المؤلفون: Qiwen Liao, Nan Qi , Member, IEEE, Miaofeng Li, Shang Hu, Jian He, Bozhi Yin, Jingbo Shi, Jian Liu, Patrick Yin Chiang, Senior Member, IEEE, Xi Xiao, Nanjian Wu , Member, IEEE

Relation: IEEE JOURNAL OF SOLID-STATE CIRCUITS; http://ir.semi.ac.cn/handle/172111/30307

الاتاحة: http://ir.semi.ac.cn/handle/172111/30307