Peczek, F. Korndorfer, Marcel Kroh, A. Scheit, Georg Winzer, Karsten Voigt, Stefan Lischke, Andreas Trusch
المصدر: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM).
مصطلحات موضوعية: Waveguide (electromagnetism), Materials science, business.industry, law, Bicmos process, Optoelectronics, Photonics, business, Photodiode, law.invention
-
8
المؤلفون: J. Dabrowski, K. Pomplun, P. Gaworzewski, D. Krüger, R. Kurps
المصدر: Journal of Applied Physics. 90:3578-3584
مصطلحات موضوعية: Pseudopotential, Surface diffusion, Ion implantation, Silicon, chemistry, Gate oxide, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Activation energy, Well-defined, Molecular physics
-
9
المؤلفون: G. Weidner, K. Pomplun, R. Kurps, A. Goryachko, D. Krüger
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 19:2174-2180
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, Atomic force microscopy, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Surface finish, Tungsten, Condensed Matter Physics, Surfaces, Coatings and Films, Auger, Amorphous solid, chemistry, Sputtering, Crystallite
-
10
المؤلفون: P. Gaworzewski, R. Kurps, D. Krüger, K. Pomplun
المصدر: Microelectronics Reliability. 40:1335-1340
مصطلحات موضوعية: Diffusion, Kinetics, Analytical chemistry, chemistry.chemical_element, Activation energy, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Ion implantation, chemistry, Gate oxide, Fluorine, Constant current, Breakdown voltage, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
-
11
المصدر: Solid State Phenomena. :465-472
مصطلحات موضوعية: Materials science, Ion beam, Silicon, business.industry, chemistry.chemical_element, Heterojunction, Nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Bevel, Ion, Semiconductor, Ion beam deposition, chemistry, Optoelectronics, General Materials Science, business
-
12
المؤلفون: J. Klatt, Eberhard Bugiel, S. Nilsson, H.P. Zeindl, U. Jagdhold, D. Krüger, R. Kurps
المصدر: Applied Surface Science. 102:107-111
مصطلحات موضوعية: Photoluminescence, Chemistry, Analytical chemistry, General Physics and Astronomy, Surfaces and Interfaces, General Chemistry, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Molecular physics, Surfaces, Coatings and Films, Secondary ion mass spectrometry, Diffusion process, Lattice (order), Molecular beam, Quantum well
-
13
المؤلفون: H.P. Zeindl, R. Kurps, J. Klatt, S. Nilsson, D. Krüger
المصدر: Journal of Crystal Growth. 157:31-35
مصطلحات موضوعية: Photoluminescence, Chemistry, Analytical chemistry, Heterojunction, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Condensed Matter Physics, Epitaxy, Inorganic Chemistry, Secondary ion mass spectrometry, Condensed Matter::Materials Science, Pulmonary surfactant, Materials Chemistry, Molecular beam, Quantum well, Molecular beam epitaxy
-
14
المؤلفون: U. Jagdhold, R. Kurps, H.P. Zeindl, D. Krüger
المصدر: Journal of Applied Physics. 78:5008-5012
مصطلحات موضوعية: Diffusion equation, Materials science, Silicon, Condensed matter physics, Annealing (metallurgy), Superlattice, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Crystallographic defect, Condensed Matter::Materials Science, Ion implantation, chemistry, Molecular beam epitaxy
-
15
المؤلفون: Frank Herzel, Karl-Ernst Ehwald, Bernd Heinemann, R. Kurps, Wilfried Röpke, D. Krüger, Hans-Peter Zeindl
المصدر: Surface and Interface Analysis. 23:764-770
مصطلحات موضوعية: Materials science, Dopant, business.industry, Annealing (metallurgy), Bipolar junction transistor, Analytical chemistry, chemistry.chemical_element, Heterojunction, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, symbols.namesake, Fourier transform, chemistry, Materials Chemistry, symbols, Optoelectronics, Deconvolution, business, Boron, Molecular beam epitaxy
-
16
المؤلفون: H.P. Zeindl, D. Krüger, U. Jagdhold, R. Kurps
المصدر: Solid State Phenomena. :313-318
مصطلحات موضوعية: Profiling (computer programming), Materials science, business.industry, Delta doping, Analytical chemistry, Optoelectronics, General Materials Science, Point (geometry), Condensed Matter Physics, Thermal diffusivity, business, Atomic and Molecular Physics, and Optics
-
17
المؤلفون: R. Kurps, H.P. Zeindl, D. Krüger, Klaus Schmalz, Th. Morgenstern
المصدر: Solid State Phenomena. :171-176
مصطلحات موضوعية: Materials science, Getter, Metallurgy, Heat treated, General Materials Science, Condensed Matter Physics, Atomic and Molecular Physics, and Optics
-
18
المؤلفون: J. Schlote, Ch. Quick, R. Kurps, W. Ropke, D. Krüger
المصدر: Microelectronic Engineering. 26:119-129
مصطلحات موضوعية: Amorphous silicon, Materials science, Dopant, Silicon, Doping, Analytical chemistry, Mineralogy, chemistry.chemical_element, Chemical vapor deposition, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Amorphous solid, chemistry.chemical_compound, chemistry, Electrical and Electronic Engineering, Diffusion (business), p–n junction
-
19
المؤلفون: R. Kurps, P. Gaworzewski, J. Schlote, D. Krüger
المصدر: Semiconductor Science and Technology. 10:326-331
مصطلحات موضوعية: Spreading resistance profiling, Silicon, Binding energy, Doping, Analytical chemistry, chemistry.chemical_element, Substrate (electronics), Condensed Matter Physics, Electronic, Optical and Magnetic Materials, X-ray photoelectron spectroscopy, chemistry, Materials Chemistry, Charge carrier, Electrical and Electronic Engineering, Layer (electronics)
-
20
المؤلفون: D. Krüger, R. Kurps, P. Gaworzewski, H.P. Zeindl, H. Rücker
المصدر: Journal of Applied Physics. 75:7869-7874
مصطلحات موضوعية: Materials science, Spreading resistance profiling, Silicon, chemistry, Dopant, Electrical resistivity and conductivity, Doping, Analytical chemistry, General Physics and Astronomy, chemistry.chemical_element, Epitaxy, Boron, Molecular beam epitaxy