المؤلفون: Hahn, H., Mauder, C., Marx, M., Gao, Z., Lauffer, P., Schön, O., John, P.T., Yadav, S., Banerjee, S., Cardinael, Pieter, Raskin, Jean-Pierre, Parvais, B., Fahle, D., CS Mantech

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

المصدر: CS Mantech 2024 Digest, Vol. -, no.-, p. 1-4 (2024)

Relation: boreal:294914; http://hdl.handle.net/2078.1/294914

الاتاحة: http://hdl.handle.net/2078.1/294914

المؤلفون: Vais, A., Kumar, A., Boccardi, G., Yadav, S., Mols, Y., Alcotte, R., Vermeersch, B., Ingels, M., Peralagu, U., Neve, C. Roda, Ghyselen, B., Parvais, B., Wambacq, P., Kunert, B., Collaert, N.

المصدر: Key enabling technologies for future wireless, wired, optical and satcom applications ; page 27-37 ; ISBN 9788770046664

الاتاحة: http://dx.doi.org/10.1201/9781003587309-4

المؤلفون: Yadav, S., Cardinael, Pieter, Zhao, M., Vondkar, K., Peralagu, U., Alian, A., Rodriguez, R., Khaled, A., Makovejev, S., Ekoga, E., Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, B., Collaert, N., The 242nd ElectroChemical Society Meeting – ECS 2022

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Relation: boreal:270888; http://hdl.handle.net/2078.1/270888

الاتاحة: http://hdl.handle.net/2078.1/270888
https://doi.org/10.1149/MA2022-02321208mtgabs

المؤلفون: O'Sullivan, B. J., Alian, A., Sibaja-Hernandez, A., Franco, J., Yadav, S., Yu, H., Rathi, A., Peralagu, U., Chasin, A., Parvais, B., Collaert, N.

المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS)

الاتاحة: http://dx.doi.org/10.1109/irps48228.2024.10529379
http://xplorestaging.ieee.org/ielx7/10529283/10529298/10529379.pdf?arnumber=10529379

المؤلفون: Cardinael, Pieter, Yadav, S., Zhao, M., Rack, Martin, Lederer, Dimitri, Collaert, N., Parvais, B., Raskin, Jean-Pierre, European Solid-State Device Research Conference (ESSDERC 2021)

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

المصدر: ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC)

مصطلحات موضوعية: GaN-on-Si, HEMTs, RF losses, effective substrate resistivity, harmonic distortion, C-doped III-Ns

Relation: info:eu-repo/grantAgreement/FNRS/FRIA/; boreal:250702; http://hdl.handle.net/2078.1/250702

الاتاحة: http://hdl.handle.net/2078.1/250702
https://doi.org/10.1109/ESSDERC53440.2021.9631822

المؤلفون: Yadav, S., Cardinael, Pieter, Zhao, M., Vondkar, K., Khaled, A., Rodriguez, R., Vermeersch, B., Makovejev, S., Ekoga, E., Pottrain, A., Waldron, N., Raskin, Jean-Pierre, Parvais, B., Collaert, N., 2020 IEEE International Electron Devices Meeting (IEDM)

المساهمون: imec, UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

المصدر: International Electron Devices Meeting. I E D M Technical Digest

مصطلحات موضوعية: Radio frequency, Implants, HEMTs, Conductivity, Coplanar waveguides, Substrates

Relation: boreal:250699; http://hdl.handle.net/2078.1/250699; urn:ISSN:0163-1918

الاتاحة: http://hdl.handle.net/2078.1/250699
https://doi.org/10.1109/iedm13553.2020.9371893

المؤلفون: Cardinael, Pieter, Yadav, S., Zhao, M., Vondkar, K., Khaled, A., Rodriguez, R., Vermeersch, B., Makovejev, S., Ekoga, E., Pottrain, A., Waldron, N., Raskin, Jean-Pierre, Parvais, B., Collaert, N.

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

Relation: boreal:269273; http://hdl.handle.net/2078.1/269273

الاتاحة: http://hdl.handle.net/2078.1/269273

المؤلفون: Yadav, S., Alian, A., ElKashlan, R., O’Sullivan, B. J., Khaled, A., Kazemi, B., Peralagu, U., Banerjee, S., Parvais, B., Collaert, N.

المصدر: 2023 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45741.2023.10413712
http://xplorestaging.ieee.org/ielx7/10413659/10413660/10413712.pdf?arnumber=10413712

المؤلفون: Kilchytska, Valeriya, Kazemi Esfeh, Babak, Gimeno Gasca, Cecilia, Parvais, B., Planes, N., Hahond, M., Raskin, Jean-Pierre, Flandre, Denis, 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon – ULIS

المساهمون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique

مصطلحات موضوعية: Silicon-on-insulator, MOSFET, Logic gates, Harmonic distortion, Radio frequency, Distortion measurement, Linearity

Relation: boreal:189978; http://hdl.handle.net/2078.1/189978

الاتاحة: http://hdl.handle.net/2078.1/189978
https://doi.org/10.1109/ULIS.2017.7962581

المؤلفون: Mauder, C., Hahn, H., Alian, A., Rodriguez, R., Parvais, B., Zhao, M., Heuken, M., Gao, Z., Marx, M., Zweipfennig, Thorsten, Ehrler, Jasmin, Kalisch, Holger, Vescan, Andrei, Bolten, J., Lemme, Max C.

المصدر: 27-30 (2022). ; [International Conference on Compound Semiconductor MANufacturing TECHnology, CS MANTECH 2022, 2022-05-09 - 2022-05-12, Monterey, USA] ; [International Conference on Compound Semiconductor MANufacturing TECHnology, CS MANTECH 2022, 2022-05-09 - 2022-05-12, Monterey, USA] International Conference on Compound Semiconductor MANufacturing TECHnology, CS MANTECH 2022, Monterey, USA, 2022-05-09 - 2022-05-12

جغرافية الموضوع: DE

Relation: https://publications.rwth-aachen.de/record/847476; https://publications.rwth-aachen.de/search?p=id:%22RWTH-2022-05372%22

الاتاحة: https://publications.rwth-aachen.de/record/847476
https://publications.rwth-aachen.de/search?p=id:%22RWTH-2022-05372%22

المؤلفون: Parvais, B., Vais, A., Yadav, S., Mols, Y., Vermeersch, B., Kodanarama, K. Vondkar, Boccardi, G., Kunert, B., Collaert, N.

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

الاتاحة: http://dx.doi.org/10.1109/edtm53872.2022.9798159
http://xplorestaging.ieee.org/ielx7/9797886/9797892/09798159.pdf?arnumber=9798159

المؤلفون: Yu, Hao, Parvais, B., Peralagu, U., ElKashlan, R. Y., Rodriguez, R., Khaled, A., Yadav, S., Alian, A., Zhao, M., De Almeida Braga, N., Cobb, J., Fang, J., Cardinael, P., Sibaja-Hernandez, A., Collaert, N.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019489
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019489.pdf?arnumber=10019489

المؤلفون: Abhinay, S., Wu, W.-M., Shih, C.-A., Chen, S.-H., Sibaja-Hernandez, A., Parvais, B., Peralagu, U., Alian, A., Wu, T.-L., Ker, M.-D., Groeseneken, G., Collaert, N.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019357
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019357.pdf?arnumber=10019357

المؤلفون: Collaert, N., Alian, A., Banerjee, A., Boccardi, G., Cardinael, P., Chauhan, V., Desset, C., ElKashlan, R., Khaled, A., Ingels, M., Kunert, B., Mols, Y., O'Sullivan, B., Peralagu, U., Pinho, N., Rodriguez, R., Sibaja-Hernandez, A., Sinha, S., Sun, X., Vais, A., Vermeersch, B., Yadav, S., Yan, D., Yu, H., Zhang, Y., Zhao, M., Van Driessche, J., Gramegna, G., Wambacq, P., Parvais, B., Peeters, M.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019555
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019555.pdf?arnumber=10019555

المؤلفون: Vermeersch, B., Rodriguez, R., Sibaja-Hernandez, A., Vais, A., Yadav, S., Parvais, B., Collaert, N.

المصدر: 2022 International Electron Devices Meeting (IEDM)

الاتاحة: http://dx.doi.org/10.1109/iedm45625.2022.10019370
http://xplorestaging.ieee.org/ielx7/10019319/10019320/10019370.pdf?arnumber=10019370

المؤلفون: Ragnarsson, L-A, Bardon, M. Garcia, Wuytens, P., Mirabelli, G., Jang, D., Willems, G., Mallik, A., Spessot, A., Ryckaert, J., Parvais, B.

المصدر: 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

الاتاحة: http://dx.doi.org/10.1109/edtm53872.2022.9798208
http://xplorestaging.ieee.org/ielx7/9797886/9797892/09798208.pdf?arnumber=9798208

المؤلفون: Grill, A., John, V., Michl, J., Beckers, A., Bury, E., Tyaginov, S., Parvais, B., Chasin, A. Vaisman, Grasser, T., Waltl, M., Kaczer, B., Govoreanu, B.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) ; page 10A.1-1-10A.1-6

الاتاحة: http://dx.doi.org/10.1109/irps48227.2022.9764594
http://xplorestaging.ieee.org/ielx7/9764406/9764408/09764594.pdf?arnumber=9764594

المؤلفون: Simoen, E., Hsu, P. C., Takakura, K., Syshchyk, O., Vais, A., Yu, H., Parvais, B., Collaert, N., Claeys, C.

المساهمون: Simoen, E., Kononchuk, O., Nakatsuka, O., Claeys, C., Physics, Faculty of Economic and Social Sciences and Solvay Business School, Electronics and Informatics

المصدر: ECS Transactions. 102:53-62

مصطلحات موضوعية: Materials science, Semiconductor, Silicon, chemistry, business.industry, Optoelectronics, chemistry.chemical_element, Defect engineering, business, Engineering(all)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d1c797fd6730ffd4876a17c6dd33198c
https://doi.org/10.1149/10204.0053ecst

المؤلفون: UCL - SST/ICTM/ELEN - Pôle en ingénierie électrique, Yadav, S., Cardinael, Pieter, Zhao, M., Vondkar, K., Peralagu, U., Alian, A., Rodriguez, R., Khaled, A., Makovejev, S., Ekoga, E., Lederer, Dimitri, Raskin, Jean-Pierre, Parvais, B., Collaert, N.

مصطلحات الفهرس: info:eu-repo/semantics/conferenceObject

URL: http://hdl.handle.net/2078.1/270888

المؤلفون: Kaczmarek, K., Bardon, M. Garcia, Xiang, Y., Breuil, L., Ronchi, N., Parvais, B., Groeseneken, G., van Houdt, J.

المصدر: 2021 IEEE International Memory Workshop (IMW) ; page 1-4

الاتاحة: http://dx.doi.org/10.1109/imw51353.2021.9439597
http://xplorestaging.ieee.org/ielx7/9439548/9439588/09439597.pdf?arnumber=9439597