المؤلفون: Niccolò Rinaldi, Michael Schröter

مصطلحات موضوعية: Silicon-Germanium, Bipolar Transistors, mm-wave Systems Technology, HBT Technology, Device Simulation, Compact Modeling, mm-Wave Calibration, Reliability, Millimeter-wave circuits

Relation: https://d-nb.info/gnd/978-87-93519-61-9 (ISBN); https://zenodo.org/communities/fp7postgrantoapilotoutputs; https://zenodo.org/communities/eu; oai:zenodo.org:1200487

الاتاحة: https://doi.org/10.13052/rp-9788793519602

المؤلفون: Niccolò Rinaldi

المصدر: SocietàMutamentoPolitica: Rivista Italiana di Sociologia, Vol 2, Iss 3 (2011)

مصطلحات موضوعية: Italia, Europa, Sociology (General), HM401-1281

Relation: https://oajournals.fupress.net/index.php/smp/article/view/10262; https://doaj.org/toc/2038-3150; https://doaj.org/article/1bb71ae279024dca8b722735d8ca6674

الاتاحة: https://doi.org/10.13128/SMP-10321
https://doaj.org/article/1bb71ae279024dca8b722735d8ca6674

المؤلفون: Antonio Pio Catalano, Michele Riccio, Lorenzo Codecasa, Alessandro Magnani, Gianpaolo Romano, Vincenzo d'Alessandro, Luca Maresca, Niccolo' Rinaldi, Giovanni Breglio, Andrea Irace

المساهمون: Catalano, ANTONIO PIO, Riccio, Michele, Codecasa, Lorenzo, Magnani, Alessandro, Romano, Gianpaolo, D'Alessandro, Vincenzo, Maresca, Luca, Rinaldi, Niccolo', Breglio, Giovanni, Irace, Andrea

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-3-319-93081-7; ispartofbook:Proceedings of APPLications in Electronics Pervading Industry, Environment and Society (ApplePies); volume:512; firstpage:81; lastpage:87; numberofpages:7; serie:LECTURE NOTES IN ELECTRICAL ENGINEERING; http://hdl.handle.net/11588/711327; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85050403743

الاتاحة: http://hdl.handle.net/11588/711327
https://doi.org/10.1007/978-3-319-93082-4_11

المؤلفون: Vincenzo d'Alessandro, Cristell Maneux, Gerhard G. Fischer, Klaus Aufinger, Alessandro Magnani, Salvatore Russo, Niccolo' Rinaldi

المساهمون: Michael Schroter, Niccolo' Rinaldi, D'Alessandro, Vincenzo, Maneux, Cristell, Fischer, Gerhard G., Aufinger, Klau, Magnani, Alessandro, Russo, Salvatore, Rinaldi, Niccolo'

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______3730::c1274e83a15b82aa3e0f697c90fa4e72
http://hdl.handle.net/11588/711098

المؤلفون: Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Olivier Daniel, Dario D'Amore, Alessandro Magnani, Vincenzo d'Alessandro, Niccolo' Rinaldi

المساهمون: Rogié, Brice, Codecasa, Lorenzo, Monier-Vinard, Eric, Bissuel, Valentin, Laraqi, Najib, Daniel, Olivier, D'Amore, Dario, Magnani, Alessandro, D'Alessandro, Vincenzo, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-1928-5; info:eu-repo/semantics/altIdentifier/wos/WOS:000463488300030; ispartofbook:Proceedings of IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); http://hdl.handle.net/11588/711317; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85045844973

الاتاحة: http://hdl.handle.net/11588/711317
https://doi.org/10.1109/THERMINIC.2017.8233812

المؤلفون: Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi

المساهمون: Codecasa, Lorenzo, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-1928-5; info:eu-repo/semantics/altIdentifier/wos/WOS:000463488300031; ispartofbook:Proceedings of IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); http://hdl.handle.net/11588/711311; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85045855710

الاتاحة: http://hdl.handle.net/11588/711311
https://doi.org/10.1109/THERMINIC.2017.8233813

المؤلفون: Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi

المساهمون: Codecasa, Lorenzo, Bornoff, Robin, Dyson, Jame, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5386-1928-5; info:eu-repo/semantics/altIdentifier/wos/WOS:000463488300028; ispartofbook:Proceedings of IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); IEEE 23rd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); http://hdl.handle.net/11588/711308; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85045848322

الاتاحة: http://hdl.handle.net/11588/711308
https://doi.org/10.1109/THERMINIC.2017.8233810

المؤلفون: Antonio Pio Catalano, Alessandro Magnani, Vincenzo d'Alessandro, Lorenzo Codecasa, Niccolo' Rinaldi, Brian Moser, Peter J. Zampardi

المساهمون: Catalano, ANTONIO PIO, Magnani, Alessandro, D'Alessandro, Vincenzo, Codecasa, Lorenzo, Rinaldi, Niccolo', Moser, Brian, Zampardi, Peter J.

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5090-6069-6; info:eu-repo/semantics/altIdentifier/wos/WOS:000424784000026; ispartofbook:Proceedings of IEEE Compound Semiconductor IC Symposium (CSICS); IEEE Compound Semiconductor IC Symposium (CSICS); http://hdl.handle.net/11588/711320; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85046149437

الاتاحة: http://hdl.handle.net/11588/711320
https://doi.org/10.1109/CSICS.2017.8240444

المؤلفون: Antonio Pio Catalano, Alessandro Magnani, Vincenzo d'Alessandro, Lorenzo Codecasa, Peter J. Zampardi, Brian Moser, Niccolo' Rinaldi

المساهمون: Catalano, ANTONIO PIO, Magnani, Alessandro, D'Alessandro, Vincenzo, Codecasa, Lorenzo, Zampardi, Peter J., Moser, Brian, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5090-6507-3; info:eu-repo/semantics/altIdentifier/wos/WOS:000426907000059; ispartofbook:Proceedings of IEEE 13th Conference on PhD Research in Microelectronics and Electronics (PRIME); IEEE 13th Conference on PhD Research in Microelectronics and Electronics (PRIME); firstpage:233; lastpage:236; numberofpages:4; http://hdl.handle.net/11588/711234; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85027585885

الاتاحة: http://hdl.handle.net/11588/711234
https://doi.org/10.1109/PRIME.2017.7974150

المؤلفون: Antonio Pio Catalano, Vincenzo d'Alessandro, Gianpaolo Romano, Michele Riccio, Alessandro Magnani, Lorenzo Codecasa, Niccolo' Rinaldi, Andrea Irace, Giovanni Breglio

المساهمون: Catalano, ANTONIO PIO, D'Alessandro, Vincenzo, Romano, Gianpaolo, Riccio, Michele, Magnani, Alessandro, Codecasa, Lorenzo, Rinaldi, Niccolo', Irace, Andrea, Breglio, Giovanni

Relation: ispartofbook:Proceedings of 47th GE/SIE Conference; 49th SIE Conference; firstpage:82; lastpage:83; numberofpages:2; http://hdl.handle.net/11588/711304

الاتاحة: http://hdl.handle.net/11588/711304

المؤلفون: Niccolò Rinaldi, Michael Schröter

Resource Type: eBook.

الموضوعات: Silicon alloys, Bipolar transistors

Categories: SCIENCE / Energy

المؤلفون: Lorenzo Codecasa, Robin Bornoff, James Dyson, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi

المساهمون: Codecasa, Lorenzo, Bornoff, Robin, Dyson, Jame, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo'

مصطلحات موضوعية: Boundary Condition Independent (BCI), Dynamic Compact Thermal Model (DCTM), Independent Heat Source (IHS), Model Order Reduction (MOR)

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000441856500022; volume:87; firstpage:194; lastpage:205; numberofpages:12; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11588/711024; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85049063094

الاتاحة: http://hdl.handle.net/11588/711024
https://doi.org/10.1016/j.microrel.2018.03.030

المؤلفون: Vincenzo d’Alessandro, Rosario D’Esposito, Andre G. Metzger, Kai H. Kwok, Klaus Aufinger, Thomas Zimmer, Niccolo' Rinaldi

المساهمون: D’Alessandro, Vincenzo, D’Esposito, Rosario, Metzger, Andre G., Kwok, Kai H., Aufinger, Klau, Zimmer, Thoma, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000423124500008; volume:65; issue:2; firstpage:431; lastpage:439; numberofpages:9; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; info:eu-repo/grantAgreement/EC/FP7/316755; http://hdl.handle.net/11588/710757; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85040621368

الاتاحة: http://hdl.handle.net/11588/710757
https://doi.org/10.1109/TED.2017.2785269

المؤلفون: Brice Rogié, Lorenzo Codecasa, Eric Monier-Vinard, Valentin Bissuel, Najib Laraqi, Oliver Daniel, Dario D’Amore, Alessandro Magnani, Vincenzo d’Alessandro, Niccolo' Rinaldi

المساهمون: Rogié, Brice, Codecasa, Lorenzo, Monier-Vinard, Eric, Bissuel, Valentin, Laraqi, Najib, Daniel, Oliver, D’Amore, Dario, Magnani, Alessandro, D’Alessandro, Vincenzo, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000441856500025; volume:87; firstpage:222; lastpage:231; numberofpages:10; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11588/767133; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85049357096

الاتاحة: http://hdl.handle.net/11588/767133
https://doi.org/10.1016/j.microrel.2018.06.009

المؤلفون: Michael Schroeter, Josef Boeck, Vincenzo d'Alessandro, Sebastien Fregonese, Bernd Heinemann, Christoph Jungemann, W. Liang, Hamed Kamrani, Anindya Mukherjee, Andreas Pawlak, Ulrich Pfeiffer, Niccolo' Rinaldi, Neelanjan Sarmah, Thomas Zimmer

المساهمون: Schroeter, Michael, Boeck, Josef, D'Alessandro, Vincenzo, Fregonese, Sebastien, Heinemann, Bernd, Jungemann, Christoph, Liang, W., Kamrani, Hamed, Mukherjee, Anindya, Pawlak, Andrea, Pfeiffer, Ulrich, Rinaldi, Niccolo', Sarmah, Neelanjan, Zimmer, Thomas

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5090-1608-2; info:eu-repo/semantics/altIdentifier/wos/WOS:000391432400003; ispartofbook:Proceedings of IEEE Compound Semiconductor IC Symposium (CSICS); IEEE Compound Semiconductor IC Symposium (CSICS); http://hdl.handle.net/11588/648887; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85006069999

الاتاحة: http://hdl.handle.net/11588/648887
https://doi.org/10.1109/CSICS.2016.7751070

المؤلفون: Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi

المساهمون: Codecasa, Lorenzo, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/isbn/978-1-5090-5450-3; info:eu-repo/semantics/altIdentifier/wos/WOS:000390754600011; ispartofbook:Proceedings of IEEE 22nd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); IEEE 22nd international workshop on THERMal INvestigations of ICs and systems (THERMINIC); firstpage:69; lastpage:75; numberofpages:7; http://hdl.handle.net/11588/648884; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85006915677

الاتاحة: http://hdl.handle.net/11588/648884
https://doi.org/10.1109/THERMINIC.2016.7748650

المؤلفون: Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi

المساهمون: Codecasa, Lorenzo, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo'

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000417774400044; volume:79; firstpage:371; lastpage:379; numberofpages:9; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11588/710764; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85018977617

الاتاحة: http://hdl.handle.net/11588/710764
https://doi.org/10.1016/j.microrel.2017.04.025

المؤلفون: Hamed Kamrani, Dominic Jabs, Vincenzo d’Alessandro, Niccolo' Rinaldi, Klaus Aufinger, Christoph Jungemann

المساهمون: Kamrani, Hamed, Jabs, Dominic, D’Alessandro, Vincenzo, Rinaldi, Niccolo', Aufinger, Klau, Jungemann, Christoph

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000394691600004; volume:64; issue:2; firstpage:361; lastpage:367; numberofpages:7; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; info:eu-repo/grantAgreement/EC/FP7/316755; http://hdl.handle.net/11588/710447; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85009920714

الاتاحة: http://hdl.handle.net/11588/710447
https://doi.org/10.1109/TED.2016.2640343

المؤلفون: Lorenzo Codecasa, Vincenzo d'Alessandro, Alessandro Magnani, Niccolo' Rinaldi, Andre G. Metzger, Robin Bornoff, John Parry

المساهمون: Codecasa, Lorenzo, D'Alessandro, Vincenzo, Magnani, Alessandro, Rinaldi, Niccolo', Metzger, Andre G., Bornoff, Robin, Parry, John

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000417774400043; volume:79; firstpage:361; lastpage:370; numberofpages:10; journal:MICROELECTRONICS RELIABILITY; http://hdl.handle.net/11588/711229; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85025473693

الاتاحة: http://hdl.handle.net/11588/711229
https://doi.org/10.1016/j.microrel.2017.06.059

المؤلفون: Hamed Kamrani, Dominic Jabs, Vincenzo d’Alessandro, Niccolo' Rinaldi, Thomas Jacquet, Cristell Maneux, Thomas Zimmer, Klaus Aufinger, Christoph Jungemann

المساهمون: Kamrani, Hamed, Jabs, Dominic, D’Alessandro, Vincenzo, Rinaldi, Niccolo', Jacquet, Thoma, Maneux, Cristell, Zimmer, Thoma, Aufinger, Klau, Jungemann, Christoph

مصطلحات موضوعية: Boltzmann transport equations (BTEs), hot-carrier degradation (HCD), impact ionization (II), safeoperating area (SOA), SiGe heterojunction bipolar transistor (HBT), spherical harmonics expansion (SHE).

Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000396056700029; volume:64; issue:3; firstpage:923; lastpage:929; numberofpages:7; journal:IEEE TRANSACTIONS ON ELECTRON DEVICES; info:eu-repo/grantAgreement/EC/FP7/316755; http://hdl.handle.net/11588/710448; info:eu-repo/semantics/altIdentifier/scopus/2-s2.0-85011701658

الاتاحة: http://hdl.handle.net/11588/710448
https://doi.org/10.1109/TED.2017.2653197