المؤلفون: Yamamoto, K., Tada, M., Kishimoto, Y., Shibata, M., Kominato, K., Ooishi, T., Yamada, S., Saida, T., Funahashi, H., Masaike, A., Matsuki, S.

مصطلحات موضوعية: High Energy Physics - Phenomenology

URL الوصول: http://arxiv.org/abs/hep-ph/0101200

المؤلفون: Takahashi, N., Wakutsu, R., Kato, T., Wakaizumi, T., Ooishi, T., Matsuoka, R.

المصدر: eISSN: 2194-9034

وصف الملف: application/pdf

Relation: https://isprs-archives.copernicus.org/articles/XLII-2-W6/371/2017/

الاتاحة: https://doi.org/10.5194/isprs-archives-XLII-2-W6-371-2017
https://isprs-archives.copernicus.org/articles/XLII-2-W6/371/2017/

المؤلفون: Fujii, B., Ooishi, T., Muto, H., Nakanishi, K., Ikeda, S.

المصدر: 1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena, ; volume b37 38, page 207-212

الاتاحة: http://dx.doi.org/10.1109/ceidp.1991.763359
http://xplorestaging.ieee.org/ielx5/6194/16526/00763359.pdf?arnumber=763359

المؤلفون: Furutani, K., Ooishi, T., Asakura, M., Hidaka, H., Ozaki, H.

المصدر: 1996 Symposium on VLSI Circuits. Digest of Technical Papers ; volume 26, page 70-71

الاتاحة: http://dx.doi.org/10.1109/vlsic.1996.507720
http://xplorestaging.ieee.org/ielx5/3766/11000/00507720.pdf?arnumber=507720

المؤلفون: Tomishima, S., Tsuji, T., Kawasaki, T., Ishikawa, M., Inokuchi, T., Kato, H., Tanizaki, H., Abe, W., Shibayama, A., Fukushima, Y., Niiro, M., Maruta, M., Uchikoba, T., Senoh, M., Sakamoto, S., Ooishi, T., Kikukawa, H., Hidaka, H., Takahashi, K.

المصدر: 2001 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC (Cat. No.01CH37177) ; page 384-385

الاتاحة: http://dx.doi.org/10.1109/isscc.2001.912684
http://xplorestaging.ieee.org/ielx5/7284/19686/00912684.pdf?arnumber=912684

المؤلفون: Kumaki, S., Takata, H., Ajioka, Y., Ooishi, T., Ishihara, K., Hanami, A., Tsuji, T., Kanehira, Y., Watanabe, T., Morishima, C., Yoshizawa, T., Sato, H., Hattori, S., Koshio, A., Tsukamoto, K., Matsumura, T.

المصدر: Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169) ; volume e83 a, page 425-428

الاتاحة: http://dx.doi.org/10.1109/cicc.2001.929815
http://xplorestaging.ieee.org/ielx5/7388/20084/00929815.pdf?arnumber=929815

المؤلفون: Ohtani, J., Ooishi, T., Kawagoe, T., Niiro, M., Maruta, M., Hidaka, H.

المصدر: Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169) ; page 187-190

الاتاحة: http://dx.doi.org/10.1109/cicc.2001.929752
http://xplorestaging.ieee.org/ielx5/7388/20084/00929752.pdf?arnumber=929752

المؤلفون: Ooishi, T., Asakura, M., Hidaka, H., Arimoto, K., Fujishima, K.

المصدر: Proceedings of the IEEE 1991 Custom Integrated Circuits Conference ; page 10.7/1-10.7/4

الاتاحة: http://dx.doi.org/10.1109/cicc.1991.164035
http://xplorestaging.ieee.org/ielx2/544/4251/00164035.pdf?arnumber=164035

المؤلفون: Okuno, T., Ooishi, T., Kato, T., Yokoyama, Y., Yoshida, M., Takahashi, Y., Makio, Y., Nishimura, M.

المصدر: OFC 2001. Optical Fiber Communication Conference and Exhibit. Technical Digest Postconference Edition (IEEE Cat. 01CH37171) ; volume 2, page TuH4-T1-3

الاتاحة: http://dx.doi.org/10.1109/ofc.2001.927324
http://xplorestaging.ieee.org/ielx5/7379/20048/00927324.pdf?arnumber=927324

المؤلفون: Kawagoe, T., Ohtani, J., Niiro, M., Ooishi, T., Hamada, M., Hidaka, H.

المصدر: Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)

الاتاحة: http://dx.doi.org/10.1109/test.2000.894250
http://xplorestaging.ieee.org/ielx5/7183/19342/00894250.pdf?arnumber=894250

المؤلفون: Ohno, S., Miyagi, A., Gotoh, T., Ganaha-Kikumura, T., Shiromoto, K., Kijima, K., Ooishi, T.

المصدر: Journal of Asia-Pacific Entomology ; volume 14, issue 3, page 281-284 ; ISSN 1226-8615

الاتاحة: http://dx.doi.org/10.1016/j.aspen.2011.03.007
https://api.elsevier.com/content/article/PII:S1226861511000434?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S1226861511000434?httpAccept=text/plain

المؤلفون: Ooishi, T., Yoshimura, M., Hama, H., Fujii, H., Nakanishi, K.

المصدر: Gaseous Dielectrics VII ; page 585-591 ; ISBN 9781489912978 9781489912954

الاتاحة: http://dx.doi.org/10.1007/978-1-4899-1295-4_113
http://link.springer.com/content/pdf/10.1007/978-1-4899-1295-4_113

المؤلفون: Kato, T., Hirano, M., Tada, A., Fukuada, K., Fujii, T., Ooishi, T., Yokoyama, Y., Yoshida, M., Onishi, M.

المصدر: Optical Fiber Technology ; volume 8, issue 3, page 231-239 ; ISSN 1068-5200

الاتاحة: http://dx.doi.org/10.1016/s1068-5200(02)00007-x
https://api.elsevier.com/content/article/PII:S106852000200007X?httpAccept=text/xml
https://api.elsevier.com/content/article/PII:S106852000200007X?httpAccept=text/plain

المؤلفون: Ooishi, T., Komiya, Y., Hamade, K., Asakura, M., Yasuda, K., Furutani, K., Kato, T., Hidaka, H., Ozaki, H.

المصدر: IEEE Journal of Solid-State Circuits ; volume 31, issue 4, page 575-585 ; ISSN 0018-9200

الاتاحة: http://dx.doi.org/10.1109/4.499735
http://xplorestaging.ieee.org/ielx4/4/10804/00499735.pdf?arnumber=499735

المؤلفون: Xiao Zhang, Okamura, L., Ooishi, T., Yuzhe Wang, Yoshihara, T.

المصدر: 2009 International Conference on Communications, Circuits & Systems; 2009, p657-660, 4p

المؤلفون: Kikukawa, H., Tomishima, S., Tsuji, T., Kawasaki, T., Sakamoto, S., Ishikawa, M., Abe, W., Tanizaki, H., Kato, H., Uchikoba, T., Inokuchi, T., Senoh, M., Fukushima, Y., Niiro, M., Maruta, M., Shibayama, A., Ooishi, T., Takahashi, K., Hidaka, H.

المصدر: Proceedings of the 27th European Solid-State Circuits Conference; 2001, p281-284, 4p

المؤلفون: Kumaki, S., Takata, H., Ajioka, Y., Ooishi, T., Ishihara, K., Hanami, A., Tsuji, T., Kanehira, Y., Watanabe, T., Morishima, C., Yoshizawa, T., Sato, H., Hattori, S., Koshio, A., Tsukamoto, K., Matsumura, T.

المصدر: Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169); 2001, p425-428, 4p

المؤلفون: Ohtani, J., Ooishi, T., Kawagoe, T., Niiro, M., Maruta, M., Hidaka, H.

المصدر: Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169); 2001, p187-190, 4p

المؤلفون: Kawagoe, T., Ohtani, J., Niiro, M., Ooishi, T., Hamada, M., Hidaka, H.

المصدر: Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159); 2000, p567-574, 8p

المؤلفون: Fujii, B., Ooishi, T., Muto, H., Nakanishi, K., Ikeda, S.

المصدر: 1991 Annual Report Conference on Electrical Insulation & Dielectric Phenomena; 1991, p207-212, 6p