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المؤلفون: J. S. Steckel, E. Josse, A. G. Pattantyus-Abraham, M. Bidaud, B. Mortini, H. Bilgen, O. Arnaud, S. Allegret-Maret, F. Saguin, L. Mazet, S. Lhostis, T. Berger, K. Haxaire, L. L. Chapelon, L. Parmigiani, P. Gouraud, M. Brihoum, P. Bar, M. Guillermet, S. Favreau, R. Duru, J. Fantuz, S. Ricq, D. Ney, I. Hammad, D. Roy, A. Arnaud, B. Vianne, G. Nayak, N. Virollet, V. Farys, P. Malinge, A. Tournier, F. Lalanne, A. Crocherie, J. Galvier, S. Rabary, O. Noblanc, H. Wehbe-Alause, S. Acharya, A. Singh, J. Meitzner, D. Aher, H. Yang, J. Romero, B. Chen, C. Hsu, K. C. Cheng, Y. Chang, M. Sarmiento, C. Grange, E. Mazaleyrat, K. Rochereau
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
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المؤلفون: Bertrand Szelag, D. Muller, C. Rossato, F. Judong, Alexandre Giry, F. Blanchet, O. Noblanc, A. Monroy Aguirre, Raphaël Sommet, Denis Pache
المصدر: IEEE Transactions on Electron Devices. 54:861-868
مصطلحات موضوعية: LDMOS, Engineering, business.industry, Semiconductor device fabrication, Amplifier, RF power amplifier, Transistor, Electrical engineering, Electronic, Optical and Magnetic Materials, law.invention, law, MOSFET, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Power semiconductor device, Radio frequency, Electrical and Electronic Engineering, business
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المؤلفون: Clement Tavernier, O. Nier, M. Casse, Frederic Monsieur, Michel Haond, J-C. Barbe, Herve Jaouen, Joris Lacord, O. Noblanc, G. Torrente, Yann-Michel Niquet, F.G. Pereira, François Triozon, M-A. Jaud, Denis Rideau
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Département Géochimie, environnement, écoulement, réacteurs industriels et cristallisation (GENERIC-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-SPIN, Laboratory of Atomistic Simulation (LSIM ), Modélisation et Exploration des Matériaux (MEM), Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])-Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Deutsch, Thierry, Institut de Recherche Interdisciplinaire de Grenoble (IRIG), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Grenoble Alpes [2016-2019] (UGA [2016-2019])
المصدر: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Sep 2015, Washington DC, France. pp.4-7مصطلحات موضوعية: 010302 applied physics, Computer science, Semiconductor device modeling, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Semiconductor process simulation, 021001 nanoscience & nanotechnology, 01 natural sciences, [PHYS.COND.CM-MS] Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], Reliability engineering, Reliability (semiconductor), Strain engineering, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology, Technology CAD, ComputingMilieux_MISCELLANEOUS
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المؤلفون: D. Defives, O. Noblanc, F. Wyczisk, O. Durand, F. Meyer, C. Brylinski
المصدر: Microelectronic Engineering. 55:369-374
مصطلحات موضوعية: Auger electron spectroscopy, Materials science, business.industry, Schottky barrier, Fermi level, Schottky diode, chemistry.chemical_element, Tungsten, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, symbols.namesake, Optics, chemistry, symbols, Electrical measurements, Metallizing, Electrical and Electronic Engineering, Composite material, business, Surface states
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5
المؤلفون: C. Brisset, C. Picard, F. Joffre, O. Noblanc, C. Brylinski
المصدر: IEEE Transactions on Nuclear Science. 47:598-603
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Wide-bandgap semiconductor, Substrate (electronics), Buffer (optical fiber), Nuclear Energy and Engineering, Total dose, Optoelectronics, MESFET, Irradiation, Electrical and Electronic Engineering, business, Layer (electronics), Electrical conductor
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المؤلفون: Anelia Kakanakova-Georgieva, C. Arnodo, O. Noblanc, S. Cassette, Roumen Kakanakov, Ts. Marinova, C. Brylinski, Liliana Kassamakova
المصدر: Applied Surface Science. 151:225-232
مصطلحات موضوعية: Annealing (metallurgy), Schottky barrier, Analytical chemistry, General Physics and Astronomy, Schottky diode, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, Tungsten, Condensed Matter Physics, Surfaces, Coatings and Films, chemistry.chemical_compound, X-ray photoelectron spectroscopy, chemistry, Tungsten carbide, Silicide, Tungsten nitride
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المؤلفون: C. Arnodo, Ts. Marinova, Anelia Kakanakova-Georgieva, S. Cassette, O. Noblanc, C. Brylinski
المصدر: Thin Solid Films. :637-641
مصطلحات موضوعية: Materials science, Annealing (metallurgy), Metals and Alloys, Schottky diode, chemistry.chemical_element, Surfaces and Interfaces, Tungsten, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Nickel, chemistry, Transition metal, X-ray photoelectron spectroscopy, Chemical engineering, Materials Chemistry, Silicon carbide, Ohmic contact
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المؤلفون: C. Brylinski, Ts. Marinova, C. Arnodo, Anelia Kakanakova-Georgieva, O. Noblanc, S. Cassette
المصدر: Thin Solid Films. 337:180-183
مصطلحات موضوعية: Inert, Materials science, Annealing (metallurgy), Metals and Alloys, Analytical chemistry, Schottky diode, chemistry.chemical_element, Surfaces and Interfaces, Tungsten, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, X-ray photoelectron spectroscopy, chemistry, Transition metal, Tungsten carbide, Silicide, Materials Chemistry
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المؤلفون: S. Cassette, Tz Djambova, Ivan Kassamakov, Ts. Marinova, Christian Brylinski, Anelia Kakanakova-Georgieva, C. Arnodo, Liliana Kassamakova, Roumen Kakanakov, O. Noblanc
المصدر: Semiconductor Science and Technology. 13:1025-1030
مصطلحات موضوعية: Annealing (metallurgy), Chemistry, Analytical chemistry, Schottky diode, Thermal treatment, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, X-ray photoelectron spectroscopy, Materials Chemistry, Breakdown voltage, Thermal stability, Electrical and Electronic Engineering, Voltage, Diode
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المؤلفون: Anelia Kakanakova-Georgieva, C. Brylinski, Attila Sulyok, Ts. Marinova, György Radnóczi, Roumen Kakanakov, C. Arnodo, Béla Pécz, O. Noblanc, S. Cassette, Liliana Kassamakova
المصدر: Materials Science Forum. :817-820
مصطلحات موضوعية: Materials science, Mechanical Engineering, Analytical chemistry, Schottky diode, chemistry.chemical_element, Tungsten, Condensed Matter Physics, Dissociation (chemistry), chemistry.chemical_compound, X-ray photoelectron spectroscopy, chemistry, Mechanics of Materials, Sputtering, Tungsten carbide, Silicide, General Materials Science, Thermal stability
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المؤلفون: C. Arnodo, Anelia Kakanakova-Georgieva, O. Noblanc, S. Cassette, Ts. Marinova, C. Brylinski
المصدر: Applied Surface Science. :208-212
مصطلحات موضوعية: Materials science, Titanium carbide, Alloy, General Physics and Astronomy, chemistry.chemical_element, Surfaces and Interfaces, General Chemistry, engineering.material, Condensed Matter Physics, Surfaces, Coatings and Films, Chemical state, chemistry.chemical_compound, X-ray photoelectron spectroscopy, Transition metal, chemistry, Chemical engineering, engineering, Silicon carbide, Platinum, Titanium
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المؤلفون: C. Arnodo, E. Chartier, Christian Brylinski, O. Noblanc
المصدر: Diamond and Related Materials. 6:1508-1511
مصطلحات موضوعية: Power-added efficiency, Materials science, business.industry, Mechanical Engineering, Transistor, General Chemistry, Substrate (electronics), Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, law, Materials Chemistry, Silicon carbide, Optoelectronics, Breakdown voltage, MESFET, Electrical and Electronic Engineering, business, Electrical conductor, Microwave
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المؤلفون: C. Arnodo, Christian Brylinski, György Radnóczi, S. Cassette, O. Noblanc, Béla Pécz
المصدر: Diamond and Related Materials. 6:1428-1431
مصطلحات موضوعية: Void (astronomy), Materials science, Annealing (metallurgy), Mechanical Engineering, Metallurgy, General Chemistry, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, Nickel silicide, stomatognathic system, chemistry, Transmission electron microscopy, Electrical resistivity and conductivity, law, Materials Chemistry, Silicon carbide, Electrical and Electronic Engineering, Electron microscope, Composite material, Ohmic contact
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المؤلفون: Béla Pécz, C. Brylinski, O. Noblanc, S. Cassette, V. Krastev, Anelia Kakanakova-Georgieva, C. Arnodo, György Radnóczi, M. Neshev, Ts. Marinova, Liliana Kassamakova, Gy. Vincze, Roumen Kakanakov
المصدر: Materials Science and Engineering: B. 46:223-226
مصطلحات موضوعية: Materials science, Kirkendall effect, Mechanical Engineering, Contact resistance, Metallurgy, chemistry.chemical_element, Condensed Matter Physics, Dissociation (chemistry), Metal, chemistry.chemical_compound, Nickel, stomatognathic system, chemistry, Mechanics of Materials, visual_art, Silicon carbide, visual_art.visual_art_medium, General Materials Science, Thermal stability, Composite material, Ohmic contact
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المؤلفون: O. Noblanc, P. Gaucher
المصدر: Ferroelectrics. 187:227-235
مصطلحات موضوعية: Materials science, Electrostriction, Acoustics, Vibration control, Resonance, Condensed Matter Physics, Piezoelectricity, Electronic, Optical and Magnetic Materials, Amplitude, Active vibration control, visual_art, visual_art.visual_art_medium, Ceramic, Actuator
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المؤلفون: P. Gaucher, O. Noblanc
المصدر: Ferroelectrics. 160:145-155
مصطلحات موضوعية: Permittivity, Materials science, Piezoelectric coefficient, Electrostriction, Dielectric, Condensed Matter Physics, Ferroelectricity, Piezoelectricity, Titanate, Electronic, Optical and Magnetic Materials, visual_art, visual_art.visual_art_medium, Ceramic, Composite material
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المؤلفون: P. Gaucher, C. Deljurie, O. Noblanc
المصدر: Journal of the European Ceramic Society. 11:69-75
مصطلحات موضوعية: chemistry.chemical_classification, Materials science, Dopant, Inorganic chemistry, Doping, Electron donor, Electron acceptor, chemistry.chemical_compound, Crystallography, chemistry, Phase (matter), Materials Chemistry, Ceramics and Composites, Degradation (geology), Electroceramics, Perovskite (structure)
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المؤلفون: F. Blanchet, O. Noblanc, Frederic Monsieur, C. Raynaud, R.A. Bianchi
المصدر: CICC
مصطلحات موضوعية: Computer science, business.industry, RF power amplifier, Electrical engineering, Silicon on insulator, High voltage, Hardware_PERFORMANCEANDRELIABILITY, Reliability (semiconductor), CMOS, Gate oxide, Logic gate, Hardware_INTEGRATEDCIRCUITS, Baseband, Electronic engineering, business, Hardware_LOGICDESIGN
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المؤلفون: J. C. Giraudin, O. Noblanc, Ph. Benech, Daniel Gloria, C. Pastore, Frederic Gianesello
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), STMicroelectronics [Crolles] (ST-CROLLES), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Institut National Polytechnique de Grenoble (INPG)-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Centre National de la Recherche Scientifique (CNRS)
المصدر: SIRF 2009
SIRF 2009, Jan 2009, San Diego, Californie, United Statesمصطلحات موضوعية: Engineering, business.industry, 020208 electrical & electronic engineering, RF power amplifier, Electrical engineering, chemistry.chemical_element, 020206 networking & telecommunications, 02 engineering and technology, Inductor, Copper, Power (physics), Back end of line, chemistry, CMOS, Q factor, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Radio frequency, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, ComputingMilieux_MISCELLANEOUS
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المؤلفون: J. F. Broch, O. Noblanc, J. P. Prigent, Farid Temcamani, P. Pouvil
المصدر: Microwave and Optical Technology Letters. 23:16-18
مصطلحات موضوعية: LDMOS, Materials science, Silicon, business.industry, Amplifier, Electrical engineering, chemistry.chemical_element, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, Ultra high frequency, chemistry, Broadband, Silicon carbide, Optoelectronics, MESFET, Electrical and Electronic Engineering, business, Microwave
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9cd83a1414e0ed9cf4e5583273378643
https://doi.org/10.1002/(sici)1098-2760(19991005)23:1<16::aid-mop5>3.0.co;2-f