المؤلفون: Balčiūnas, Sergejus, Ivanov, Maksim, Grigalaitis, Robertas, Banys, Juras, Amorín, Harvey, Castro, Alicia, Algueró, Miguel

المصدر: Journal of Applied Physics; 2018, Vol. 123 Issue 20, pN.PAG-N.PAG, 6p, 3 Graphs

مصطلحات موضوعية: NANOSTRUCTURED materials, THIN films, PIEZOELECTRIC thin film analysis, CURIE-Weiss law, BISMUTH compounds, SCANDIUM compounds, LEAD compounds, TITANIUM compounds

المؤلفون: Kurz, Nicolas¹ nicolas.kurz@imtek.uni-freiburg.de, Lu, Yuan², Kirste, Lutz², Reusch, Markus², Žukauskaitė, Agnė², Lebedev, Vadim², Ambacher, Oliver^2,3

المصدر: Physica Status Solidi. A: Applications & Materials Science. Jul2018, Vol. 215 Issue 13, p1-1. 7p.

مصطلحات موضوعية: *PIEZOELECTRIC thin film analysis, *PYROELECTRIC devices, *ALUMINUM nitride film analysis, *ACOUSTOELECTRIC devices, *MICROSTRUCTURE

المؤلفون: Zhong, Caifu¹, Guo, Limin¹, Wang, Xiaohui¹, Li, Longtu¹, Davies, P.

المصدر: Journal of the American Ceramic Society. Feb2012, Vol. 95 Issue 2, p473-475. 3p. 1 Color Photograph, 4 Graphs.

مصطلحات موضوعية: *PIEZOELECTRIC thin film analysis, *CHEMISTRY methodology, *CHEMICAL synthesis, *SOL-gel processes, *CURIE temperature, *PARTICLE size distribution

المؤلفون: Mayrhofer, P.M., Wistrela, E., Schneider, M., Bittner, A., Schmid, U.

المصدر: Procedia Engineering; 2016, Vol. 168, p876-879, 4p

مصطلحات موضوعية: PIEZOELECTRIC thin film analysis, DEFLECTION (Light), FINITE element method, LASER Doppler vibrometer, BOND strengths, ADHESIVES

المؤلفون: Tkach, Alexander, Santos, André, Zlotnik, Sebastian, Serrazina, Ricardo, Okhay, Olena, Bdikin, Igor, Costa, Maria Elisabete, Vilarinho, Paula M.

المصدر: Coatings (2079-6412); Dec2018, Vol. 8 Issue 12, p449, 1p

مصطلحات موضوعية: PIEZOELECTRIC thin film analysis, DIELECTRIC properties of piezoelectric composites, ELECTRIC properties of thin films