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1
المؤلفون: Ivana Capan, Lis K. Nanver, Tomislav Suligoj, Tihomir Knezevic
المساهمون: Integrated Devices and Systems
المصدر: IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices, 68(6), 2810-2817. IEEEمصطلحات موضوعية: Junctions, ultrashallow junctions, Silicon, Materials science, chemistry.chemical_element, pure boron (PureB) diodes, 01 natural sciences, law.invention, Single-photon avalanche diodes, law, 0103 physical sciences, Doping, Breakdown voltage, interface charge, photodiode, Electrical and Electronic Engineering, Photodiodes, Diode, 010302 applied physics, Equivalent series resistance, business.industry, cryogenic measurement, Schottky diode, Computational modeling, Electronic, Optical and Magnetic Materials, Photodiode, thin-film boron layers, chemistry, Performance evaluation, Optoelectronics, single-photon avalanche diode (SPAD), business, Aluminum, Dark current
وصف الملف: application/pdf
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2Academic Journal
المؤلفون: Fang, CM, Mohammadi, V, Nihtianov, S, Sluiter, MHF
مصطلحات موضوعية: borane deposition, H passivated Si(0 0 1) surface, PureB process, ab initio calculations
وصف الملف: 253 - 260; Print-Electronic
Relation: Computational Materials Science; Fang, C.M. et al. (2017) 'Stability, local structure and electronic properties of borane radicals on the Si(1 0 0)', Computational Materials Science, 140: pp. 253 - 260. doi:10.1016/j.commatsci.2017.08.036.; https://bura.brunel.ac.uk/handle/2438/15293; https://doi.org/10.1016/j.commatsci.2017.08.036
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3Academic Journal
المؤلفون: Tihomir Knežević, Lis K. Nanver, Tomislav Suligoj
المصدر: Photonics, Vol 3, Iss 4, p 54 (2016)
مصطلحات موضوعية: silicon drift detector, deep trench etching, PureB photodiodes, cross-talk, multi-cell drift detector arrays, high count rate, X-ray detection, Applied optics. Photonics, TA1501-1820
Relation: http://www.mdpi.com/2304-6732/3/4/54; https://doaj.org/toc/2304-6732; https://doaj.org/article/f7d9bfdff55d4fb8878046988b392ee2
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4
المؤلفون: Erwin Hardeveld, Tomislav Suligoj, Xingyu Liu, Lis K. Nanver, Tihomir Knezevic
المصدر: IEEE electron device letters, 40(6):8686173, 858-861. IEEE
مصطلحات موضوعية: Silicon, Materials science, Analytical chemistry, chemistry.chemical_element, Chemical vapor deposition, 01 natural sciences, Photodiode, Ultrashallow junctions, Saturation current, 0103 physical sciences, Monolayer, Electron injection, Electrical and Electronic Engineering, Boron, Quantum tunnelling, Diode, 010302 applied physics, chemical-vapor deposition, electron injection, monolayer, photodiodes, pure boron, silicon, ultrashallow junction, Chemical-vapor deposition, 22/4 OA procedure, Acceptor, Pure boron (PureB), Electronic, Optical and Magnetic Materials, chemistry
وصف الملف: application/pdf
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5Academic Journal
المؤلفون: Thammaiah, Shivakumar, Liu, Xingyu, Knežević, Tihomir, M. Batenburg, Kevin, Aarnink, A.A.I., Nanver, Lis Karen
المصدر: Thammaiah , S , Liu , X , Knežević , T , M. Batenburg , K , Aarnink , A A I & Nanver , L K 2021 , ' PureB diode fabrication using physical or chemical vapor deposition methods for increased back-end-of-line accessibility ' , Elsevier , vol. 177 , 107938 . https://doi.org/10.1016/j.sse.2020.107938
مصطلحات موضوعية: Batch furnace, Chemical-vapor deposition (CVD), Electron-beam-assisted physical-vapor, Pure boron (PureB), Ultra-shallow junctions
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6
المؤلفون: Marković, Lovro
المساهمون: Poljak, Mirko
مصطلحات موضوعية: Junction, PureB-on-Ge, TEHNIČKE ZNANOSTI. Elektrotehnika, Schottky, Fotodetektor, PureB, PureB-on-Si, Heterospoj, Electron, Blocking, Ultra-shallow, Shallow, TECHNICAL SCIENCES. Electrical Engineering, Heterojunction, Photodetector
وصف الملف: application/pdf
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7
المؤلفون: Tomašić, Filip
المساهمون: Suligoj, Tomislav
مصطلحات موضوعية: FERSAT, PIN fotodioda, tamna struja, TEHNIČKE ZNANOSTI. Elektrotehnika, dark current, TIA, ultraviolet light, PureB fotodetektor, TECHNICAL SCIENCES. Electrical Engineering, PureB detector, PIN photodiode, ultraljubičasto zračenje, transient analysis, tranzijentna analiza
وصف الملف: application/pdf
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8
المؤلفون: Kneževic, Tihomir, Suligoj, Tomislav, Nanver, Lis K., Skala, Karolj, Car, Zeljka, Pale, Predrag, Huljenic, Darko, Janjic, Matej, Koricic, Marko, Sruk, Vlado, Ribaric, Slobodan, Grbac, Tihana Galinac, Butkovic, Zeljko, Cicin-Sain, Marina, Skvorc, Dejan, Mauher, Mladen, Babic, Snjezana, Gros, Stjepan, Vrdoljak, Boris, Tijan, Edvard
المساهمون: Integrated Devices and Systems
المصدر: MIPRO
2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019-Proceedings, 24-29
STARTPAGE=24;ENDPAGE=29;TITLE=2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019-Proceedingsمصطلحات موضوعية: Carrier injection, Electron mobility, Materials science, Band gap, chemistry.chemical_element, Negative fixed interface charge, 02 engineering and technology, Electron, PureB, 01 natural sciences, Condensed Matter::Materials Science, Saturation current, Electron affinity, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Boron, Diode, 010302 applied physics, TCAD, Carrier injection, Negative fixed interface charge, Pure amorphous boron, PureB, TCAD, Ultra-thin-layer, business.industry, Semiconductor, chemistry, Pure amorphous boron, Optoelectronics, 020201 artificial intelligence & image processing, business, Ultra-thin-layer
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9
المؤلفون: Max Krakers, K.M. Batenburg, Lis K. Nanver, Tihomir Knezevic, Xingyu Liu
المساهمون: MESA+ Institute, Integrated Devices and Systems, Power Electronics
المصدر: 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020-Proceedings
مصطلحات موضوعية: 010302 applied physics, Avalanche mode, Materials science, Distribution (number theory), business.industry, Physics::Instrumentation and Detectors, 22/3 OA procedure, 02 engineering and technology, 01 natural sciences, Rapid assessment, 020210 optoelectronics & photonics, Material defect, Test structure, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Light emission, avalanche diode, SPAD, PureB, light emission, defects, business, Diode
وصف الملف: application/pdf
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10
المؤلفون: Jelačić, Borna
المساهمون: Suligoj, Tomislav
مصطلحات موضوعية: infracrveno, germanium, amorfni bor, TECHNICAL SCIENCES. Electrical Engineering, germanij, TEHNIČKE ZNANOSTI. Elektrotehnika, infrared, amorphous boron, lavinska fotodioda, pureB, avalanche photodiode
وصف الملف: application/pdf
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11
المؤلفون: Knežević, Tihomir
المساهمون: Suligoj, Tomislav
مصطلحات موضوعية: dark count rate modeling, indirect optical crosstalk reduction, drift detektori, electrical characterization, Elektrotehnika, 2D DCR modeling, udc:621.3(043.3), PureB, nisko-temperaturna mjerenja, low-temperature measurements, spectroscopic ellipsometry, detektori za detekciju jednog fotona temeljenih na lavinskoj multiplikaciji, tunneling, perimeter effects, XPS, indirektno optičko preslušavanje, električka karakterizacija, 2D DCR, fotoemisija X-zrakama, periferni efekti, single photon avalanche diodes, guard ring optimization, material characterization, SPAD array, drift detectors, variable range hopping conduction, PureB, material characterization, X-ray photoemission spectroscopy, XPS, spectroscopic ellipsometry, electrical characterization, low-temperature measurements, PureB model, variable range hopping conduction, tunneling, guard ring optimization, perimeter effects, single photon avalanche diodes, SPAD, SPAD array, dark count rate modeling, 2D DCR modeling, indirect optical crosstalk reduction, drift detectors, DCR, TECHNICAL SCIENCES. Electrical Engineering. Electronics, SPAD, optimizacija zaštitnih prstenova, modeliranje brzine generacije tamnih impulsa, TEHNIČKE ZNANOSTI. Elektrotehnika. Elektronika, PureB model, tuneliranje, Electrical engineering, karakterizacija materijala, spektroskopska elipsometrija, X-ray photoemission spectroscopy
وصف الملف: application/pdf
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12
المؤلفون: Željko Osrečki, Lis K. Nanver, Tomislav Suligoj, Tihomir Knežević
المصدر: Optical and quantum electronics, 50(3):152. Springer
مصطلحات موضوعية: Materials science, UT-Hybrid-D, 02 engineering and technology, 01 natural sciences, PureB, Crosstalk, 020210 optoelectronics & photonics, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Single-photon avalanche diode (SPAD), SPAD array, Indirect optical crosstalk, Wafer, Electrical and Electronic Engineering, Computer communication networks, 010302 applied physics, Avalanche diode, business.industry, Doping, Atomic and Molecular Physics, and Optics, n/a OA procedure, Electronic, Optical and Magnetic Materials, Single-photon avalanche diode, Optoelectronics, business
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13
مصطلحات موضوعية: X-ray detector, silicon interposer package, boron layer, silicon drift detector, PureB SDD, continuous SDD, on-chip front-end electronics, thin entrance window SDD, ZrN diffusion barrier, dual PureB layer, PureB JFET, constant field SDD, PureB high-Ohmic resistor
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14
المؤلفون: Golshani, N.
المساهمون: Beenakker, C.I.M., Ishihara, R.
المصدر: None
مصطلحات موضوعية: X-ray detector, silicon interposer package, boron layer, silicon drift detector, PureB SDD, continuous SDD, on-chip front-end electronics, thin entrance window SDD, ZrN diffusion barrier, dual PureB layer, PureB JFET, constant field SDD, PureB high-Ohmic resistor
وصف الملف: application/pdf
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15
المؤلفون: Osrečki, Željko, Knežević, Tihomir, Nanver, Lis K., Suligoj, Tomislav
المساهمون: Piprek, Joachim
مصطلحات موضوعية: single-photon avalanche diode (SPAD), SPAD array, PureB, Indirect optical crosstalk
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16
المؤلفون: Changming Fang, Stoyan Nihtianov, Marcel H. F. Sluiter, V. Mohammadi
المصدر: Computational Materials Science, 140(Supplement C)
مصطلحات موضوعية: General Computer Science, Band gap, General Physics and Astronomy, 02 engineering and technology, Electronic structure, Borane, 01 natural sciences, chemistry.chemical_compound, Ab initio quantum chemistry methods, Computational chemistry, 0103 physical sciences, General Materials Science, PureB process, Borane deposition, H passivated Si(001) surface, Deposition (law), 010302 applied physics, Relaxation (NMR), General Chemistry, 021001 nanoscience & nanotechnology, Computational Mathematics, chemistry, Chemical bond, Mechanics of Materials, Chemical physics, Ab initio calculations, Absorption (chemistry), 0210 nano-technology
وصف الملف: application/pdf
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17
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18
المؤلفون: Qi, L.
المساهمون: Nanver, L.K.
المصدر: None
مصطلحات موضوعية: SPAD, UV detection, Low-energy-electron detection, Si Photodiodes, PureB
وصف الملف: application/pdf
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19Conference
المؤلفون: Mok, K.R.C. (author), Nanver, L.K. (author), De Boer, W.D. (author), Vlooswijk, A.H.G. (author)
مصطلحات موضوعية: pureB, ultrashallow junction
Relation: Proceedings ICT.OPEN: Micro technology and micro devices (SAFE 2011), Veldhoven, Nov. 14-15, 2011, 1-3; http://resolver.tudelft.nl/uuid:a99550fe-6785-4db2-93d2-2b85ae1ab8ea
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20
المؤلفون: Suligoj, Tomislav, Knežević Tihomir, Poljak, Mirko, Žonja, Sanja, Žilak, Josip
مصطلحات موضوعية: Condensed Matter::Materials Science, Physics::Accelerator Physics, amorphous boron, PureB, Raman spectroscopy, ellipsometry, electrical measurements