-
1
المؤلفون: Kurt A. Rubin, Yongliang Yang, Arron Messinger, Dorai Iyer, Oskar Amster
المصدر: Microelectronics Reliability. :250-254
مصطلحات موضوعية: 0301 basic medicine, Materials science, Dopant, business.industry, Scanning capacitance microscopy, Condensed Matter Physics, 01 natural sciences, Capacitance, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, 010309 optics, 03 medical and health sciences, 030104 developmental biology, 0103 physical sciences, Nano, Microscopy, Optoelectronics, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, Electrical impedance, Microwave, Voltage
-
2
المؤلفون: Oskar Amster, Stuart Friedman, Yongliang Yang, Fred Stanke
المصدر: EDFA Technical Articles. 19:12-20
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
-
3
المؤلفون: Fred Stanke, Oskar Amster, Yongliang Yang, St. J. Dixon-Warren, Benedict Drevniok, Stuart Friedman
المصدر: Microelectronics Reliability. :214-217
مصطلحات موضوعية: 010302 applied physics, Materials science, Calibration curve, business.industry, Doping, Analytical chemistry, 02 engineering and technology, Scanning capacitance microscopy, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Scanning probe microscopy, 0103 physical sciences, Microscopy, Scanning ion-conductance microscopy, Calibration, Optoelectronics, Electrical and Electronic Engineering, 0210 nano-technology, Safety, Risk, Reliability and Quality, business, Microwave
-
4
المؤلفون: Shashank Misra, Oskar Amster, David Scrymgeour, Kurt A. Rubin, Yongliang Yang
المصدر: Electrical Atomic Force Microscopy for Nanoelectronics ISBN: 9783030156114
مصطلحات موضوعية: Permittivity, Fabrication, Materials science, Semiconductor, business.industry, Microscopy, Optoelectronics, Electronics, Dielectric, business, Electrical impedance, Microwave
-
5
المؤلفون: Kurt A. Rubin, Oskar Amster, A. Messinger, Dorai Iyer, Yongliang Yang, R. Crowder
المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Materials science, Microwave imaging, Semiconductor, business.industry, Doping, Microscopy, Optoelectronics, Semiconductor device, Image sensor, business, Electrical impedance, Microwave
-
6
المؤلفون: Oskar Amster, Y. Zhang, S. Friedman, A. Messinger, Dorai Iyer, R. Crowder, F. Stanke, Yongliang Yang
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Materials science, business.industry, Doping, Microscopy, Analytical chemistry, Optoelectronics, Dielectric, business, Electrical impedance, Microwave, Dielectric spectroscopy
-
7
المؤلفون: St. J. Dixon-Warren, Oskar Amster, Benedict Drevniok, Fred Stanke, Yongliang Yang, Stuart Friedman
المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: 010302 applied physics, Materials science, Dopant, business.industry, Calibration curve, Doping, Analytical chemistry, 02 engineering and technology, Semiconductor device, 021001 nanoscience & nanotechnology, 01 natural sciences, Scanning probe microscopy, Semiconductor, 0103 physical sciences, Microscopy, Calibration, Optoelectronics, 0210 nano-technology, business
-
8
المؤلفون: Ming-Hong Kao, Hui-Wen Yang, Wei-Shan Hu, Oskar Amster, Jeng-Han Lee, Peter De Wolf
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Quality (physics), Materials science, business.industry, Microscopy, Electronic engineering, Optoelectronics, Dielectric, business, Electrical impedance, Microwave, Fault detection and isolation
-
9
المؤلفون: Fred Stanke, Stuart Friedman, Oskar Amster, Yongliang Yang
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Capacitance voltage, Condensed Matter::Materials Science, Materials science, business.industry, Microscopy, Optoelectronics, business, Capacitance, Electrical impedance, Nanoscopic scale, Microwave, Characterization (materials science)
-
10
المؤلفون: Oskar Amster, Fred Stanke, Yongliang Yang, Stuart Friedman
المصدر: 2016 IEEE MTT-S International Microwave Symposium (IMS).
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, Doping, Nanotechnology, 02 engineering and technology, Scanning capacitance microscopy, 021001 nanoscience & nanotechnology, 01 natural sciences, Capacitance, Characterization (materials science), 0103 physical sciences, Microscopy, Microelectronics, Optoelectronics, 0210 nano-technology, business, Electrical impedance, Computer Science::Databases, Microwave
-
11
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Scanning probe microscopy, Materials science, Scanning voltage microscopy, business.industry, Microscopy, Scanning confocal electron microscopy, Scanning ion-conductance microscopy, Analytical chemistry, Optoelectronics, Scanning gate microscopy, Scanning capacitance microscopy, business, Vibrational analysis with scanning probe microscopy
-
12
المؤلفون: Stuart Friedman, Oskar Amster, Yongliang Yang
المصدر: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII.
مصطلحات موضوعية: Permittivity, Condensed Matter::Materials Science, Materials science, Microscopy, Physics::Optics, Nanotechnology, Dielectric, Capacitance, Nanoscopic scale, Microwave, Metrology, Characterization (materials science)