يعرض 1 - 20 نتائج من 174 نتيجة بحث عن '"Newcomb, S. B."', وقت الاستعلام: 0.67s تنقيح النتائج
  1. 1
    Book

    المؤلفون: Foord, D. T., Newcomb, S. B.

    المصدر: Microscopy of Oxidation ; page 374-386 ; ISBN 9781003575825

  2. 2
    Book

    المصدر: Microscopy of Oxidation ; page 150-161 ; ISBN 9781003575825

  3. 3
    Book
  4. 4
    Academic Journal

    المساهمون: Povey, Ian M/0000-0002-7877-6664, Povey, Ian/0000-0002-7877-6664, Afanas'ev, Valeri/0000-0001-5018-4539, Hurley, Paul/0000-0001-5137-721X, Brammertz, Guy/0000-0003-1404-7339, Pemble, Martyn/0000-0002-2349-4520

    وصف الملف: application/pdf

    Relation: Applied physics letters, 94 (20) (Art N° 202110); http://hdl.handle.net/1942/31648; 20; 94; WOS:000266342800035

  5. 5
    Book

    المصدر: Microscopy of Semiconducting Materials 2003 ; page 413-416 ; ISBN 9781351074636

  6. 6
    Book

    المؤلفون: Newcomb, S B

    المصدر: Electron Microscopy and Analysis 1997 ; page 289-294 ; ISBN 9781003063056

  7. 7
    Academic Journal

    جغرافية الموضوع: NEW YORK

    Relation: instname: Conicyt; reponame: Repositorio Digital RI2.0; info:eu-repo/grantAgreement/Fondecyt/1050344; info:eu-repo/semantics/dataset/hdl.handle.net/10533/93477; https://doi.org/10.1149/1.2746556; 1050344; WOS:000247572100082; https://hdl.handle.net/10533/178393

  8. 8
    Dissertation/ Thesis
  9. 9
    Academic Journal

    المصدر: Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1986 Aug . 319(1546), 191-218.

  10. 10
    Academic Journal

    المصدر: Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences, 1986 Aug . 319(1546), 219-247.

  11. 11
    Conference

    المساهمون: Povey, Ian M/0000-0002-7877-6664, heyns, marc/0000-0002-1199-4341, Vogel, Eric M/0000-0002-6110-1361, Wallace, Robert, M./0000-0001-5566-4806, Povey, Ian/0000-0002-7877-6664, Afanas'ev, Valeri/0000-0001-5018-4539, Monaghan, S/0000-0002-9006-9890, Pemble, Martyn/0000-0002-2349-4520, Cherkaoui, Karim/0000-0002-7062-5570, Hurley, Paul/0000-0001-5137-721X, Brammertz, Guy/0000-0003-1404-7339

    Relation: ECS Transactions; ECS Transactions (Ed.). PHYSICS AND TECHNOLOGY OF HIGH-K GATE DIELECTRICS 7, ELECTROCHEMICAL SOC INC, p. 113 -127; http://hdl.handle.net/1942/31664; 127; 113; WOS:000338086300011

  12. 12
    Academic Journal
  13. 13
    Academic Journal

    وصف الملف: application/pdf

    Relation: info:eu-repo/grantAgreement/SFI/SFI Principal Investigator Programme (PI)/09/IN.1/I2633/IE/Investigating Emerging Non-Silicon Transistors (INVENT)/; Toomey, B., Cherkaoui, K., Monaghan, S., Djara, V., O’Connor, É., O’Connell, D., Oberbeck, L., Tois, E., Blomberg, T., Newcomb, S. B. and Hurley, P. K. (2012) 'The structural and electrical characterization of a HfErOx dielectric for MIM capacitor DRAM applications', Microelectronic Engineering, 94, pp. 7-10. doi:10.1016/j.mee.2012.01.001; 10; Microelectronic Engineering; http://hdl.handle.net/10468/13329; 94

  14. 14
  15. 15
    Academic Journal
  16. 16
    Academic Journal
  17. 17
    Academic Journal
  18. 18
    Academic Journal
  19. 19
    Academic Journal
  20. 20
    Academic Journal

    المصدر: Superlattices and microstructures 42, 332 (2007). doi:10.1016/j.spmi.2007.04.015

    مصطلحات موضوعية: info:eu-repo/classification/ddc/530

    جغرافية الموضوع: DE

    Relation: info:eu-repo/semantics/altIdentifier/wos/WOS:000250271200059; info:eu-repo/semantics/altIdentifier/issn/1096-3677; info:eu-repo/semantics/altIdentifier/issn/0749-6036; https://bib-pubdb1.desy.de/record/82682; https://bib-pubdb1.desy.de/search?p=id:%22PHPPUBDB-3958%22