المؤلفون: Martin, Nathan, Lacour, Vivien, Perrault, Cécile Mong-Tu, Roy, Emmanuel, Leprince-Wang, Yamin

المساهمون: Electronique, Systèmes de communication et Microsystèmes (ESYCOM), Conservatoire National des Arts et Métiers CNAM (CNAM)-Centre National de la Recherche Scientifique (CNRS)-Université Gustave Eiffel, Eden Tech

المصدر: ISSN: 2058-9883 ; Reaction Chemistry & Engineering ; https://hal.science/hal-03543993 ; Reaction Chemistry & Engineering, 2021, ⟨10.1039/d1re00325a⟩.

مصطلحات موضوعية: [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci]

Relation: hal-03543993; https://hal.science/hal-03543993; https://hal.science/hal-03543993/document; https://hal.science/hal-03543993/file/High%20flowrate%20%C2%B5reactors%20integrating%20in%20situ%20grown%20ZnO%20NWs%20for%20PC%20degradation.pdf

الاتاحة: https://hal.science/hal-03543993
https://hal.science/hal-03543993/document
https://hal.science/hal-03543993/file/High%20flowrate%20%C2%B5reactors%20integrating%20in%20situ%20grown%20ZnO%20NWs%20for%20PC%20degradation.pdf
https://doi.org/10.1039/d1re00325a

المؤلفون: Martin, Nathan, Lacour, Vivien, Perrault, Cécile Mong-Tu, Roy, Emmanuel, Leprince-Wang, Yamin

المصدر: Reaction Chemistry & Engineering; Mar2022, Vol. 7 Issue 3, p750-757, 8p