المؤلفون: Callegaro, Luca, Bauer, Stephan, Jeanneret, Blaise, Kruskopf, Mattias, Marzano, Martina, Ortolano, Massimo, Overney, Frederic

مصطلحات موضوعية: Physics - Instrumentation and Detectors, Condensed Matter - Mesoscale and Nanoscale Physics

URL الوصول: http://arxiv.org/abs/2205.04915

المؤلفون: Overney, Frédéric, Eichenberger, Ali L., Bauer, Stephan, Ortolano, Massimo, Marzano, Martina, Yin, Yefei, Kruskopf, Mattias

المساهمون: Overney, Frédéric, Eichenberger, Ali L., Bauer, Stephan, Ortolano, Massimo, Marzano, Martina, Yin, Yefei, Kruskopf, Mattias

مصطلحات موضوعية: Quantum Hall Effect, graphene, precision measurements

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-6104-9; ispartofbook:Conference on Precision Electromagnetic Measurements (CPEM); Conference on Precision Electromagnetic Measurements (CPEM); volume:2; firstpage:1; lastpage:2; numberofpages:2; https://hdl.handle.net/11583/2992342; https://ieeexplore.ieee.org/document/10645982

الاتاحة: https://hdl.handle.net/11583/2992342
https://doi.org/10.1109/cpem61406.2024.10645982
https://ieeexplore.ieee.org/document/10645982

المؤلفون: Marzano, Martina, Ortolano, Massimo, Overney, Frédéric, Eichenberger, Ali L., Kucera, Jan, D'Elia, Vincenzo, Bartova, Lucie, Medved, Juan, Callegaro, Luca

المساهمون: Marzano, Martina, Ortolano, Massimo, Overney, Frédéric, Eichenberger, Ali L., Kucera, Jan, D'Elia, Vincenzo, Bartova, Lucie, Medved, Juan, Callegaro, Luca

مصطلحات موضوعية: Metrology, calibration, impedance measurement, bridge circuit, Josephson effect

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/979-8-3503-6104-9; ispartofbook:Conference on Precision Electromagnetic Measurements (CPEM); Conference on Precision Electromagnetic Measurements (CPEM); firstpage:1; lastpage:2; numberofpages:2; https://hdl.handle.net/11583/2992335; https://ieeexplore.ieee.org/document/10646159

الاتاحة: https://hdl.handle.net/11583/2992335
https://doi.org/10.1109/cpem61406.2024.10646159
https://ieeexplore.ieee.org/document/10646159

المؤلفون: Overney, Frédéric, Jeanneret, Blaise

المصدر: Instrumentation viewpoint; 2013: Núm.: 14

وصف الملف: text/html

Relation: https://www.raco.cat/index.php/Instrumentation/article/view/298041/387028

URL الوصول: https://www.raco.cat/index.php/Instrumentation/article/view/298041

المؤلفون: Agustoni, Marco, De Préville, Sophie, Overney, Frédéric

المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 72, page 1-10 ; ISSN 0018-9456 1557-9662

الاتاحة: http://dx.doi.org/10.1109/tim.2023.3264021
http://xplorestaging.ieee.org/ielx7/19/10012124/10091123.pdf?arnumber=10091123

المؤلفون: Eichenberger, Ali L., Overney, Frédéric, Agustoni, Marco

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646147
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646147.pdf?arnumber=10646147

المؤلفون: Agustoni, Marco, Overney, Frédéric, Eichenberger, Ali-Laurent, Kučera, Jan

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; volume 2, page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646143
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646143.pdf?arnumber=10646143

المؤلفون: Musioł, Krzysztof, Kampik, Marian, Overney, Frédéric, Kubiczek, Krzysztof

المساهمون: Ministry of Education and Science

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646041
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646041.pdf?arnumber=10646041

المؤلفون: Bauer, Stephan, Overney, Frédéric, Eichenberger, Ali L., Kraus, Marco, Pimsut, Yaowaret

المصدر: 2024 Conference on Precision Electromagnetic Measurements (CPEM) ; page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem61406.2024.10646026
http://xplorestaging.ieee.org/ielx8/10645824/10645825/10646026.pdf?arnumber=10646026

المؤلفون: Callegaro, Luca, D'Elia, Vincenzo, Marzano, Martina, Tran, Ngoc Thanh Mai, Ortolano, Massimo, Kucera, Jan, Pierz, Klaus, Bauer, Stephan, Kruskopf, Mattias, Yin, Yefei, Pimsut, Yaowaret, Schopfer, Felicien, Thevenot, Olivier, Jeanneret, Blaise, Overney, Frederic, Bergsten, Tobias, Cedergren, Karin, Manninen, Antti, Nissila, Jaani, Michon, Adrien, Sawatdiaree, Sivinee, Chae, Dong-Hun

المساهمون: Callegaro, Luca, D'Elia, Vincenzo, Marzano, Martina, Tran, Ngoc Thanh Mai, Ortolano, Massimo, Kucera, Jan, Pierz, Klau, Bauer, Stephan, Kruskopf, Mattia, Yin, Yefei, Pimsut, Yaowaret, Schopfer, Felicien, Thevenot, Olivier, Jeanneret, Blaise, Overney, Frederic, Bergsten, Tobia, Cedergren, Karin, Manninen, Antti, Nissila, Jaani, Michon, Adrien, Sawatdiaree, Sivinee, Chae, Dong-Hun

مصطلحات موضوعية: Metrology, impedance measurement, bridge circuits, measurement uncertainty, calibration

وصف الملف: ELETTRONICO

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-7281-5898-3; info:eu-repo/semantics/altIdentifier/wos/WOS:000841889400055; ispartofbook:2020 Conference on Precision Electromagnetic Measurements (CPEM); 2020 Conference on Precision Electromagnetic Measurements (CPEM); firstpage:1; lastpage:2; numberofpages:2; http://hdl.handle.net/11583/2845733; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85092198811; https://ieeexplore.ieee.org/document/9191743

الاتاحة: http://hdl.handle.net/11583/2845733
https://doi.org/10.1109/CPEM49742.2020.9191743
https://ieeexplore.ieee.org/document/9191743

المؤلفون: Overney, Frédéric, Flowers-Jacobs, Nathan E, Jeanneret, Blaise, Rüfenacht, Alain, Fox, Anna E, Dresselhaus, Paul D, Benz, Samuel P

المصدر: Metrologia ; volume 57, issue 6, page 065014 ; ISSN 0026-1394 1681-7575

الاتاحة: http://dx.doi.org/10.1088/1681-7575/ab948d
https://iopscience.iop.org/article/10.1088/1681-7575/ab948d
https://iopscience.iop.org/article/10.1088/1681-7575/ab948d/pdf

المؤلفون: Overney, Frédéric, Pimsut, Yaowaret, Bauer, Stephan, Kieler, Oliver, Behr, Ralf, Jeanneret, Blaise

المساهمون: European Metrology Programme for Innovation and Research

المصدر: Measurement Science and Technology ; volume 31, issue 5, page 055004 ; ISSN 0957-0233 1361-6501

الاتاحة: http://dx.doi.org/10.1088/1361-6501/ab62c7
https://iopscience.iop.org/article/10.1088/1361-6501/ab62c7
https://iopscience.iop.org/article/10.1088/1361-6501/ab62c7/pdf

المؤلفون: Meddings, Nina, Heinrich, Marco, Overney, Frédéric, Lee, Jong-Sook, Ruiz, Vanesa, Napolitano, Emilio, Seitz, Steffen, Hinds, Gareth, Raccichini, Rinaldo, Gaberšček, Miran, Park, Juyeon

المساهمون: European Metrology Programme for Innovation and Research, Horizon 2020, Ministry of Science and ICT

المصدر: Journal of Power Sources ; volume 480, page 228742 ; ISSN 0378-7753

الاتاحة: http://dx.doi.org/10.1016/j.jpowsour.2020.228742
https://api.elsevier.com/content/article/PII:S0378775320310466?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S0378775320310466?httpAccept=text/plain

المؤلفون: Ortolano, Massimo, Palafox, Luis, Kučera, Jan, Callegaro, Luca, D’Elia, Vincenzo, Marzano, Martina, Overney, Frédéric, Gülmez, Gülay

المساهمون: Ortolano, Massimo, Palafox, Lui, Kučera, Jan, Callegaro, Luca, D’Elia, Vincenzo, Marzano, Martina, Overney, Frédéric, Gülmez, Gülay

وصف الملف: STAMPA

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000434677400004; volume:55; issue:4; firstpage:499; lastpage:512; numberofpages:14; journal:METROLOGIA; http://hdl.handle.net/11583/2709477; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85051395952; https://doi.org/10.1088/1681-7575/aabf24

الاتاحة: http://hdl.handle.net/11583/2709477
https://doi.org/10.1088/1681-7575/aabf24

المؤلفون: Ortolano, Massimo, Palafox, Luis, Kucera, Jan, Callegaro, Luca, D'Elia, Vincenzo, Marzano, Martina, Overney, Frederic, Gulmez, Gulay

المصدر: METROLOGIA 55(4) 499-512

Relation: https://aperta.ulakbim.gov.tr/record/93079; oai:zenodo.org:93079

الاتاحة: https://aperta.ulakbim.gov.tr/record/93079

المؤلفون: Overney, Frederic, Flowers-Jacobs, Nathan E., Jeanneret, Blaise, Rufenacht, Alain, Fox, Anna E., Dresselhaus, Paul D., Benz, Samuel P.

المصدر: 2020 Conference on Precision Electromagnetic Measurements (CPEM)

الاتاحة: http://dx.doi.org/10.1109/cpem49742.2020.9191748
http://xplorestaging.ieee.org/ielx7/9187439/9191686/09191748.pdf?arnumber=9191748

المؤلفون: Agustoni, Marco, Overney, Frederic

المصدر: IEEE Transactions on Instrumentation and Measurement ; volume 70, page 1-8 ; ISSN 0018-9456 1557-9662

الاتاحة: http://dx.doi.org/10.1109/tim.2020.3036062
http://xplorestaging.ieee.org/ielx7/19/9259274/09249382.pdf?arnumber=9249382

المؤلفون: Corminboeuf David, Overney Frédéric

المصدر: EPJ Web of Conferences, Vol 77, p 00014 (2014)

مصطلحات موضوعية: Physics, QC1-999

Relation: http://dx.doi.org/10.1051/epjconf/20147700014; https://doaj.org/toc/2100-014X; https://doaj.org/article/5807b9734bad4699ae992f7dc0350d2c

الاتاحة: https://doi.org/10.1051/epjconf/20147700014
https://doaj.org/article/5807b9734bad4699ae992f7dc0350d2c

المؤلفون: Thodkar, Kishan, Schonenberger, Christian, Calame, Michel, Luond, Felix, Overney, Frederic, Jcanncret, Blaise

المصدر: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018) ; volume 64, page 1-2

الاتاحة: http://dx.doi.org/10.1109/cpem.2018.8500820
http://xplorestaging.ieee.org/ielx7/8482236/8500784/08500820.pdf?arnumber=8500820

المؤلفون: Estrada, Alepth H. Pacheco, Overney, Frederic

المصدر: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018)

الاتاحة: http://dx.doi.org/10.1109/cpem.2018.8500922
http://xplorestaging.ieee.org/ielx7/8482236/8500784/08500922.pdf?arnumber=8500922