المؤلفون: J. Viallon, S. Lee, P. Moussay, K. Tworek, M. Petersen, R. I. Wielgosz

المصدر: Atmospheric Measurement Techniques, Vol 8, Iss 3, Pp 1245-1257 (2015)

مصطلحات موضوعية: Environmental engineering, TA170-171, Earthwork. Foundations, TA715-787

وصف الملف: electronic resource

Relation: http://www.atmos-meas-tech.net/8/1245/2015/amt-8-1245-2015.pdf; https://doaj.org/toc/1867-1381; https://doaj.org/toc/1867-8548

URL الوصول: https://doaj.org/article/c6c9b925f3b846349aa1fef9f34135c1

المؤلفون: J Viallon, T Choteau, E Flores, F Idrees, P Moussay, R I Wielgosz, J S Lim, Jeongsoon Lee, Jinbok Lee, Dongmin Moon, J I T van Wijk, S Persijn, A M H van der Veen, O V Efremova, L Konopelko, Y Kustikov, A Kolobova, A Klimov, Z Bi, C Cecelski, J Carney, B Toman, A Possolo, B Hall, P Brewer, D Worton, K Saarnio, H Aaltonen, J Tshilongo, D Mphara Mogale, G Mphaphuli, P Mohweledi Marebane

المصدر: Metrologia. 60:08011

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::345fe585c1d1ee47f58bb44c11a71173
https://doi.org/10.1088/0026-1394/60/1a/08011

المؤلفون: J Viallon, T Choteau, E Flores, F Idrees, P Moussay, R I Wielgosz, Christina M Harth, Myriam Guillevic, Ray F Weiss, B Hall, J S Lim

المصدر: Metrologia. 60:08013

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::06792d2c08631cdba71e47def201db5f
https://doi.org/10.1088/0026-1394/60/1a/08013

المؤلفون: The Decc Nsw, The Bipm, J. Viallon, P. Moussay, R. I. Wielgosz, G. Ross, Joële Viallon, Robert Wielgosz, Glenn Ross

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.bipm.net/utils/common/pdf/rapportBIPM/2009/03.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.566.1540; http://www.bipm.net/utils/common/pdf/rapportBIPM/2009/03.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.566.1540
http://www.bipm.net/utils/common/pdf/rapportBIPM/2009/03.pdf

المؤلفون: R D Josephs, Q Liu, G Martos, M Bedu, A Daireaux, T Choteau, S Westwood, R I Wielgosz, J Nammoonnoy, W Zhang, S Yong, H Liu, Y Chen, C Y Ng, T Lu, J Wang, H W Leung, T L Teo, X Gong, X Dai, W Xia, L Feng, J Xie, T Peng, X Fang, L Wu, C Li, J Song, M Li, H Li, H Lee, I Ün, M Bilsel, M Öztug, E Saban, M Akgöz

المصدر: Metrologia. 59:08014

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c22cd8e583ae88298f56f878c04e68a9
https://doi.org/10.1088/0026-1394/59/1a/08014

المؤلفون: R D Josephs, Q Liu, G Martos, M Bedu, A Daireaux, T Choteau, S Westwood, R I Wielgosz, J Nammoonnoy, W Zhang, S Yong, H Liu, Y Chen, C Y Ng, T Lu, J Wang, H W Leung, T L Teo, R Zhai, X Dai, Z Chu, X Fang, T Peng, J Xie, W Mi, M Zhu, Y Liu, M Li, L Wu, H Li, H Lee, I Ün, M Bilsel, M Öztug, E Saban, M Akgöz

المصدر: Metrologia. 59:08007

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::234d1a0d29dd2d057721f730605bd4f1
https://doi.org/10.1088/0026-1394/59/1a/08007

المؤلفون: R D Josephs, Q Liu, G Martos, M Bedu, A Daireaux, T Choteau, S Westwood, R I Wielgosz, J Nammoonnoy, W Zhang, S Yong, H Liu, Y Chen, C Y Ng, T Lu, J Wang, H W Leung, T L Teo, R Zhai, X Dai, Z Chu, X Fang, T Peng, J Xie, W Mi, M Zhu, Y Liu, M Li, L Wu, H Li, P J Beltrão, S M Naressi Scapin, Y Bacila Sade, A Bahadoor, B B Stocks, M-P Thibeault, J E Melanson, C Giangrande, V Delatour, A Boeuf, H Vaneeckhoutte, R Ohlendorf, G O'Connor, A Henrion, K Saikusa, T Kinumi, M Öztug, E Saban, M Akgöz, M Quaglia, K Groves, C Clarkson, G Drinkwater, D Rupérez Cebolla

المصدر: Metrologia. 59:08006

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e627c2db6ac52100dc7542f69ad5703
https://doi.org/10.1088/0026-1394/59/1a/08006

المؤلفون: R D Josephs, M Bedu, A Daireaux, Xiuqin Li, Xiaomin Li, Z Guo, Xianjiang Li, T Choteau, G Martos, S Westwood, R I Wielgosz, H Li, M Simón, C Santana Smersu, M Villarreal, T Lopez Seal, M Cirio, E C P do Rego, R Leal, L Carvalho, J M Rodrigues, E Guimarães, B C Garrido, L Morales Erazo, S Ramirez, I Gonzalez, P Giannikopoulou, C Alexopoulos, E Kakoulides, I Mugenya, D Prevoo-Franzsen, M Fernandes-Whaley, S Marbumrung, J Nammoonnoy, K Shearman, C Boonyakong, H Klich, R Torkhani, T Gokcen, M Bilsel, S Akkus Ozen, J Cea, O Martínez

المصدر: Metrologia. 59:08002

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a778230ceea0eec0ef3c886cfd5a67f1
https://doi.org/10.1088/0026-1394/59/1a/08002

المؤلفون: R D Josephs, Q Liu, G Martos, M Bedu, A Daireaux, T Choteau, S Westwood, R I Wielgosz, J Nammoonnoy, W Zhang, S Yong, H Liu, Y Chen, C Y Ng, T Lu, J Wang, H W Leung, T L Teo, X Gong, X Dai, W Xia, L Feng, J Xie, T Peng, X Fang, L Wu, C Li, J Song, M Li, H Li, P J Beltrão, S M Naressi Scapin, Y Bacila Sade, A Bahadoor, B B Stocks, M-P Thibeault, J E Melanson, C Giangrande, V Delatour, A Boeuf, H Vaneeckhoutte, R Ohlendorf, G O'Connor, A Henrion, W-H Fung, Y-T Wong, K Saikusa, T Yamasaki, T Kinumi, M Öztug, E Saban, M Akgöz, M Quaglia, K Groves, C Clarkson, G Drinkwater, D Rupérez Cebolla

المصدر: Metrologia. 59:08013

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb1503eaf62c76469e2898f275c672e2
https://doi.org/10.1088/0026-1394/59/1a/08013

المؤلفون: W Mi, R D Josephs, J E Melanson, X Dai, Y Wang, R Zhai, Z Chu, X Fang, M-P Thibeault, B B Stocks, J Meija, M Bedu, G Martos, S Westwood, R I Wielgosz, Q Liu, T L Teo, H Liu, Y J Tan, M Öztuğ, E Saban, T Kinumi, K Saikusa, R J Schneider, M G Weller, Z Konthur, C Jaeger, M Quaglia, C Mussell, G Drinkwater, C Giangrande, H Vaneeckhoutte, A Boeuf, V Delatour, J E Lee, G O'Connor, R Ohlendorf, A Henrion, P J Beltrão, S M Naressi Scapin, Y B Sade

المصدر: Metrologia. 59:08001

مصطلحات موضوعية: General Engineering

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0dd251348018058a524ea2cbdeb2c80e
https://doi.org/10.1088/0026-1394/59/1a/08001

المؤلفون: The Chmi, The Bipm, J. Viallon, P. Moussay, R. I. Wielgosz, J. Novak, M. Vokoun

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www.bipm.org/utils/common/pdf/rapportBIPM/2007/05.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.514.7522; http://www.bipm.org/utils/common/pdf/rapportBIPM/2007/05.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.514.7522
http://www.bipm.org/utils/common/pdf/rapportBIPM/2007/05.pdf

المؤلفون: The Chmi, The Bipm, J. Viallon, P. Moussay, R. I. Wielgosz, J. Novak, M. Vokoun

المساهمون: The Pennsylvania State University CiteSeerX Archives

المصدر: http://www1.bipm.org/utils/common/pdf/rapportBIPM/2005/05.pdf.

وصف الملف: application/pdf

Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.511.9930; http://www1.bipm.org/utils/common/pdf/rapportBIPM/2005/05.pdf

الاتاحة: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.511.9930
http://www1.bipm.org/utils/common/pdf/rapportBIPM/2005/05.pdf

المؤلفون: J Viallon, E Flores, F Idrees, P Moussay, R I Wielgosz, S H Oh, S Lee, B M Kim, G Nieuwenkamp, A Van der Veen, O V Efremova, L A Konopelko, Y A Kustikov, A V Kolobova, H Shuguo, J Carney, M E Kelley, G C Rhoderick, J T Hodges, S Uehara, D Akima, P Brewer, D Worton, S Van Aswegen, T Macé, D Smeulders, J Fükö, N Ntsasa, N Leshabane, K Ramahala, J Tshilongo, D Cieciora, T Shimosaka, N Matsumoto

المصدر: Metrologia. 57:08001

مصطلحات موضوعية: chemistry.chemical_compound, Chemistry, Environmental chemistry, General Engineering, chemistry.chemical_element, Nitrogen, Nitric oxide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9096dde4ba8f27b62d5a5ad4b9b90ec5
https://doi.org/10.1088/0026-1394/57/1a/08001

المؤلفون: C. Ferrero, R. I. Wielgosz BIPM, H. Bettin PTB, R. Kaarls CIPM, Paul De Bièvre MiC, M. Priel LNE, Fisicaro LNE, W. Bich INRIM, M. Sega INRIM, S. D’Emilio INRIM, J. Choi KRISS

الاتاحة: https://dx.doi.org/10.13140/rg.2.2.15762.86722
http://rgdoi.net/10.13140/RG.2.2.15762.86722

المؤلفون: J. Viallon, S. Lee, P. Moussay, K. Tworek, M. Petersen, R. I. Wielgosz

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d121bba1d1dedc850d0697b7967da0c8
https://doi.org/10.5194/amtd-7-8067-2014

المؤلفون: L.M. Peter, R. I. Wielgosz, D. J. Riley

المصدر: Thin Solid Films. 276:61-64

مصطلحات موضوعية: inorganic chemicals, In situ, Photoluminescence, Materials science, Silicon, technology, industry, and agriculture, Metals and Alloys, Mineralogy, chemistry.chemical_element, Surfaces and Interfaces, Electron, equipment and supplies, Porous silicon, complex mixtures, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Hydrofluoric acid, chemistry, Chemical engineering, Electrode, Materials Chemistry, Leaching (metallurgy)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d21ea84664b84c1d8d3f9fb7e3ef9d95
https://doi.org/10.1016/0040-6090(95)08046-5

المؤلفون: Richard V. Penty, Ian H. White, P. A. Snow, E.A. Meulenkamp, D. J. Riley, R. I. Wielgosz, L.M. Peter

المصدر: Thin Solid Films. 276:123-129

مصطلحات موضوعية: Quenching, Photoluminescence, Chemistry, business.industry, Metals and Alloys, Surfaces and Interfaces, Electrolyte, Electron, Electroluminescence, Porous silicon, Molecular physics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Auger, Optics, Materials Chemistry, business, Luminescence

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ff4bfb61baf4f00043e87328d8d769f3
https://doi.org/10.1016/0040-6090(95)08039-2

المؤلفون: L.M. Peter, D. J. Riley, R. I. Wielgosz, E.A. Meulenkamp

المصدر: Journal of Electroanalytical Chemistry. 392:97-100

مصطلحات موضوعية: Photoluminescence, Condensed matter physics, Chemistry, business.industry, General Chemical Engineering, Electrochemistry, Optoelectronics, Electroluminescence, Porous silicon, business, Mechanism (sociology), Analytical Chemistry, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::27b6bd525b76a0559f91d7c195c52826
https://doi.org/10.1016/0022-0728(95)04073-w

المؤلفون: R. I. Wielgosz

المصدر: Accreditation and Quality Assurance. 6:B329-B331

مصطلحات موضوعية: Engineering, Chemical measurement, business.industry, General Chemical Engineering, Comparability, Mechanical engineering, General Chemistry, Amount of substance, Data science, Task (project management), Metrology, Safety, Risk, Reliability and Quality, Mutual recognition, business, Instrumentation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6795a285956240ffd685da691ce01fa4
https://doi.org/10.1007/pl00010458

المؤلفون: L. M. Peter, R. I. Wielgosz

المصدر: Applied Physics Letters. 69:806-808

مصطلحات موضوعية: Quenching, Materials science, Physics and Astronomy (miscellaneous), Silicon, business.industry, chemistry.chemical_element, Substrate (electronics), Electroluminescence, Porous silicon, Persulfate, Ion, chemistry, Optoelectronics, business, Ohmic contact

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::14daccb9b1dcb27fd0b13b2da40e0b37
https://doi.org/10.1063/1.117898