المؤلفون: Mesic, A., Homan, T., Lenglet, A., Thit, P., Mar, H.T., Sabai, S.M., Thandar, M.P., Thwe, T.T., Kyaw, A.A., Decroo, T., Spina, A., Ariti, C., Ritmeijer, K., Olmen, J. Van, Oo, H.N., Lynen, L.

المصدر: International Health; 453; 461; 1876-3413; 4; 15; ~International Health~453~461~~~1876-3413~4~15~~

URL: https://repository.ubn.ru.nl/handle/2066/294551

المؤلفون: Olmen, J van, Criel, B, Bhojani, U, Marchal, B, Belle, S van, Chenge, M F, Hoerée, T, Pirard, M, Damme, W Van, Kegels, G

المساهمون: Directorate-General for Development Co-operation, funding the project Strategic Network on Health Systems

المصدر: Health, Culture and Society; Vol 2, No 1 (2012): Health System Dynamics and Barriers; 1-21 ; 2161-6590

وصف الملف: application/pdf

Relation: http://hcs.pitt.edu/ojs/index.php/hcs/article/view/71/96; http://hcs.pitt.edu/ojs/index.php/hcs/article/view/71

الاتاحة: http://hcs.pitt.edu/ojs/index.php/hcs/article/view/71
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المؤلفون: Minoglou, K., San Segundo Bello, D., Sabuncuoglu Tezcan, D., Haspeslagh, L., Olmen, J. van, Merry, B., Cavaco, C., Mazzamuto, F., Toqué-Trésonne, I., Moirin, R., Brouwer, E.A.M., Toccafondi, M., Preti, G., Rosmeulen, M., Moor, P. de

المصدر: Sodnik, Z.Cugny, B.Karafolas, N., International Conference on Space Optics, ICSO 2014, 7-10 October 2014, La Caleta, Tenerife, Canary Islands, 10563

مصطلحات موضوعية: Antireflection coatings, CMOS integrated circuits, Image sensors, Space applications, Space flight, Space research, Supply chains, Anti reflective coatings, Backside-illuminated, CMOS image sensor, Device characterization, Laser annealing, Space instruments, Image processing, Space & Scientific Instrumentation, Industrial Innovation, Physics & Electronics, OPT - Optics, TS - Technical Sciences

Relation: Proceedings of SPIE - The International Society for Optical Engineering; uuid:5c859de0-c622-4d08-beec-423d0b3f3964; 842176; http://resolver.tudelft.nl/uuid:5c859de0-c622-4d08-beec-423d0b3f3964

الاتاحة: http://resolver.tudelft.nl/uuid:5c859de0-c622-4d08-beec-423d0b3f3964

المؤلفون: Olmen, J. Van, Huyghebaert, C., Coenen, J., Aelst, J. Van, Sleeckx, E., Ammel, A. Van, Armini, S., Katti, G., Vaes, J., Dehaene, W., Beyne, E., Travaly, Y.

المصدر: Microelectronic Engineering ; volume 88, issue 5, page 745-748 ; ISSN 0167-9317

الاتاحة: http://dx.doi.org/10.1016/j.mee.2010.06.026
https://api.elsevier.com/content/article/PII:S0167931710002121?httpAccept=text/xml
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المؤلفون: Olmen, J. Van, Manca, J.V., Ceuninck, W. De, Schepper, L. De, D'Haeger, V., Witvrouw, A., Maex, K., Vandevelde, B., Beyne, E., Tielemans, L.

المصدر: Microelectronics Reliability; 1999, Vol. 39 Issue: 11 p1657-1665, 9p

المؤلفون: Olmen, J. Van, Manca, J. V., Ceuninck, W. De, Schepper, L. De, D'Haeger, V., Witvrouw, A., Maex, K.

المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1009-1014, 6p

المؤلفون: Ceuninck, W. A. De, D'Haeger, V., Olmen, J. Van, Witvrouw, A., Maex, K., Schepper, L. De, Pauw, P. De, Pergoot, A.

المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 1 p87-98, 12p

المؤلفون: Ceuninck, W. De, Manca, J., D'Haeger, V., Olmen, J. Van, Schepper, L. De, Stals, L. M.

المصدر: Microelectronics Reliability; 1997, Vol. 37 Issue: 12 p1813-1816, 4p

المؤلفون: Olmen, J. Van, Ceuninck, W. De, Schepper, L. De, Goldoni, A., Cervini, A., Fantini, F.

المصدر: Microelectronics Reliability; 1997, Vol. 37 Issue: 10 p1483-1486, 4p