المؤلفون: Vais, A., Kumar, A., Boccardi, G., Yadav, S., Mols, Y., Alcotte, R., Vermeersch, B., Ingels, M., Peralagu, U., Neve, C. Roda, Ghyselen, B., Parvais, B., Wambacq, P., Kunert, B., Collaert, N.

المصدر: Key enabling technologies for future wireless, wired, optical and satcom applications ; page 27-37 ; ISBN 9788770046664

الاتاحة: http://dx.doi.org/10.1201/9781003587309-4

المؤلفون: Yadav, S., Cardinael, Pieter, Zhao, M., Vondkar, K., Peralagu, U., Alian, A., Rodriguez, R., Khaled, A., Makovejev, S., Ekoga, E., Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, B., Collaert, N., The 242nd ElectroChemical Society Meeting – ECS 2022

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Relation: boreal:270888; http://hdl.handle.net/2078.1/270888

الاتاحة: http://hdl.handle.net/2078.1/270888
https://doi.org/10.1149/MA2022-02321208mtgabs

المؤلفون: O'Sullivan, B. J., Alian, A., Sibaja-Hernandez, A., Franco, J., Yadav, S., Yu, H., Rathi, A., Peralagu, U., Chasin, A., Parvais, B., Collaert, N.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48228.2024.10529379
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529379.pdf?arnumber=10529379

المؤلفون: Weides, M., Peralagu, U., Kohlstedt, H., Pfeiffer, J., Kemmler, M., Gürlich, C., Goldobin, E., Koelle, D., Kleiner, R.

المصدر: Supercond. Sci. Technol. 23, 095007 (2010)

مصطلحات موضوعية: Condensed Matter - Superconductivity

URL الوصول: http://arxiv.org/abs/1006.5109

المؤلفون: Yadav, S., Alian, A., ElKashlan, R., O’Sullivan, B. J., Khaled, A., Kazemi, B., Peralagu, U., Banerjee, S., Parvais, B., Collaert, N.

المصدر: 2023 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45741.2023.10413712
http://xplorestaging.ieee.org/ielx7/10413659/10413660/10413712.pdf?arnumber=10413712

المؤلفون: Yu, Hao, Parvais, B., Peralagu, U., ElKashlan, R. Y., Rodriguez, R., Khaled, A., Yadav, S., Alian, A., Zhao, M., De Almeida Braga, N., Cobb, J., Fang, J., Cardinael, P., Sibaja-Hernandez, A., Collaert, N.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019489
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019489.pdf?arnumber=10019489

المؤلفون: Abhinay, S., Wu, W.-M., Shih, C.-A., Chen, S.-H., Sibaja-Hernandez, A., Parvais, B., Peralagu, U., Alian, A., Wu, T.-L., Ker, M.-D., Groeseneken, G., Collaert, N.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019357
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019357.pdf?arnumber=10019357

المؤلفون: Collaert, N., Alian, A., Banerjee, A., Boccardi, G., Cardinael, P., Chauhan, V., Desset, C., ElKashlan, R., Khaled, A., Ingels, M., Kunert, B., Mols, Y., O'Sullivan, B., Peralagu, U., Pinho, N., Rodriguez, R., Sibaja-Hernandez, A., Sinha, S., Sun, X., Vais, A., Vermeersch, B., Yadav, S., Yan, D., Yu, H., Zhang, Y., Zhao, M., Van Driessche, J., Gramegna, G., Wambacq, P., Parvais, B., Peeters, M.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019555
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019555.pdf?arnumber=10019555

المؤلفون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Yadav, S., Cardinael, Pieter, Zhao, M., Vondkar, K., Peralagu, U., Alian, A., Rodriguez, R., Khaled, A., Makovejev, S., Ekoga, E., Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, B., Collaert, N.

مصطلحات الفهرس: info:eu-repo/semantics/conferenceObject

URL: http://hdl.handle.net/2078.1/270888

المؤلفون: Parvais, B., ElKashlan, R., Yu, H., Sibaja-Hernandez, A., Vermeersch, B., Putcha, V., Cardinael, Pieter, Rodriguez, R., Khaled, A., Alian, A., Peralagu, U., Zhao, M., Yadav, S., Gramegna, G., Van Driessche, J., Collaert, N., International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, imec

مصطلحات موضوعية: mmWave, GaN, RF-DTCO

Relation: boreal:250706; http://hdl.handle.net/2078.1/250706

الاتاحة: http://hdl.handle.net/2078.1/250706

المؤلفون: Yadav, S., Cardinael, Pieter, Zhao, M., Peralagu, U., Alian, A., Khaled, A., Makovejev, S., Ekoga, E., Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, B., Collaert, N., International Conference on IC Design and Technology 2021

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, imec

مصطلحات موضوعية: GaN, HEMTs, GaN-on-Si, Substrate, RF losses, Harmonic distortion

Relation: boreal:250708; http://hdl.handle.net/2078.1/250708

الاتاحة: http://hdl.handle.net/2078.1/250708

المؤلفون: Wu, W.-M., Chen, S.-H., Sibaja-Hernandez, A., Yadav, S., Peralagu, U., Yu, H., Alian, A., Putcha, V., Parvais, B., Groeseneken, G., Ker, M.-D., Collaert, N.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm19574.2021.9720581
http://xplorestaging.ieee.org/ielx7/9720433/9720494/09720581.pdf?arnumber=9720581

المؤلفون: Collaert, N., Alian, A., Banerjee, A., Chauhan, V., ElKashlan, R. Y., Hsu, B., Ingels, M., Khaled, A., Vondkar Kodandarama, K., Kunert, B., Mols, Y., Peralagu, U., Putcha, V., Rodriguez, R., Sibaja-Hernandez, A., Simoen, E., Vais, A., Walke, A., Witters, L., Yadav, S., Yu, H., Zhao, M., Wambacq, P., Parvais, B., Waldron, N.

المصدر: 2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)

الاتاحة: http://dx.doi.org/10.1109/icsict49897.2020.9278253
http://xplorestaging.ieee.org/ielx7/9278127/9278011/09278253.pdf?arnumber=9278253

المؤلفون: Parvais, B., Alian, A., Peralagu, U., Rodriguez, R., Yadav, S., Khaled, A., ElKashlan, R. Y., Putcha, V., Sibaja-Hernandez, A., Zhao, M., Wambacq, P., Collaert, N., Waldron, N.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm13553.2020.9372056
http://xplorestaging.ieee.org/ielx7/9371868/9371888/09372056.pdf?arnumber=9372056

المؤلفون: Agopian, P. G.D., Carmo, G. J., Martino, J. A., Simoen, E., Peralagu, U., Parvais, B., Waldron, N., Collaert, N.

المساهمون: Universidade Estadual Paulista (UNESP)

مصطلحات موضوعية: Gate dielectric, High temperature, Intrinsic voltage gain, MOSHEMT

Relation: Solid-State Electronics; http://dx.doi.org/10.1016/j.sse.2021.108091; Solid-State Electronics, v. 185.; http://hdl.handle.net/11449/206462; 2-s2.0-85107679031

الاتاحة: http://hdl.handle.net/11449/206462
https://doi.org/10.1016/j.sse.2021.108091

المؤلفون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, imec, Parvais, B., ElKashlan, R., Yu, H., Sibaja-Hernandez, A., Vermeersch, B., Putcha, V., Cardinael, Pieter, Rodriguez, R., Khaled, A., Alian, A., Peralagu, U., Zhao, M., Yadav, S., Gramegna, G., Van Driessche, J., Collaert, N.

مصطلحات الفهرس: mmWave, GaN, RF-DTCO, info:eu-repo/semantics/conferenceObject

URL: http://hdl.handle.net/2078.1/250706

المؤلفون: Peralagu, U., De Jaeger, B., Fleetwood, D. M., Wambacq, P., Zhao, M., Parvais, B., Waldron, N., Collaert, N., Alian, A., Putcha, V., Khaled, A., Rodriguez, R., Sibaja-Hernandez, A., Chang, S., Simoen, E., Zhao, S. E.

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM) ; page 17.2.1-17.2.4

الاتاحة: http://dx.doi.org/10.1109/iedm19573.2019.8993582
http://xplorestaging.ieee.org/ielx7/8971803/8993428/08993582.pdf?arnumber=8993582

المؤلفون: Takakura, K, Putcha, V, Simoen, E, Alian, A R, Peralagu, U, Waldron, N, Parvais, B, Collaert, N

المساهمون: Japan Society for the Promotion of Science, imec’s Partner Program

المصدر: Semiconductor Science and Technology ; volume 36, issue 2, page 024003 ; ISSN 0268-1242 1361-6641

الاتاحة: http://dx.doi.org/10.1088/1361-6641/abce8c
https://iopscience.iop.org/article/10.1088/1361-6641/abce8c
https://iopscience.iop.org/article/10.1088/1361-6641/abce8c/pdf

المؤلفون: Takakura, K., Putcha, V., Simoen, E., Alian, A. R., Peralagu, U., Waldron, N., Parvais, B., Collaert, N.

المساهمون: Japan Society for the Promotion of Science (JSPS) KAKENHI, IMEC’s Partner Program on High-Speed Analog and RF Devices

المصدر: IEEE Transactions on Electron Devices ; volume 67, issue 8, page 3062-3068 ; ISSN 0018-9383 1557-9646

الاتاحة: http://dx.doi.org/10.1109/ted.2020.3002732
http://xplorestaging.ieee.org/ielx7/16/9146596/09127093.pdf?arnumber=9127093

المؤلفون: Millar, D. A. J., Li, X., Peralagu, U., Steer, M. J., Pavey, I.M., Gaspar, G., Schmidt, M., Hurley, P.K., Thayne, I. G.

المصدر: 2018 76th Device Research Conference (DRC) ; volume 69, page 1-2

الاتاحة: http://dx.doi.org/10.1109/drc.2018.8442150
http://xplorestaging.ieee.org/ielx7/8424808/8442143/08442150.pdf?arnumber=8442150