المؤلفون: E. Gurer, B. Dickson, P. Dupeyrat, J.-C. Royer, N. Cabuil, D. Barge, M. Kwan, O. Doclot, A. Le Gouil

المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 26:805-811

مصطلحات موضوعية: Materials science, Fabrication, X-ray photoelectron spectroscopy, Gate oxide, Semiconductor device fabrication, Analytical chemistry, Process control, Wafer, Surfaces and Interfaces, Thin film, Condensed Matter Physics, Nitriding, Surfaces, Coatings and Films

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8ac4b80e6f05b925f1b1599f323b785d
https://doi.org/10.1116/1.2902966

المؤلفون: O. Doclot, J.-C. Sabadel, E. Philippot, Alain Ibanez, P. Armand, D. Cachau-Herreillat, Patrice L. Baldeck

المصدر: Journal of Solid State Chemistry. 132:411-419

مصطلحات موضوعية: business.industry, Chemistry, Infrared, Nonlinear optics, Infrared spectroscopy, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Inorganic Chemistry, symbols.namesake, Optics, Materials Chemistry, Ceramics and Composites, symbols, Physical chemistry, Z-scan technique, Physical and Theoretical Chemistry, Tellurium oxide, Ternary operation, Raman spectroscopy, business, Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5525cabdc8406e8540708e05c6cf16c6
https://doi.org/10.1006/jssc.1997.7499

المؤلفون: Patrice L. Baldeck, O. Doclot, P. Feneyrou, D. Block, J. Zyss

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, Physics and Astronomy (miscellaneous), Absorption spectroscopy, Extended X-ray absorption fine structure, business.industry, Absorption cross section, Molecular axis, Polarization (waves), Two-photon absorption, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Nonlinear optical, Optics, Optical limiting, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6743d3c294faf13e8a7d30b92035fe0
https://doi.org/10.1142/s0218863596000544

المؤلفون: N. Cabuil, A. Le Gouil, B. Dickson, A. Lagha, M. Aminpur, C. Chaton, J.-C. Royer, O. Doclot, David G. Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M. Secula

المصدر: AIP Conference Proceedings.

مصطلحات موضوعية: Amorphous silicon, Fabrication, Materials science, Silicon, business.industry, Analytical chemistry, chemistry.chemical_element, chemistry.chemical_compound, chemistry, X-ray photoelectron spectroscopy, Amorphous carbon, Gate oxide, Optoelectronics, Wafer, Thin film, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0fa3581057906f4833eeafcb9f553991
https://doi.org/10.1063/1.2799368

المؤلفون: Jean-Michel Nunzi, P. Feneyrou, S. Delysse, D. Block, Patrice L. Baldeck, O. Doclot

المصدر: Scopus-Elsevier

مصطلحات موضوعية: Materials science, Absorption spectroscopy, business.industry, Physics::Optics, Resonance, Molecular physics, Two-photon absorption, Atomic and Molecular Physics, and Optics, symbols.namesake, Optics, Ellipsometry, symbols, Molecule, business, Raman spectroscopy, Absorption (electromagnetic radiation), Refractive index

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b3efb5f9724e6c5199767802aeedde0d
https://doi.org/10.1364/ol.22.001132