نتائج البحث - "Pillatsch Lex"

Relation: info:eu-repo/grantAgreement/EC/H2020/722149/EU/Low energy ELEctron driven chemistry for the advantage of emerging NAno-fabrication methods/ELENA; This project has received funding from the European Unionâ€™s Horizon 2020 research and innovation program under grant agreement No H2020 722149-ELENA; info:eu-repo/grantAgreement/EC/H2020/872494/EU/Irradiation driven nanofabrication: computational modelling versus experiment/RADON; This project has received funding from the European Unionâ€™s Horizon 2020 research and innovation program under grant agreement No H2020 872494-RADON; http://zaguan.unizar.es/record/120173

الاتاحة: http://zaguan.unizar.es/record/120173
https://doi.org/10.3390/nano12152710

View record in BASE

6

Academic Journal

The Value of Light Element Imaging Using FIB-SIMS for Material Characterization at Nanometer Scales.

المؤلفون: Pillatsch, Lex, Riedo-Grimaudo, Valentine, Whitby, James, Pero, Renato, Randall, Nicholas, Baghernejad, Masoud

المصدر: Microscopy & Microanalysis; 2024 Supplement, Vol. 30, p1-4, 4p

Full Text Finder

7

Academic Journal

Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry and DualBeam FIB/SEM Imaging of Lithium-ion Battery Cathode

المؤلفون: Jiao, Chengge, Pillatsch, Lex, Mulders, Johannes, Wall, David

المصدر: Microscopy and Microanalysis ; volume 25, issue S2, page 876-877 ; ISSN 1431-9276 1435-8115

الاتاحة: https://doi.org/10.1017/s1431927619005117
https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927619005117

View record in BASE

8

Academic Journal

Multicomposite Nanostructured Hematite–Titania Photoanodes with Improved Oxygen Evolution: The Role of the Oxygen Evolution Catalyst

المؤلفون: Bärtsch, Mario, Sarnowska, Marta, Krysiak, Olga, Willa, Christoph, Huber, Christian, Pillatsch, Lex, Reinhard, Sandra, Niederberger, Markus, id_orcid:0 000-0001-6058-1183

المصدر: ACS Omega, 2 (8)

وصف الملف: application/application/pdf

Relation: info:eu-repo/semantics/altIdentifier/wos/000409924000052; http://hdl.handle.net/20.500.11850/227603

الاتاحة: https://hdl.handle.net/20.500.11850/227603
https://doi.org/10.3929/ethz-b-000227603

View record in BASE

9

Electronic Resource

In situ time-of-flight mass spectrometry of ionic fragments induced by focused electron beam irradiation: Investigation of electron driven surface chemistry inside an SEM under high vacuum

المؤلفون: European Commission, Swiss National Science Foundation, Jurczyk, Jakub, Pillatsch, Lex, Berger, Luisa, Priebe, Agnieszka, Madajska, Katarzyna, Kapusta, Czesław, Szymańska, Iwona B., Michler, Johann, Utke, Ivo

مصطلحات الفهرس: Ion extractor, Metalorganic compounds, Mass spectrometry, Ice lithography, Electron induced fragmentation, FEBID (Focused electron beam induced deposition), TOFSIMS (Time-of-flight secondary ions mass spectrometry), Lithography, FEBiMS, artículo

URL: http://hdl.handle.net/10261/303948
https://doi.org/10.3390/nano12152710
Nanomaterials
Publisher's version
The underlying dataset has been published as supplementary material of the article in the publisher platform at DOI 10.3390/nano12152710
https://doi.org/10.3390/nano12152710
Sí
info:eu-repo/grantAgreement/EC/H2020/722149
info:eu-repo/grantAgreement/EC/H2020/872494

View record in OAIster

10

Academic Journal

FIBSIMS: a review of secondary ion mass spectrometry for analytical dual beam focussed ion beam instruments

المؤلفون: Pillatsch, Lex, Östlund, Fredrik, Michler, Johann

مصطلحات موضوعية: FIBSIMS, TOF, SEM, FIB, EDS, 3D imaging

Relation: Progress in Crystal Growth and Characterization of Materials--Prog. Cryst. Growth Charact. Mater.--journals:5024--0960-8974--1878-4208; empa:18501; journal id: journals:5024; e-issn: 1878-4208; scopus: 2-s2.0-85058558928; ut: 000466621900001

الاتاحة: https://doi.org/10.1016/j.pcrysgrow.2018.10.001

View record in BASE

11

Book

Direct–write milling and deposition with noble gases

المؤلفون: Shorubalko, Ivan, Pillatsch, Lex, Utke, Ivo

المساهمون: Hlawacek, G., Gölzhäuser, A.

Relation: Helium ion microscopy; empa:8174; local: 20732; scopus: 2-s2.0-84990878493; ut: 000411334400016

الاتاحة: https://doi.org/10.1007/978-3-319-41990-9_15

View record in BASE

12

Academic Journal

In Situ Atomic Force Microscopy Depth-Corrected Three-Dimensional Focused Ion Beam Based Time-of-Flight Secondary Ion Mass Spectroscopy: Spatial Resolution, Surface Roughness, Oxidation.

المؤلفون: Pillatsch, Lex, Kalácska, Szilvia, Maeder, Xavier, Michler, Johann

المصدر: Microscopy & Microanalysis; Feb2021, Vol. 27 Issue 1, p65-73, 9p

Full Text Finder

13

Academic Journal

Comparison of silicon and 4H silicon carbide patterning using focused ion beams

المؤلفون: Veerapandian, Savita Kaliya Perumal, Beuer, Susanne, Rumler, Maximilian, Stumpf, Florian, Thomas, Keith, Pillatsch, Lex, Michler, Johannes, Frey, Lothar, Rommel, Mathias

مصطلحات موضوعية: FIB, sputter yield, swelling, SSRM, SiC

Time: 539

Relation: International Conference on Ion Beam Modification of Materials (IBMM) 2014; Nuclear instruments and methods in physics research, Section B. Beam interactions with materials and atoms; STEEP; UNIVSEM; 316560; 280566; https://publica.fraunhofer.de/handle/publica/241586

الاتاحة: https://publica.fraunhofer.de/handle/publica/241586
https://doi.org/10.1016/j.nimb.2015.07.079

View record in BASE

14

Dissertation/ Thesis

Bombardement ionique O‾, F‾, Br‾ et l‾ en SIMS : génération par duoplasmatron et étude du potentiel analytique

Ionic O‾, F‾, Cl‾, Br‾ and I‾ bombardment in SIMS : generation via duoplasmatron and study of the analytical potential

المؤلفون: Pillatsch, Lex

Thesis Advisors: Vandoeuvre-les-Nancy, INPL, Scherrer, Hubert, Wirtz, Tom

مصطلحات موضوعية: Sims, Duoplasmatron, Brillance, Rendement de pulvérisation, Concentrations surfacique, Rendement utile, Brightness, Sputtering yield, Surface concentration, Useful yield

الاتاحة: http://www.theses.fr/2010INPL052N/document

View record in Networked Digital Library of Theses & Dissertations

15

Dissertation/ Thesis

Secondary Ionic O, F, Cl, Br and I bombardment in SIMS : generation via duoplasmatron and study of the analytical potential ; Bombardement ionique O, F, Br et l en SIMS : génération par duoplasmatron et étude du potentiel analytique

المؤلفون: Pillatsch, Lex

المساهمون: Institut Jean Lamour (IJL), Institut de Chimie - CNRS Chimie (INC-CNRS)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS), Institut National Polytechnique de Lorraine, Hubert Scherrer, Tom Wirtz

المصدر: https://hal.univ-lorraine.fr/tel-01748836 ; Autre. Institut National Polytechnique de Lorraine, 2010. Français. ⟨NNT : 2010INPL052N⟩.

مصطلحات موضوعية: Sims, Duoplasmatron, Brightness, Sputtering yield, Surface concentration, Useful yield, Brillance, Rendement de pulvérisation, Concentrations surfacique, Rendement utile, Spectrométrie de masse des ions secondaires, Pulvérisation, [SPI.OTHER]Engineering Sciences [physics]/Other