المؤلفون: M. K. Puchert, Robert N. Lamb, P. Y. Timbrell

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 14:2220-2230

مصطلحات موضوعية: Materials science, Annealing (metallurgy), Metallurgy, Recrystallization (metallurgy), Surfaces and Interfaces, Sputter deposition, Condensed Matter Physics, Surfaces, Coatings and Films, Residual stress, Electrical resistivity and conductivity, Sputtering, Crystallite, Thin film, Composite material

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9e84483b1b870ad7aaab5bb44b596dcd
https://doi.org/10.1116/1.580050

المؤلفون: P Y Timbrell, R N Lamb, M H Koch

المصدر: Semiconductor Science and Technology. 10:1523-1527

مصطلحات موضوعية: Materials science, Optical isolator, business.industry, Substrate (electronics), Dielectric, Condensed Matter Physics, Waveguide (optics), Electronic, Optical and Magnetic Materials, law.invention, Crystallinity, Prism coupler, Optics, Optical modulator, law, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Layer (electronics)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::037452a01e901366ede4e51c92e37a49
https://doi.org/10.1088/0268-1242/10/11/015

المؤلفون: Jin Zou, M. K. Puchert, David R. McKenzie, Ed Gerstner, P. Y. Timbrell

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 13:406-411

مصطلحات موضوعية: inorganic chemicals, Materials science, Silicon, technology, industry, and agriculture, Analytical chemistry, Nanocrystalline silicon, chemistry.chemical_element, Surfaces and Interfaces, Substrate (electronics), equipment and supplies, Condensed Matter Physics, complex mixtures, Surfaces, Coatings and Films, Carbon film, Amorphous carbon, chemistry, Chemical engineering, Crystalline silicon, Thin film, Carbon

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7b88f121bd2d5e34b931df634d99aa53
https://doi.org/10.1116/1.579372

المؤلفون: P. Y. Timbrell, Robert N. Lamb, M. K. Puchert

المصدر: Surface and Interface Analysis. 21:731-736

مصطلحات موضوعية: Suboxide, Argon, Analytical chemistry, chemistry.chemical_element, Germanium, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Surfaces, Coatings and Films, Auger, chemistry, X-ray photoelectron spectroscopy, Sputtering, Materials Chemistry, Refractive index, Germanium oxide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::426c8549ce6121a102f00245bcfa6e6d
https://doi.org/10.1002/sia.740211009

المؤلفون: M. K. Puchert, David R. McKenzie, Robert N. Lamb, P. Y. Timbrell

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 12:727-732

مصطلحات موضوعية: Materials science, Analytical chemistry, chemistry.chemical_element, Surfaces and Interfaces, Substrate (electronics), Sputter deposition, Condensed Matter Physics, Surfaces, Coatings and Films, Stress (mechanics), Compressive strength, Carbon film, chemistry, X-ray photoelectron spectroscopy, Thin film, Carbon

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::085f51c66b2d01496094aaba71e5736b
https://doi.org/10.1116/1.578814

المؤلفون: David J. Lockwood, J.-M. Baribeau, John P. McCaffrey, P. Y. Timbrell

المصدر: Journal of Electronic Materials. 19:657-663

مصطلحات موضوعية: Materials science, Solid-state physics, business.industry, Scanning electron microscope, Annealing (metallurgy), Atmospheric temperature range, Condensed Matter Physics, Epitaxy, Electronic, Optical and Magnetic Materials, law.invention, Crystallography, law, Transmission electron microscopy, Microscopy, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Electron microscope, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce73a8dd98c631df7dd0c84e75f8ad5f
https://doi.org/10.1007/bf02655234

المؤلفون: David J. Lockwood, J.-M. Baribeau, John P. McCaffrey, P. Y. Timbrell

المصدر: Journal of Applied Physics. 67:6292-6300

مصطلحات موضوعية: Materials science, Condensed matter physics, Annealing (metallurgy), General Physics and Astronomy, Heterojunction, Atmospheric temperature range, Epitaxy, Crystallography, symbols.namesake, Transmission electron microscopy, symbols, Dislocation, Raman spectroscopy, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b51687ebc41e92f6fc9bc95ef25c7210
https://doi.org/10.1063/1.345146

المؤلفون: S. R. Das, David J. Lockwood, P. Y. Timbrell, J. G. Cook, John P. McCaffrey

المصدر: Applied Physics Letters. 56:2430-2432

مصطلحات موضوعية: symbols.namesake, Auger electron spectroscopy, Lattice constant, Physics and Astronomy (miscellaneous), Chemistry, Sputtering, Transmission electron microscopy, Phase (matter), Cavity magnetron, Analytical chemistry, symbols, Sputter deposition, Raman spectroscopy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::68f7e333ebb51ae9e11060c5646f83fb
https://doi.org/10.1063/1.102900

المؤلفون: P. Y. Timbrell, R. N. Lamb, G. Comelli

المصدر: Surface Science ISBN: 9783642802836

مصطلحات موضوعية: chemistry.chemical_classification, chemistry.chemical_compound, Pyromellitic dianhydride, Monomer, Carbon film, Materials science, chemistry, X-ray photoelectron spectroscopy, Chemical engineering, Polymer, Combustion chemical vapor deposition, Thin film, Polyimide

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::908867a95fbbb2d6af1f36001c2767f7
https://doi.org/10.1007/978-3-642-80281-2_22

المؤلفون: David J. Lockwood, P. Y. Timbrell, J.-M. Baribeau

المصدر: Canadian Journal of Physics. 67:351-357

مصطلحات موضوعية: Physics, Diffraction, Condensed matter physics, Annealing (metallurgy), Scanning electron microscope, business.industry, Superlattice, General Physics and Astronomy, Condensed Matter::Materials Science, symbols.namesake, Optics, X-ray crystallography, symbols, Thermal stability, Raman spectroscopy, business, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f33af7c6cf91036d9e092f488ea1205
https://doi.org/10.1139/p89-062

المؤلفون: P. Y. Timbrell, J.-M. Baribeau, David J. Lockwood

المصدر: Journal of Applied Physics. 65:3049-3055

مصطلحات موضوعية: Materials science, Condensed matter physics, Annealing (metallurgy), Scanning electron microscope, Superlattice, General Physics and Astronomy, Condensed Matter::Materials Science, Crystallography, symbols.namesake, Transmission electron microscopy, Microscopy, symbols, Thin film, Raman spectroscopy, Molecular beam epitaxy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8b3b9a6d8efb2338f2c70496a63791c7
https://doi.org/10.1063/1.342697