المؤلفون: Tsoumanis P., Paliaroutis G.-I., Evmorfopoulos N., Stamoulis G.

المصدر: Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT ; https://www.scopus.com/inward/record.uri?eid=2-s2.0-85142890369&doi=10.1109%2fDFT52944.2021.9568306&partnerID=40&md5=84211665b9eb8b5bf3fea1d0fbebf346

مصطلحات موضوعية: Error correction, Integrated circuit interconnects, Radiation hardening, Transients, Deep submicron technology, Electrical masking, Interconnection delay, Soft error, Soft error rate, Soft error rate estimations, Static timing analysis, Timing Analysis, Timing masking, Transient faults, Timing circuits, Institute of Electrical and Electronics Engineers Inc

Relation: http://hdl.handle.net/11615/80176

الاتاحة: http://hdl.handle.net/11615/80176
https://doi.org/10.1109/DFT52944.2021.9568306