المؤلفون: Jan Sobieski, Małgorzata Kopytko, Kacper Matuszelański, Waldemar Gawron, Józef Piotrowski, Piotr Martyniuk

المصدر: Sensors, Vol 24, Iss 9, p 2837 (2024)

مصطلحات موضوعية: HgCdTe, infrared detectors, MOCVD growth, interdiffused multilayer process, residual inhomogeneities, post-growth annealing, Chemical technology, TP1-1185

Relation: https://www.mdpi.com/1424-8220/24/9/2837; https://doaj.org/toc/1424-8220; https://doaj.org/article/c206cf405a764e98bb4163e628960075

الاتاحة: https://doi.org/10.3390/s24092837
https://doaj.org/article/c206cf405a764e98bb4163e628960075

المؤلفون: Ranjan Singhal, Elena Echeverria, David N. McIlroy, Raj N. Singh

المصدر: Results in Materials, Vol 16, Iss , Pp 100339- (2022)

مصطلحات موضوعية: Hexagonal boron nitride, Post-growth annealing, CVD, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2590048X22000875; https://doaj.org/toc/2590-048X

URL الوصول: https://doaj.org/article/09b21aca84dc49569b30f0493cabebbf

المؤلفون: Marcos V. Puydinger dos Santos, Aleksandra Szkudlarek, Artur Rydosz, Carlos Guerra-Nuñez, Fanny Béron, Kleber R. Pirota, Stanislav Moshkalev, José Alexandre Diniz, Ivo Utke

المصدر: Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 91-101 (2018)

مصطلحات موضوعية: copper, gold, cobalt, focused-electron-beam-induced deposition, noble metal, non-noble metals, post-growth annealing, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/9618a1fd6ade49b3bc9b39ded21db996

المؤلفون: Tannoury, Charbel, Billet, Maximilien, Coinon, Christophe, Lampin, Jean-Francois, Peytavit, Emilien

المساهمون: Laboratoire de Physique des Lasers, Atomes et Molécules - UMR 8523 (PhLAM), Université de Lille-Centre National de la Recherche Scientifique (CNRS), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Centrale de Micro Nano Fabrication - IEMN (CMNF - IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Photonique THz - IEMN (PHOTONIQUE THZ - IEMN), This work was supported by the French Defense Agency DGA (Direction générale de l'armement), RENATECH (French Network of Major Technology Centres), Lille University, and the ‘Région Hauts‐de‐France’., Renatech Network, PCMP CHOP, CMNF

المصدر: ISSN: 0013-5194.

مصطلحات موضوعية: annealing, gallium arsenide, photoconducting materials, carrier lifetime, III‐V semiconductors, low‐temperature‐grown gallium arsenide photoconductors, subpicosecond carrier lifetime, photoresponse, CW excitation, photoresponses, continuous‐wave, 1550‐nm‐wavelength illumination, optical Fabry‐Perot cavity, post‐growth annealing temperature, external quantum efficiency, temperature 450.0 degC, wavelength 1550.0 nm, GaAs, [SPI]Engineering Sciences [physics]

Relation: hal-02997766; https://hal.science/hal-02997766; https://hal.science/hal-02997766/document; https://hal.science/hal-02997766/file/ELL-2020-1116.pdf; WOS: 000565251000019

الاتاحة: https://hal.science/hal-02997766
https://hal.science/hal-02997766/document
https://hal.science/hal-02997766/file/ELL-2020-1116.pdf
https://doi.org/10.1049/el.2020.1116

المؤلفون: Tominov, R.V., Vakulov, Z.E., Avilov, V.I., Khakhulin, D.A., Fedotov, A.A., Zamburg, E.G., Smirnov, V.A., Ageev, O.A.

المساهمون: ELECTRICAL AND COMPUTER ENGINEERING

المصدر: Scopus OA2020

مصطلحات موضوعية: Memristor, Nanocrystalline ZnO, Neuromorphic systems, Post-growth annealing, Pulsed laser deposition, ReRAM, Resistive switching

Relation: Tominov, R.V., Vakulov, Z.E., Avilov, V.I., Khakhulin, D.A., Fedotov, A.A., Zamburg, E.G., Smirnov, V.A., Ageev, O.A. (2020). Synthesis and memristor effect of a forming-free zno nanocrystalline films. Nanomaterials 10 (5) : 1007. ScholarBank@NUS Repository. https://doi.org/10.3390/nano10051007; https://scholarbank.nus.edu.sg/handle/10635/198107

الاتاحة: https://scholarbank.nus.edu.sg/handle/10635/198107

المؤلفون: Roman V. Tominov, Zakhar E. Vakulov, Vadim I. Avilov, Daniil A. Khakhulin, Aleksandr A. Fedotov, Evgeny G. Zamburg, Vladimir A. Smirnov, Oleg A. Ageev

المصدر: Nanomaterials; Volume 10; Issue 5; Pages: 1007

مصطلحات موضوعية: neuromorphic systems, memristor, ReRAM, resistive switching, nanocrystalline ZnO, pulsed laser deposition, post-growth annealing

وصف الملف: application/pdf

Relation: Synthesis, Interfaces and Nanostructures; https://dx.doi.org/10.3390/nano10051007

الاتاحة: https://doi.org/10.3390/nano10051007

المؤلفون: Rehman, U., Mahmood, K., Ali, A., Ikram, S.

المصدر: Journal of Materials and Physical Sciences; Vol. 1 No. 2 (2020): December 2020; 78 - 86 ; 2791-0601 ; 2791-0598

مصطلحات موضوعية: ZnO, ZTO, Seebeck coefficient, Power factor, Post growth annealing

وصف الملف: application/pdf

Relation: https://journals.internationalrasd.org/index.php/jmps/article/view/608/348; https://journals.internationalrasd.org/index.php/jmps/article/view/608

الاتاحة: https://journals.internationalrasd.org/index.php/jmps/article/view/608
https://doi.org/10.52131/jmps.2020.0102.0008

المؤلفون: Aleksandra Szkudlarek, Alfredo Rodrigues Vaz, Yucheng Zhang, Andrzej Rudkowski, Czesław Kapusta, Rolf Erni, Stanislav Moshkalev, Ivo Utke

المصدر: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1508-1517 (2015)

مصطلحات موضوعية: Cu(hfac)2, Cu nanocrystals, focused electron beam induced deposition (FEBID), post-growth annealing of Cu–C material, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/d6eb5be31fb64186a20589f1214862a2

المؤلفون: Waurisch C, Hickey SG, Dzhagan VM, Yukhymchuk VO, Lytvyn OS, Valakh M, Lehmann D, Zahn DRT, Khodasevich IA, Chursanova MV

المصدر: Nanoscale Research Letters, Vol 5, Iss 2, Pp 403-409 (2009)

مصطلحات موضوعية: SERS, Ag/Si nanoisland films, Post-growth annealing, Rhodamine 6G, CdSe, Nanoparticles, Materials of engineering and construction. Mechanics of materials, TA401-492

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1931-7573; https://doaj.org/toc/1556-276X

URL الوصول: https://doaj.org/article/b1c9187d172e4867828214d0691e768b

المؤلفون: Szkudlarek, Aleksandra, Vaz, Alfredo Rodrigues, Zhang, Yucheng, Rudkowski, Andrzej, Kapusta, Czesław, Erni, Rolf, Moshkalev, Stanislav, Utke, Ivo

المصدر: Beilstein Journal of Nanotechnology, 6

مصطلحات موضوعية: Cu(hfac)(2), Cu nanocrystals, Focused electron beam induced deposition (FEBID), Post-growth annealing of Cu-C material

وصف الملف: application/application/pdf

Relation: info:eu-repo/semantics/altIdentifier/wos/000357786100001; http://hdl.handle.net/20.500.11850/102758

الاتاحة: https://hdl.handle.net/20.500.11850/102758
https://doi.org/10.3929/ethz-b-000102758

المؤلفون: Aleksandra Szkudlarek, Alfredo Rodrigues Vaz, Yucheng Zhang, Andrzej Rudkowski, Czesław Kapusta, Rolf Erni, Stanislav Moshkalev, Ivo Utke

المصدر: Beilstein Journal of Nanotechnology, Vol 6, Iss 1, Pp 1935-1936 (2015)

مصطلحات موضوعية: Cu(hfac)2, Cu nanocrystals, focused electron beam induced deposition (FEBID), post-growth annealing of Cu–C material, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

Relation: https://doi.org/10.3762/bjnano.6.196; https://doaj.org/toc/2190-4286; https://doaj.org/article/3070d761e1eb4649958936a745fe6595

الاتاحة: https://doi.org/10.3762/bjnano.6.196
https://doaj.org/article/3070d761e1eb4649958936a745fe6595

المؤلفون: C. Tannoury, Emilien Peytavit, C. Coinon, M. Billet, J.-F. Lampin

المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Centrale de Micro Nano Fabrication - IEMN (CMNF - IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Photonique THz - IEMN (PHOTONIQUE THz - IEMN), Renatech Network, Centrale de Micro Nano Fabrication - IEMN (CMNF-IEMN), Photonique THz - IEMN (PHOTONIQ THz - IEMN)

المصدر: 2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
2020 45th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nov 2020, Buffalo, NY, USA, United States. pp.1-1, ⟨10.1109/IRMMW-THz46771.2020.9370757⟩

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), Terahertz radiation, 02 engineering and technology, Post growth annealing, 021001 nanoscience & nanotechnology, 01 natural sciences, Gallium arsenide, Annealing, chemistry.chemical_compound, [SPI]Engineering Sciences [physics], chemistry, 0103 physical sciences, Optoelectronics, Quantum efficiency, Photoconducting materials, 010306 general physics, 0210 nano-technology, business, Excitation, ComputingMilieux_MISCELLANEOUS, Lighting

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5abf5c33b63c847d2ac781b4ffe895ce
https://hal.science/hal-03191465

المؤلفون: Jean-Francois Lampin, Charbel Tannoury, M. Billet, Emilien Peytavit, Christophe Coinon

المساهمون: Laboratoire de Physique des Lasers, Atomes et Molécules - UMR 8523 (PhLAM), Université de Lille-Centre National de la Recherche Scientifique (CNRS), Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Centrale de Micro Nano Fabrication - IEMN (CMNF-IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Photonique THz - IEMN (PHOTONIQ THz - IEMN), This work was supported by the French Defense Agency DGA (Direction générale de l'armement), RENATECH (French Network of Major Technology Centres), Lille University, and the ‘Région Hauts‐de‐France’., Renatech Network, PCMP CHOP, Centrale de Micro Nano Fabrication - IEMN (CMNF - IEMN), Photonique THz - IEMN (PHOTONIQUE THz - IEMN)

المصدر: Electronics Letters
Electronics Letters, IET, 2020, 56, pp.897-899. ⟨10.1049/el.2020.1116⟩
Electronics Letters, 2020, 56, pp.897-899. ⟨10.1049/el.2020.1116⟩

مصطلحات موضوعية: wavelength 1550.0 nm, Materials science, Annealing (metallurgy), 02 engineering and technology, Gallium arsenide, chemistry.chemical_compound, [SPI]Engineering Sciences [physics], CW excitation, external quantum efficiency, 0202 electrical engineering, electronic engineering, information engineering, photoresponse, Electrical and Electronic Engineering, optical Fabry‐Perot cavity, III‐V semiconductors, subpicosecond carrier lifetime, carrier lifetime, business.industry, 020208 electrical & electronic engineering, GaAs, photoconducting materials, 1550‐nm‐wavelength illumination, temperature 450.0 degC, photoresponses, Carrier lifetime, gallium arsenide, post‐growth annealing temperature, chemistry, continuous‐wave, low‐temperature‐grown gallium arsenide photoconductors, Optoelectronics, Continuous wave, Quantum efficiency, annealing, business, Excitation

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a25a6ff8cbedae1af1fba9749fc19284
https://hal.archives-ouvertes.fr/hal-02997766

المؤلفون: L. V. Yakovkina, Victor Ya. Prinz, Kirill E. Kapoguzov, S. V. Mutilin

المصدر: 2020 21st International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM).

مصطلحات موضوعية: Phase transition, Materials science, Annealing (metallurgy), 020502 materials, Analytical chemistry, 02 engineering and technology, Post growth annealing, Conductivity, 021001 nanoscience & nanotechnology, Vanadium dioxide, 0205 materials engineering, Metal insulator phase transition, Thin film, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::678a071567b7b13dfe86218f1fe791df
https://doi.org/10.1109/edm49804.2020.9153343

المؤلفون: Chursanova, M.V., Dzhagan, V.M., Yukhymchuk, V.O., Lytvyn, O.S., Valakh, M.Y., Khodasevich, I.A., Lehmann, D., Zahn, D.R.T., Waurisch, C., Hickey, S.G.

مصطلحات موضوعية: Ag/Si nanoisland films, CdSe, Nanoparticles, Post-growth annealing, Rhodamine 6G, SERS, Atomic force microscopy, Cadmium compounds, II-VI semiconductors, Metallic films, Raman spectroscopy, Nano-islands, Postgrowth annealing, Substrates

Time: 620

وصف الملف: application/pdf

الاتاحة: https://doi.org/10.34657/4112
https://oa.tib.eu/renate/handle/123456789/5483

المؤلفون: José Alexandre Diniz, Stanislav A. Moshkalev, Marcos Vinicius Puydinger dos Santos, Artur Rydosz, Aleksandra Szkudlarek, Kleber R. Pirota, Carlos Guerra-Nuñez, Fanny Béron, Ivo Utke

المصدر: Beilstein Journal of Nanotechnology, Vol 9, Iss 1, Pp 91-101 (2018)

مصطلحات موضوعية: Materials science, Annealing (metallurgy), General Physics and Astronomy, chemistry.chemical_element, 02 engineering and technology, engineering.material, lcsh:Chemical technology, 01 natural sciences, lcsh:Technology, Metal, Electrical resistance and conductance, 0103 physical sciences, General Materials Science, lcsh:TP1-1185, Graphite, Electrical and Electronic Engineering, noble metal, lcsh:Science, 010302 applied physics, non-noble metals, lcsh:T, gold, 021001 nanoscience & nanotechnology, Copper, cobalt, Nanocrystalline material, lcsh:QC1-999, Amorphous solid, Chemical engineering, chemistry, visual_art, copper, post-growth annealing, visual_art.visual_art_medium, engineering, focused-electron-beam-induced deposition, Noble metal, lcsh:Q, 0210 nano-technology, lcsh:Physics

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4fecb109edbd55a8e55584949962c436
https://doaj.org/article/9618a1fd6ade49b3bc9b39ded21db996

المؤلفون: Su-Na Fan, Weitao Zheng, Ming Li, Ren-Wei Liu

المصدر: RSC Advances. 7:3819-3822

مصطلحات موضوعية: Materials science, Electrochemical polymerization, Misorientation, Annealing (metallurgy), General Chemical Engineering, 02 engineering and technology, General Chemistry, Post growth annealing, 010402 general chemistry, 021001 nanoscience & nanotechnology, 01 natural sciences, 0104 chemical sciences, chemistry.chemical_compound, chemistry, Polyaniline, Electrode, Lamellar structure, Composite material, 0210 nano-technology

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e98a08c7d49703eca72bd8f358a31c2b
https://doi.org/10.1039/c6ra27538a

المؤلفون: Yadong Xu, Hui Li, Yuanyuan Du, Lijun Luan, Wanqi Jie, Pengfei Yu, Jiahong Zheng

المصدر: Journal of Crystal Growth. 451:194-199

مصطلحات موضوعية: 010302 applied physics, Materials science, Annealing (metallurgy), Detector, Analytical chemistry, Mineralogy, 02 engineering and technology, Post growth annealing, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Inorganic Chemistry, Crystal, Full width at half maximum, Electrical resistivity and conductivity, 0103 physical sciences, Materials Chemistry, Transmittance, 0210 nano-technology, Order of magnitude

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f700ed91da6529c3bf9318456018b0a8
https://doi.org/10.1016/j.jcrysgro.2016.07.009

المؤلفون: Hassen Maaref, Bouraoui Ilahi, Larbi Sfaxi, Niyaz Ahamad Madhar

المصدر: Crystals; Volume 8; Issue 5; Pages: 192

مصطلحات موضوعية: Materials science, Condensed matter physics, InAs quantum dots, strain reducing layer, carriers transfer, thermal annealing, Ingaas gaas, General Chemical Engineering, Thermal treatment, Post growth annealing, Condensed Matter Physics, Inorganic Chemistry, Laser linewidth, Quantum dot, Thermal, General Materials Science, Redistribution (chemistry)

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::641a33d85a7a48035e49f2441757d632

المؤلفون: A. Ben Hamida, H. W. Schumacher, K. Pierz, N. Liebing, S. Serrano-Guisan, S. Sievers

المصدر: Journal of the Magnetics Society of Japan. 2012, 36(1_2):49