المؤلفون: Balen, Tiago Roberto, González Aguilera, Carlos Julio, Oliveira, Ingrid F.V., Schvittz, Rafael Budim, Added, Nemitala, Macchione, Eduardo, Aguiar, Vitor A. P., Guazzelli, Marcilei Aparecida, Medina, Nilberto Hedar, Butzen, Paulo Francisco

المساهمون: Institute of Electrical and Electronics Engineers, IEEE Latin-American Test Symposium (22. : 2021 : online)

مصطلحات موضوعية: Radiation effects, Approximate computing, Reliability, TMR, ATMR, Simulação computacional, Tolerância a falhas, Microeletrônica

وصف الملف: application/pdf

Relation: IEEE Latin-American Test Symposium (22. : 2021 : online). Proceedings [recurso eletrônico]. Piscataway : IEEE, 2021.; http://hdl.handle.net/10183/240673; 001141445

الاتاحة: http://hdl.handle.net/10183/240673